Browse Popular - cisl.columbia.edu · Intelligent Systems and Signal Processing (ISSP), 2013...

Institutional Sign In

Browse Popular

Top DownloadsBrowse the top 100 documents downloaded for the month of December 2014

1. Data mining with big dataXindong Wu ; Xingquan Zhu ; Gong-Qing Wu ; Wei Ding Knowledge and Data Engineering, IEEE Transactions on Volume: 26 Issue: 1 Date : Jan. 2014 Page(s): 97 - 107 DOI: 10.1109/TKDE.2013.109 Cited by: Papers (2)

| | Abstract | PDF (424 KB)

2. What Will 5G Be?Andrews, J.G. ; Buzzi, S. ; Wan Choi ; Hanly, S.V. ; Lozano, A. ; Soong, A.C.K. ; Zhang, J.C. Selected Areas in Communications, IEEE Journal on Volume: 32 Issue: 6 Date : June 2014 Page(s): 1065 - 1082 DOI: 10.1109/JSAC.2014.2328098


3. Toward Scalable Systems for Big Data Analytics: A Technology TutorialHan Hu ; Yonggang Wen ; Tat-Seng Chua ; Xuelong Li Access, IEEE Volume: 2 Date : 2014 Page(s): 652 - 687 DOI: 10.1109/ACCESS.2014.2332453

| Abstract | PDF (13516 KB)

4. Cellular architecture and key technologies for 5G wireless communication networksCheng-Xiang Wang ; Haider, F. ; Xiqi Gao ; Xiao-Hu You ; Yang Yang ; Dongfeng Yuan ; Aggoune, H. ; Haas, H. ; Fletcher, S. ; Hepsaydir, E. Communications Magazine, IEEE Volume: 52 Issue: 2 Date : February 2014 Page(s): 122 - 130 DOI: 10.1109/MCOM.2014.6736752 Cited by: Papers (1)


5. Millimeter Wave Mobile Communications for 5G Cellular: It Will Work!Rappaport, T.S. ; Shu Sun ; Mayzus, R. ; Hang Zhao ; Azar, Y. ; Wang, K. ; Wong, G.N. ; Schulz, J.K. ; Samimi, M. ; Gutierrez, F. Access, IEEE Volume: 1 Date : 2013 Page(s): 335 - 349 DOI: 10.1109/ACCESS.2013.2260813 Cited by: Papers (40)


6. Information Security in Big Data: Privacy and Data MiningLei Xu ; Chunxiao Jiang ; Jian Wang ; Jian Yuan ; Yong Ren

IEEE.org IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites| Cart (0) Create Account| Personal Sign In|

BROWSE MY SETTINGS GET HELP WHAT CAN I ACCESS? SUBSCRIBE

http://ieeexplore.ieee.org/Xplore/home.jspjavascript:Modal.show('/xpl/mwInstSignIn.jsp')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6547630http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xindong%20Wu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xingquan%20Zhu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Gong-Qing%20Wu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wei%20Ding.QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6547630&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6547630http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6547630http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6824752http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Andrews,%20J.G..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Buzzi,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wan%20Choi.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hanly,%20S.V..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Lozano,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Soong,%20A.C.K..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zhang,%20J.C..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6824752http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6824752http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6842585http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Han%20Hu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yonggang%20Wen.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tat-Seng%20Chua.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xuelong%20Li.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6842585http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6842585http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6736752http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Cheng-Xiang%20Wang.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Haider,%20F..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xiqi%20Gao.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xiao-Hu%20You.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yang%20Yang.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Dongfeng%20Yuan.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Aggoune,%20H..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Haas,%20H..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Fletcher,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hepsaydir,%20E..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6736752&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6736752http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6736752http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6515173http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rappaport,%20T.S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Shu%20Sun.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Mayzus,%20R..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hang%20Zhao.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Azar,%20Y..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wang,%20K..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wong,%20G.N..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Schulz,%20J.K..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Samimi,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Gutierrez,%20F..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6515173&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6515173http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6515173http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6919256http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Lei%20Xu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chunxiao%20Jiang.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jian%20Wang.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jian%20Yuan.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yong%20Ren.QT.&newsearch=truehttp://www.ieee.org/http://standards.ieee.org/http://spectrum.ieee.org/http://www.ieee.org/sitemap.htmlhttps://www.ieee.org/cart/public/myCart/page.html?refSite=http://ieeexplore.ieee.org&refSiteName=IEEE%20Xplorehttp://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/Xplore/accessinfo.jsphttp://innovate.ieee.org/?LT=XploreSubscribe

Access, IEEE Volume: 2 Date : 2014 Page(s): 1149 - 1176 DOI: 10.1109/ACCESS.2014.2362522


