Built-In Test Software for Deformable Mirror High Voltage Drivers Built-In Test Software for...
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Transcript of Built-In Test Software for Deformable Mirror High Voltage Drivers Built-In Test Software for...
Built-In Test Software for Deformable Mirror High Voltage DriversBuilt-In Test Software for Deformable Mirror High Voltage Drivers
Jianwei ZhouJianwei Zhou
Home Institution: University of Hawaii at ManoaHome Institution: University of Hawaii at Manoa
CfAO Akaimai Internship 2008CfAO Akaimai Internship 2008
Subaru TelescopeSubaru Telescope
Mentor: Stephen ColleyMentor: Stephen Colley
Funding provided by the Center for Adaptive Optics through its NatioFunding provided by the Center for Adaptive Optics through its National Science Foundation Science and Technology Center grant (#AST-98nal Science Foundation Science and Technology Center grant (#AST-98
7683)7683)
Today’s PresentationToday’s Presentation
Project IntroProject Intro Problems EncounteredProblems Encountered ApproachesApproaches
Project OverviewProject Overview
Design Design BBuiltuilt-In-In TTestest (BIT) (BIT) software for software for deformable mirror high voltage driver in the deformable mirror high voltage driver in the Subaru LGSAO system.Subaru LGSAO system.
Measurements performed by BIT circuitryMeasurements performed by BIT circuitry Input VoltagesInput Voltages Output VoltagesOutput Voltages Power Supply VoltagesPower Supply Voltages Board Temperature Board Temperature
Deformable Mirror (DM)Deformable Mirror (DM)
HV Driver SubsystemHV Driver Subsystem
The HV driver subsystem in the Subaru LGSAO system The HV driver subsystem in the Subaru LGSAO system consist of 10 HV Amplifier boardsconsist of 10 HV Amplifier boards
High Voltage Amplifier BoardHigh Voltage Amplifier Board
Built-In Test CircuitBuilt-In Test CircuitMain componentsMain components: :
Analog Multiplexer (Mux)Analog Multiplexer (Mux)
Analog-To-Digital Converter Analog-To-Digital Converter
Microcontroller (PIC 16F877)Microcontroller (PIC 16F877)
Temperature SensorTemperature Sensor
Mux A/D Converter
Microcontroller
Temperature Sensor
Host Computer
BIT Circuit
Built-In Test SoftwareBuilt-In Test Software Program Language use: CProgram Language use: C
Step 1: Program in C Step 1: Program in C
Step 2: Compile to Assembly language by PICC STD.Step 2: Compile to Assembly language by PICC STD.
Pros and consPros and cons C is easier and much shorter than assembly languageC is easier and much shorter than assembly language Programming requires the knowledge of microcontrollerProgramming requires the knowledge of microcontroller
Problem EncounteredProblem Encountered
I: understand the circuitI: understand the circuit
II: MicrocontrollerII: Microcontroller
C compilerC compiler
Not compactable with certain Not compactable with certain computer systemcomputer system
Unidentified bug ( Insert of leading 0) Unidentified bug ( Insert of leading 0) Special setting Special setting
Development toolDevelopment tool
In-circuit DebuggerIn-circuit Debugger
MPLAB-IDEMPLAB-IDE
CommunicationCommunication
Communication between the chips on theCommunication between the chips on the
built-in test circuitbuilt-in test circuit Communication between the microcontrollerCommunication between the microcontroller
and host computer ( I2C)and host computer ( I2C)
ApproachesApproaches
Review the knowledge learnt in schoolReview the knowledge learnt in school ( programming, digital design, circuit ana( programming, digital design, circuit ana
lysis)lysis) Search on InternetSearch on Internet Read the data sheet of the deviceRead the data sheet of the device Get help from mentorGet help from mentor
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