Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan...

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Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan ( [email protected] ) Joined work between Lester(France) and UMASS(USA)

Transcript of Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan...

Page 1: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

Building Cad Prototyping Tool for Emerging Nanoscale Fabrics

Catherine Dezan ([email protected])

Joined work between Lester(France) and

UMASS(USA)

Page 2: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Université de Bretagne Occidentale(LESTER, CNRS)

Catherine Dezan

Loic Lagadec

University of Massachusetts at Amherst

Michael Leuchtenburg,

Teng Wang,

Pritish Narayanan,

Andras Moritz

Contributors:

Page 3: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Motivation

Bottom-up strategies -> more defective(10-9 to 10-7 failure rate in CMOS technology,10-2to 10-1 failure rate in emerging

nanotechnologies)

-> CAD tool should take this into account Evolutive nanofabrics (Semiconductor

Nanowire -> Carbone Nanotube) needs generic CAD tool for a quick adaptation

Page 4: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Outline of the talk

Defective Hybrid Nanofabrics Proposal of prototyping tool based on Nanofabric

specification Design flow Models for Nanofabric Specification Transformations based on Nanofabric models Fault-tolerant transformations

Conclusion

Page 5: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Emerging Nanofabrics

NASIC[Moritz 2004], NanoPla[Dehon2005], CMOL[Likharev2005], FPNI[Snider2007]

Possible manufacturing procedures (demonstrated for every step, but not yet the whole process)

(a) (b)

(c) (d)

Our references to nanofabrics, based on progress of Semiconductor Nanowire manufacturing [Lieber2007] are hybrid CMOS/Nano fabrics:

Page 6: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Existing CAD tools are specific

These nanofabrics propose a range of test applications on their nano supportEx: microprocessor (NASIC), Neuromorphic

networks(CMOL), general purpose Each specific fabric proposes its specific

CAD tools: Ex:CMOL FPGA compiler, FPNI compiler,

NanoPla CAD

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European Nano Systems Conference, 12/03/2007

Towards a generic prototyping CAD tool

Main features: Generic CAD tool: not specific CAD tool adapted

to a single Nanofabric Based on Nanofabric Specification through models Design flow from behavioral description towards

symbolic layout Fault-tolerant transformations

Page 8: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Page 9: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Nanofabrics Specification through models

Computational model

Architectural model

Technological model

Fault model

Abstractions of some nanofabric mechanism

Page 10: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Computational and Architectural models

Workshare between

• nano

Interconnect(FPNI), Interconnect +computation (NanoPla,CMOL,NASIC) and its organization(2 or multi-level logic)

• CMOS

I/O, specific gate(inv), control

Structural and hierarchical organization of building components in tiles

Page 11: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Technological and Fault models

Physical constraints for place-and-route routines:

- doping constraints (NASIC)

- Connection constraints for reconfigurable fabric

- Defect map

Fault types with distribution (uniform/cluster) and rates:

•permanent defects(manufacturing process), stuck-on,stuck-off transistor, broken nanowire

•Transient faults (internal noise, particle impact, ..)

•Process variation(channel length, doping, wire thickness)

Page 12: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

(1)

(2)

(3)

Page 13: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Behavioral transformations(1)

In addition to classical high-level transformations, we take into account:

pre-partionning for Nano/CMOS transformation (according to the computational model)

fault-tolerant transformations(adding voting spec, Error correcting codes, transfert in CMOS) (according to fault model)

Page 14: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Case study of NASIC fabric(1)

Computational model: CMOS limited for control signal, computation with 2 level logicFault model: permanent, transient, uniform/cluster

Fault-tolerant transformation:

Data encoded in BCH codes in order to build redundant logic (Hamming distance related to fault rate)

4bits -> 7bits with BCH(7,4,1)

Rebuild computation

DAG

Page 15: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Synthesis and structural transformations(2)

Synthesis with an external tool (SIS,ABC) directives are produced by the computational model and architectural model (ex: 2 level logic -> pla synthesis)

Structural transformations to add specific circuitry (decodeur for I/O, signal restoration , additional CMOS circuitry..) related to the architectural model

Fault-tolerant transformations based on the structural representation of the application: structural copies defined at fine grain or coarse grain( using voters- in CMOS) related to fault model

Page 16: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Example of fault-tolerant transformations at structural level (2)

Architectural model: 2D grid with FET, microwires around tiles

External tool for logic synthesis

(SIS, ABC)

S=f(x,y,z)

Fault tolerant transformation:structural redundancy at fine grain

pla

xy

z

and

or

and’

or’

s

Page 17: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Yield projection(2)

Fault-tolerant techniques produce different yield related to fault rate, types of fault and distribution

-> need of iterations in flow design Integration of the yield

simulator for NASIC

Page 18: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Physical design (3)

Transformations at this level include partitioning, placement and routing onto the nanofabric:

Reconfigurable fabrics have congestion problem for place-and-route due to the restriction of connections(adaptation of pathfinder algorithm is appropriate - feasibility proved with our previous experiment on FPGA CAD tool)

Generic heuristics like simulated annealing, clustering may be suitable for placement into tiles and between tiles

-> custom adaptation is made using the technological model

Possibility to add new custom routines to achieve better results

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European Nano Systems Conference, 12/03/2007

Symbolic layout for NASIC(3)

Technological model: Doping constraints

Program Counter + Rom + decoder

Register file + Alu

Place-and-route routines with

fixed size of tiles

Page 20: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Conclusion

Proposal of a generic tool based on Nanofabric Specification

Proposal of adequate models correlated to transformations

One instance based on NASIC fabric was developped

Page 21: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

Future investigations

Investigating on more detailed models and their automatic integration in the generic framework

Adding more fault-tolerant transformations and hybrid fabric related transformations

(probabilistic computation and synthesis?) More case studies to consolidate and validate the

framework

[email protected]

Page 22: Building Cad Prototyping Tool for Emerging Nanoscale Fabrics Catherine Dezan (dezan@univ-brest.fr)dezan@univ-brest.fr Joined work between Lester( France.

European Nano Systems Conference, 12/03/2007

[email protected]