7. Cloud Networks: Enhancing Performance and ResiliencySecci, S. ; Murugesan, S. Computer Volume: 47 Issue: 10 Date : Oct. 2014 Page(s): 82 - 85 DOI: 10.1109/MC.2014.277


8. Security threats in cloud computingShaikh, F.B. ; Haider, S. Internet Technology and Secured Transactions (ICITST), 2011 International Conference for Date : 11-14 Dec. 2011 Page(s): 214 - 219 Cited by: Papers (8)


9. Internet of Things for Smart CitiesZanella, A. ; Bui, N. ; Castellani, A. ; Vangelista, L. ; Zorzi, M. Internet of Things Journal, IEEE Volume: 1 Issue: 1 Date : Feb. 2014 Page(s): 22 - 32 DOI: 10.1109/JIOT.2014.2306328 Cited by: Papers (2)


10. Massive MIMO for next generation wireless systemsLarsson, E. ; Edfors, O. ; Tufvesson, F. ; Marzetta, T. Communications Magazine, IEEE Volume: 52 Issue: 2 Date : February 2014 Page(s): 186 - 195 DOI: 10.1109/MCOM.2014.6736761 Cited by: Papers (15)


11. An Overview of Massive MIMO: Benefits and ChallengesLu Lu ; Li, G.Y. ; Swindlehurst, A.L. ; Ashikhmin, A. ; Rui Zhang Selected Topics in Signal Processing, IEEE Journal of Volume: 8 Issue: 5 Date : Oct. 2014 Page(s): 742 - 758 DOI: 10.1109/JSTSP.2014.2317671


12. Agent-Based Cloud ComputingKwang Mong Sim Services Computing, IEEE Transactions on Volume: 5 Issue: 4 Date : Fourth Quarter 2012 Page(s): 564 - 577 DOI: 10.1109/TSC.2011.52 Cited by: Papers (12)


13. 5G technology of mobile communication: A surveyGohil, A. ; Modi, H. ; Patel, S.K.

javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6919256http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6919256http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6926664http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Secci,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Murugesan,%20S..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6926664http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6926664http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6148380http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Shaikh,%20F.B..QT.&searchWithin=p_Author_Ids:38242273800&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Haider,%20S..QT.&searchWithin=p_Author_Ids:38241584100&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6148380&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6148380http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6148380http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6740844http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zanella,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bui,%20N..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Castellani,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Vangelista,%20L..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zorzi,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6740844&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6740844http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6740844http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6736761http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Larsson,%20E..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Edfors,%20O..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tufvesson,%20F..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Marzetta,%20T..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6736761&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6736761http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6736761http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6798744http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Lu%20Lu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Li,%20G.Y..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Swindlehurst,%20A.L..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ashikhmin,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rui%20Zhang.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6798744http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6798744http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6042853http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kwang%20Mong%20Sim.QT.&searchWithin=p_Author_Ids:38525233900&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6042853&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6042853http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6042853http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6526920http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Gohil,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Modi,%20H..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Patel,%20S.K..QT.&newsearch=true

Intelligent Systems and Signal Processing (ISSP), 2013 International Conference on Date : 1-2 March 2013 Page(s): 288 - 292 DOI: 10.1109/ISSP.2013.6526920 Cited by: Papers (2)


14. Five disruptive technology directions for 5GBoccardi, F ; Heath, R.W. ; Lozano, A. ; Marzetta, T.L. ; Popovski, P. Communications Magazine, IEEE Volume: 52 Issue: 2 Date : February 2014 Page(s): 74 - 80 DOI: 10.1109/MCOM.2014.6736746 Cited by: Papers (10)


15. A Computational Approach to Edge DetectionCanny, John Pattern Analysis and Machine Intelligence, IEEE Transactions on Volume: PAMI-8 Issue: 6 Date : Nov. 1986 Page(s): 679 - 698 DOI: 10.1109/TPAMI.1986.4767851 Cited by: Papers (3398)


16. Scenarios for 5G mobile and wireless communications: the vision of the METIS projectOsseiran, A. ; Boccardi, F. ; Braun, V. ; Kusume, K. ; Marsch, P. ; Maternia, M. ; Queseth, O. ; Schellmann, M. ; Schotten, H. ; Taoka, H. ; Tullberg, H.; Uusitalo, M.A. ; Timus, B. ; Fallgren, M. Communications Magazine, IEEE Volume: 52 Issue: 5 Date : May 2014 Page(s): 26 - 35 DOI: 10.1109/MCOM.2014.6815890 Cited by: Papers (4)


17. Compressed sensingDonoho, D.L. Information Theory, IEEE Transactions on Volume: 52 Issue: 4 Date : April 2006 Page(s): 1289 - 1306 DOI: 10.1109/TIT.2006.871582 Cited by: Papers (4117)


18. Histograms of oriented gradients for human detectionDalal, N. ; Triggs, B. Computer Vision and Pattern Recognition, 2005. CVPR 2005. IEEE Computer Society Conference on Volume: 1 Date : 25-25 June 2005 Page(s): 886 - 893 vol. 1 DOI: 10.1109/CVPR.2005.177 Cited by: Papers (2567)


19. Big Data Deep Learning: Challenges and PerspectivesXue-Wen Chen ; Xiaotong Lin Access, IEEE Volume: 2 Date : 2014 Page(s): 514 - 525 DOI: 10.1109/ACCESS.2014.2325029

http://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6526920&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6526920http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6526920http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6736746http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Boccardi,%20F.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Heath,%20R.W..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Lozano,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Marzetta,%20T.L..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Popovski,%20P..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6736746&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6736746http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6736746http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4767851http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Canny,%20John.QT.&searchWithin=p_Author_Ids:37329993400&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=4767851&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4767851http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4767851http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6815890http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Osseiran,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Boccardi,%20F..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Braun,%20V..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kusume,%20K..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Marsch,%20P..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Maternia,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Queseth,%20O..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Schellmann,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Schotten,%20H..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Taoka,%20H..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tullberg,%20H..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Uusitalo,%20M.A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Timus,%20B..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Fallgren,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6815890&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6815890http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6815890http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1614066http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Donoho,%20D.L..QT.&searchWithin=p_Author_Ids:37325339800&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1614066&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1614066http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1614066http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1467360http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Dalal,%20N..QT.&searchWithin=p_Author_Ids:37427371000&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Triggs,%20B..QT.&searchWithin=p_Author_Ids:37282698000&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1467360&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1467360http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1467360http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6817512http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xue-Wen%20Chen.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xiaotong%20Lin.QT.&newsearch=true


20. Defining architecture components of the Big Data EcosystemDemchenko, Y. ; de Laat, C. ; Membrey, P. Collaboration Technologies and Systems (CTS), 2014 International Conference on Date : 19-23 May 2014 Page(s): 104 - 112 DOI: 10.1109/CTS.2014.6867550


21. Cloud computing-based forensic analysis for collaborative network security management systemChen, Zhen ; Han, Fuye ; Cao, Junwei ; Jiang, Xin ; Chen, Shuo Tsinghua Science and Technology Volume: 18 Issue: 1 Date : Feb. 2013 Page(s): 40 - 50 DOI: 10.1109/TST.2013.6449406 Cited by: Papers (3)


22. A Survey of Software-Defined Networking: Past, Present, and Future of Programmable NetworksNunes, B.A.A. ; Mendonca, M. ; Xuan-Nam Nguyen ; Obraczka, K. ; Turletti, T. Communications Surveys & Tutorials, IEEE Volume: 16 Issue: 3 Date : Third Quarter 2014 Page(s): 1617 - 1634 DOI: 10.1109/SURV.2014.012214.00180 Cited by: Papers (4)


23. A tutorial on hidden Markov models and selected applications in speech recognitionRabiner, L. Proceedings of the IEEE Volume: 77 Issue: 2 Date : Feb 1989 Page(s): 257 - 286 DOI: 10.1109/5.18626 Cited by: Papers (3551)


24. A fast and elitist multiobjective genetic algorithm: NSGA-IIDeb, K. ; Pratap, A. ; Agarwal, S. ; Meyarivan, T. Evolutionary Computation, IEEE Transactions on Volume: 6 Issue: 2 Date : Apr 2002 Page(s): 182 - 197 DOI: 10.1109/4235.996017 Cited by: Papers (4104)


25. Robust Face Recognition via Sparse RepresentationWright, J. ; Yang, A.Y. ; Ganesh, A. ; Sastry, S.S. ; Yi Ma Pattern Analysis and Machine Intelligence, IEEE Transactions on Volume: 31 Issue: 2 Date : Feb. 2009 Page(s): 210 - 227 DOI: 10.1109/TPAMI.2008.79 Cited by: Papers (957)


26. Image quality assessment: from error visibility to structural similarityZhou Wang ; Bovik, A.C. ; Sheikh, H.R. ; Simoncelli, E.P. Image Processing, IEEE Transactions on Volume: 13 Issue: 4 Date : April 2004

javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6817512http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6817512http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6867550http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Demchenko,%20Y..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.de%20Laat,%20C..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Membrey,%20P..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6867550http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6867550http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6449406http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chen,%20Zhen.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Han,%20Fuye.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Cao,%20Junwei.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jiang,%20Xin.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chen,%20Shuo.QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6449406&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6449406http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6449406http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6739370http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nunes,%20B.A.A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Mendonca,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xuan-Nam%20Nguyen.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Obraczka,%20K..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Turletti,%20T..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6739370&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6739370http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6739370http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=18626http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rabiner,%20L..QT.&searchWithin=p_Author_Ids:37374813300&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=18626&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=18626http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=18626http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=996017http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Deb,%20K..QT.&searchWithin=p_Author_Ids:37272206800&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Pratap,%20A..QT.&searchWithin=p_Author_Ids:37990156900&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Agarwal,%20S..QT.&searchWithin=p_Author_Ids:37997674000&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Meyarivan,%20T..QT.&searchWithin=p_Author_Ids:37991022300&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=996017&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=996017http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=996017http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4483511http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wright,%20J..QT.&searchWithin=p_Author_Ids:37287378300&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yang,%20A.Y..QT.&searchWithin=p_Author_Ids:37273113500&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ganesh,%20A..QT.&searchWithin=p_Author_Ids:37540471000&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sastry,%20S.S..QT.&searchWithin=p_Author_Ids:37270557300&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yi%20Ma.QT.&searchWithin=p_Author_Ids:37274225400&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=4483511&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4483511http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4483511http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1284395http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zhou%20Wang.QT.&searchWithin=p_Author_Ids:37291903900&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bovik,%20A.C..QT.&searchWithin=p_Author_Ids:37283451200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sheikh,%20H.R..QT.&searchWithin=p_Author_Ids:37283476500&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Simoncelli,%20E.P..QT.&searchWithin=p_Author_Ids:37295258800&newsearch=true

Page(s): 600 - 612 DOI: 10.1109/TIP.2003.819861 Cited by: Papers (2655)


27. An Introduction To Compressive SamplingCandes, E.J. ; Wakin, M.B. Signal Processing Magazine, IEEE Volume: 25 Issue: 2 Date : March 2008 Page(s): 21 - 30 DOI: 10.1109/MSP.2007.914731 Cited by: Papers (984)


28. Weighted Guided Image FilteringLi, Z. ; Zheng, J. ; Zhu, Z. ; Yao, W. ; Wu, S. Image Processing, IEEE Transactions on Volume: 24 Issue: 1 Date : Jan. 2015 Page(s): 120 - 129 DOI: 10.1109/TIP.2014.2371234


29. A 1 GS/s 10b 18.9 mW Time-Interleaved SAR ADC With Background Timing Skew CalibrationSunghyuk Lee ; Chandrakasan, A.P. ; Hae-Seung Lee Solid-State Circuits, IEEE Journal of Volume: 49 Issue: 12 Date : Dec. 2014 Page(s): 2846 - 2856 DOI: 10.1109/JSSC.2014.2362851


30. Research Directions for the Internet of ThingsStankovic, J.A. Internet of Things Journal, IEEE Volume: 1 Issue: 1 Date : Feb. 2014 Page(s): 3 - 9 DOI: 10.1109/JIOT.2014.2312291 Cited by: Papers (2)


31. Direct mobile-to-mobile communication: Paradigm for 5GMumtaz, S. ; Saidul Huq, K.M. ; Rodriguez, J. Wireless Communications, IEEE Volume: 21 Issue: 5 Date : October 2014 Page(s): 14 - 23 DOI: 10.1109/MWC.2014.6940429


32. A Real-Time QRS Detection AlgorithmPan, Jiapu ; Tompkins, Willis J. Biomedical Engineering, IEEE Transactions on Volume: BME-32 Issue: 3 Date : March 1985 Page(s): 230 - 236 DOI: 10.1109/TBME.1985.325532 Cited by: Papers (763)


33. Design considerations for a 5G network architectureAgyapong, P. ; Iwamura, M. ; Staehle, D. ; Kiess, W. ; Benjebbour, A. Communications Magazine, IEEE

http://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1284395&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1284395http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1284395http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4472240http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Candes,%20E.J..QT.&searchWithin=p_Author_Ids:38127350400&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wakin,%20M.B..QT.&searchWithin=p_Author_Ids:37285035000&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=4472240&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4472240http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4472240http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6957555http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Li,%20Z..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zheng,%20J..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zhu,%20Z..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yao,%20W..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wu,%20S..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6957555http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6957555http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6936944http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sunghyuk%20Lee.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chandrakasan,%20A.P..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hae-Seung%20Lee.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6936944http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6936944http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6774858http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Stankovic,%20J.A..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6774858&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6774858http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6774858http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6940429http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Mumtaz,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Saidul%20Huq,%20K.M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rodriguez,%20J..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6940429http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6940429http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4122029http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Pan,%20Jiapu.QT.&searchWithin=p_Author_Ids:37290771100&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tompkins,%20Willis%20J..QT.&searchWithin=p_Author_Ids:37300730800&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=4122029&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4122029http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4122029http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6957145http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Agyapong,%20P..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Iwamura,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Staehle,%20D..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kiess,%20W..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Benjebbour,%20A..QT.&newsearch=true

Volume: 52 Issue: 11 Date : Nov. 2014 Page(s): 65 - 75 DOI: 10.1109/MCOM.2014.6957145


34. Power-Electronic Systems for the Grid Integration of Renewable Energy Sources: A SurveyCarrasco, J.M. ; Franquelo, L.G. ; Bialasiewicz, J.T. ; Galvan, E. ; Guisado, R.C.P. ; Prats, Ma.A.M. ; Leon, J.I. ; Moreno-Alfonso, N. Industrial Electronics, IEEE Transactions on Volume: 53 Issue: 4 Date : June 2006 Page(s): 1002 - 1016 DOI: 10.1109/TIE.2006.878356 Cited by: Papers (769)


35. Modeling and Optimization for Big Data Analytics: (Statistical) learning tools for our era of data delugeSlavakis, K. ; Giannakis, G.B. ; Mateos, G. Signal Processing Magazine, IEEE Volume: 31 Issue: 5 Date : Sept. 2014 Page(s): 18 - 31 DOI: 10.1109/MSP.2014.2327238


36. Evolution toward 5G multi-tier cellular wireless networks: An interference management perspectiveHossain, E. ; Rasti, M. ; Tabassum, H. ; Abdelnasser, A. Wireless Communications, IEEE Volume: 21 Issue: 3 Date : June 2014 Page(s): 118 - 127 DOI: 10.1109/MWC.2014.6845056 Cited by: Papers (1)


37. Multilevel inverters: a survey of topologies, controls, and applicationsRodriguez, J. ; Jih-Sheng Lai ; Fang Zheng Peng Industrial Electronics, IEEE Transactions on Volume: 49 Issue: 4 Date : Aug 2002 Page(s): 724 - 738 DOI: 10.1109/TIE.2002.801052 Cited by: Papers (1427)


38. Statistical pattern recognition: a reviewJain, A.K. ; Duin, R.P.W. ; Jianchang Mao Pattern Analysis and Machine Intelligence, IEEE Transactions on Volume: 22 Issue: 1 Date : Jan 2000 Page(s): 4 - 37 DOI: 10.1109/34.824819 Cited by: Papers (1411)


39. Overview of the High Efficiency Video Coding (HEVC) StandardSullivan, G.J. ; Ohm, J. ; Woo-Jin Han ; Wiegand, T. Circuits and Systems for Video Technology, IEEE Transactions on Volume: 22 Issue: 12 Date : Dec. 2012 Page(s): 1649 - 1668 DOI: 10.1109/TCSVT.2012.2221191 Cited by: Papers (268)


40. Representation Learning: A Review and New Perspectives

javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6957145http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6957145http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1667898http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Carrasco,%20J.M..QT.&searchWithin=p_Author_Ids:38330554700&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Franquelo,%20L.G..QT.&searchWithin=p_Author_Ids:37277650800&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bialasiewicz,%20J.T..QT.&searchWithin=p_Author_Ids:37293854100&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Galvan,%20E..QT.&searchWithin=p_Author_Ids:37277664500&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Guisado,%20R.C.P..QT.&searchWithin=p_Author_Ids:38301804500&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Prats,%20Ma.A.M..QT.&searchWithin=p_Author_Ids:38313797700&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Leon,%20J.I..QT.&searchWithin=p_Author_Ids:38304177400&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Moreno-Alfonso,%20N..QT.&searchWithin=p_Author_Ids:38281855600&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1667898&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1667898http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1667898http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6879577http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Slavakis,%20K..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Giannakis,%20G.B..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Mateos,%20G..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6879577http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6879577http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6845056http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hossain,%20E..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rasti,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tabassum,%20H..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Abdelnasser,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6845056&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6845056http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6845056http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1021296http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rodriguez,%20J..QT.&searchWithin=p_Author_Ids:37279149900&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jih-Sheng%20Lai.QT.&searchWithin=p_Author_Ids:37274695000&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Fang%20Zheng%20Peng.QT.&searchWithin=p_Author_Ids:37291678600&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1021296&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1021296http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1021296http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=824819http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jain,%20A.K..QT.&searchWithin=p_Author_Ids:37279599100&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Duin,%20R.P.W..QT.&searchWithin=p_Author_Ids:37270313400&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jianchang%20Mao.QT.&searchWithin=p_Author_Ids:37349372900&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=824819&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=824819http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=824819http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6316136http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sullivan,%20G.J..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ohm,%20J..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Woo-Jin%20Han.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wiegand,%20T..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6316136&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6316136http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6316136http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6472238

Bengio, Y. ; Courville, A. ; Vincent, P. Pattern Analysis and Machine Intelligence, IEEE Transactions on Volume: 35 Issue: 8 Date : Aug. 2013 Page(s): 1798 - 1828 DOI: 10.1109/TPAMI.2013.50 Cited by: Papers (25)


41. A survey on sensor networksAkyildiz, I.F. ; Weilian Su ; Sankarasubramaniam, Y. ; Cayirci, E. Communications Magazine, IEEE Volume: 40 Issue: 8 Date : Aug 2002 Page(s): 102 - 114 DOI: 10.1109/MCOM.2002.1024422 Cited by: Papers (3987)


42. The path of the smart gridFarhangi, H. Power and Energy Magazine, IEEE Volume: 8 Issue: 1 Date : January-February 2010 Page(s): 18 - 28 DOI: 10.1109/MPE.2009.934876 Cited by: Papers (296)


43. Device-to-device communication in 5G cellular networks: challenges, solutions, and future directionsTehrani, M.N. ; Uysal, M. ; Yanikomeroglu, H. Communications Magazine, IEEE Volume: 52 Issue: 5 Date : May 2014 Page(s): 86 - 92 DOI: 10.1109/MCOM.2014.6815897


44. Context Aware Computing for The Internet of Things: A SurveyPerera, C. ; Zaslavsky, A. ; Christen, P. ; Georgakopoulos, D. Communications Surveys & Tutorials, IEEE Volume: 16 Issue: 1 Date : First Quarter 2014 Page(s): 414 - 454 DOI: 10.1109/SURV.2013.042313.00197 Cited by: Papers (2)


45. Image Super-Resolution Via Sparse RepresentationJianchao Yang ; Wright, J. ; Huang, T.S. ; Yi Ma Image Processing, IEEE Transactions on Volume: 19 Issue: 11 Date : Nov. 2010 Page(s): 2861 - 2873 DOI: 10.1109/TIP.2010.2050625 Cited by: Papers (270)


46. Smart Grid Technologies: Communication Technologies and StandardsGungor, V.C. ; Sahin, D. ; Kocak, T. ; Ergut, S. ; Buccella, C. ; Cecati, C. ; Hancke, G.P. Industrial Informatics, IEEE Transactions on Volume: 7 Issue: 4 Date : Nov. 2011 Page(s): 529 - 539 DOI: 10.1109/TII.2011.2166794 Cited by: Papers (157)

http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bengio,%20Y..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Courville,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Vincent,%20P..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6472238&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6472238http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6472238http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1024422http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Akyildiz,%20I.F..QT.&searchWithin=p_Author_Ids:37272190700&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Weilian%20Su.QT.&searchWithin=p_Author_Ids:37276624500&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sankarasubramaniam,%20Y..QT.&searchWithin=p_Author_Ids:37283205000&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Cayirci,%20E..QT.&searchWithin=p_Author_Ids:37266680300&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1024422&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1024422http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1024422http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5357331http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Farhangi,%20H..QT.&searchWithin=p_Author_Ids:37680602100&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=5357331&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5357331http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5357331http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6815897http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tehrani,%20M.N..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Uysal,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yanikomeroglu,%20H..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6815897http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6815897http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6512846http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Perera,%20C..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zaslavsky,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Christen,%20P..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Georgakopoulos,%20D..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6512846&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6512846http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6512846http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5466111http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jianchao%20Yang.QT.&searchWithin=p_Author_Ids:37406108300&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wright,%20J..QT.&searchWithin=p_Author_Ids:37287378300&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Huang,%20T.S..QT.&searchWithin=p_Author_Ids:37275421800&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yi%20Ma.QT.&searchWithin=p_Author_Ids:37274225400&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=5466111&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5466111http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5466111http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6011696http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Gungor,%20V.C..QT.&searchWithin=p_Author_Ids:37396686500&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sahin,%20D..QT.&searchWithin=p_Author_Ids:37901001200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kocak,%20T..QT.&searchWithin=p_Author_Ids:38266211600&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ergut,%20S..QT.&searchWithin=p_Author_Ids:37298250000&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Buccella,%20C..QT.&searchWithin=p_Author_Ids:37275639000&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Cecati,%20C..QT.&searchWithin=p_Author_Ids:37272395200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hancke,%20G.P..QT.&searchWithin=p_Author_Ids:37284723700&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6011696&


47. Big data: Issues, challenges, tools and Good practicesKatal, A. ; Wazid, M. ; Goudar, R.H. Contemporary Computing (IC3), 2013 Sixth International Conference on Date : 8-10 Aug. 2013 Page(s): 404 - 409 DOI: 10.1109/IC3.2013.6612229 Cited by: Papers (4)


48. Noncooperative Cellular Wireless with Unlimited Numbers of Base Station AntennasMarzetta, T.L. Wireless Communications, IEEE Transactions on Volume: 9 Issue: 11 Date : November 2010 Page(s): 3590 - 3600 DOI: 10.1109/TWC.2010.092810.091092 Cited by: Papers (254)


49. Particle swarm optimizationKennedy, J. ; Eberhart, R. Neural Networks, 1995. Proceedings., IEEE International Conference on Volume: 4 Date : Nov/Dec 1995 Page(s): 1942 - 1948 vol.4 DOI: 10.1109/ICNN.1995.488968 Cited by: Papers (5080)


50. Modulation Formats and Waveforms for 5G Networks: Who Will Be the Heir of OFDM?: An overview of alternative modulation schemes forimproved spectral efficiencyBanelli, P. ; Buzzi, S. ; Colavolpe, G. ; Modenini, A. ; Rusek, F. ; Ugolini, A. Signal Processing Magazine, IEEE Volume: 31 Issue: 6 Date : Nov. 2014 Page(s): 80 - 93 DOI: 10.1109/MSP.2014.2337391


51. Image Quality Assessment for Fake Biometric Detection: Application to Iris, Fingerprint, and Face RecognitionGalbally, J. ; Marcel, S. ; Fierrez, J. Image Processing, IEEE Transactions on Volume: 23 Issue: 2 Date : Feb. 2014 Page(s): 710 - 724 DOI: 10.1109/TIP.2013.2292332 Referenced in: Biometrics Compendium, IEEE Cited by: Papers (1)


52. A simple transmit diversity technique for wireless communicationsAlamouti, S. Selected Areas in Communications, IEEE Journal on Volume: 16 Issue: 8 Date : Oct 1998 Page(s): 1451 - 1458 DOI: 10.1109/49.730453 Cited by: Papers (4847)


53. Challenges in 5G: how to empower SON with big data for enabling 5GImran, A. ; Zoha, A.

javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6011696http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6011696http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6612229http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Katal,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wazid,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Goudar,%20R.H..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6612229&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6612229http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6612229http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5595728http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Marzetta,%20T.L..QT.&searchWithin=p_Author_Ids:37282754500&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=5595728&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5595728http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5595728http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=488968http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kennedy,%20J..QT.&searchWithin=p_Author_Ids:37276103200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Eberhart,%20R..QT.&searchWithin=p_Author_Ids:37276148000&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=488968&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=488968http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=488968http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6923528http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Banelli,%20P..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Buzzi,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Colavolpe,%20G..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Modenini,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rusek,%20F..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ugolini,%20A..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6923528http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6923528http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6671991http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Galbally,%20J..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Marcel,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Fierrez,%20J..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpls/virtual-journal/virtualJournalHome?pub=biocomphttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6671991&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6671991http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6671991http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=730453http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Alamouti,%20S..QT.&searchWithin=p_Author_Ids:37372674600&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=730453&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=730453http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=730453http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6963801http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Imran,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zoha,%20A..QT.&newsearch=true

Network, IEEE Volume: 28 Issue: 6 Date : Nov.-Dec. 2014 Page(s): 27 - 33 DOI: 10.1109/MNET.2014.6963801


54. A Survey on Software-Defined Network and OpenFlow: From Concept to ImplementationFei Hu ; Qi Hao ; Ke Bao Communications Surveys & Tutorials, IEEE Volume: 16 Issue: 4 Date : Fourthquarter 2014 Page(s): 2181 - 2206 DOI: 10.1109/COMST.2014.2326417


55. Mean shift: a robust approach toward feature space analysisComaniciu, D. ; Meer, P. Pattern Analysis and Machine Intelligence, IEEE Transactions on Volume: 24 Issue: 5 Date : May 2002 Page(s): 603 - 619 DOI: 10.1109/34.1000236 Cited by: Papers (2254)


56. ANFIS: adaptive-network-based fuzzy inference systemJang, J.-S.R. Systems, Man and Cybernetics, IEEE Transactions on Volume: 23 Issue: 3 Date : May/Jun 1993 Page(s): 665 - 685 DOI: 10.1109/21.256541 Cited by: Papers (1666)


57. Overview of Control and Grid Synchronization for Distributed Power Generation SystemsBlaabjerg, F. ; Teodorescu, R. ; Liserre, M. ; Timbus, A.V. Industrial Electronics, IEEE Transactions on Volume: 53 Issue: 5 Date : Oct. 2006 Page(s): 1398 - 1409 DOI: 10.1109/TIE.2006.881997 Cited by: Papers (856)


58. The role of small cells, coordinated multipoint, and massive MIMO in 5GJungnickel, V. ; Manolakis, K. ; Zirwas, W. ; Panzner, B. ; Braun, V. ; Lossow, M. ; Sternad, M. ; Apelfröjd, R. ; Svensson, T. Communications Magazine, IEEE Volume: 52 Issue: 5 Date : May 2014 Page(s): 44 - 51 DOI: 10.1109/MCOM.2014.6815892 Cited by: Papers (1)


59. Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuitsRoy, K. ; Mukhopadhyay, S. ; Mahmoodi-Meimand, H. Proceedings of the IEEE Volume: 91 Issue: 2 Date : Feb 2003 Page(s): 305 - 327 DOI: 10.1109/JPROC.2002.808156 Cited by: Papers (575)


javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6963801http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6963801http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6819788http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Fei%20Hu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Qi%20Hao.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ke%20Bao.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6819788http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6819788http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1000236http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Comaniciu,%20D..QT.&searchWithin=p_Author_Ids:37275320000&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Meer,%20P..QT.&searchWithin=p_Author_Ids:37270529300&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1000236&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1000236http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1000236http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=256541http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jang,%20J.-S.R..QT.&searchWithin=p_Author_Ids:37349267900&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=256541&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=256541http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=256541http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1705631http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Blaabjerg,%20F..QT.&searchWithin=p_Author_Ids:37278889300&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Teodorescu,%20R..QT.&searchWithin=p_Author_Ids:37276254200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Liserre,%20M..QT.&searchWithin=p_Author_Ids:37272424200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Timbus,%20A.V..QT.&searchWithin=p_Author_Ids:37276243900&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1705631&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1705631http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1705631http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6815892http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jungnickel,%20V..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Manolakis,%20K..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zirwas,%20W..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Panzner,%20B..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Braun,%20V..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Lossow,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sternad,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Apelfro.AND..HSH.x0308;jd,%20R..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Svensson,%20T..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6815892&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6815892http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6815892http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1182065http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Roy,%20K..QT.&searchWithin=p_Author_Ids:37274519700&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Mukhopadhyay,%20S..QT.&searchWithin=p_Author_Ids:37278557500&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Mahmoodi-Meimand,%20H..QT.&searchWithin=p_Author_Ids:37266628800&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1182065&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1182065http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1182065

60. Smart Grid — The New and Improved Power Grid: A SurveyFang, Xi ; Misra, Satyajayant ; Xue, Guoliang ; Yang, Dejun Communications Surveys & Tutorials, IEEE Volume: 14 Issue: 4 Date : Fourth Quarter 2012 Page(s): 944 - 980 DOI: 10.1109/SURV.2011.101911.00087 Cited by: Papers (120)


61. The requirements, challenges, and technologies for 5G of terrestrial mobile telecommunicationShanzhi Chen ; Jian Zhao Communications Magazine, IEEE Volume: 52 Issue: 5 Date : May 2014 Page(s): 36 - 43 DOI: 10.1109/MCOM.2014.6815891


62. Object Detection with Discriminatively Trained Part-Based ModelsFelzenszwalb, P.F. ; Girshick, R.B. ; McAllester, D. ; Ramanan, D. Pattern Analysis and Machine Intelligence, IEEE Transactions on Volume: 32 Issue: 9 Date : Sept. 2010 Page(s): 1627 - 1645 DOI: 10.1109/TPAMI.2009.167 Cited by: Papers (713)


63. Cost Minimization for Big Data Processing in Geo-Distributed Data CentersLin Gu ; Deze Zeng ; Peng Li ; Song Guo Emerging Topics in Computing, IEEE Transactions on Volume: 2 Issue: 3 Date : Sept. 2014 Page(s): 314 - 323 DOI: 10.1109/TETC.2014.2310456


64. Big data: A reviewSagiroglu, S. ; Sinanc, D. Collaboration Technologies and Systems (CTS), 2013 International Conference on Date : 20-24 May 2013 Page(s): 42 - 47 DOI: 10.1109/CTS.2013.6567202 Cited by: Papers (6)


65. A Survey on Security Aspects for LTE and LTE-A NetworksJin Cao ; Maode Ma ; Hui Li ; Yueyu Zhang ; Zhenxing Luo Communications Surveys & Tutorials, IEEE Volume: 16 Issue: 1 Date : First Quarter 2014 Page(s): 283 - 302 DOI: 10.1109/SURV.2013.041513.00174 Cited by: Papers (1)


66. Reactive Power Compensation and Optimization Strategy for Grid-Interactive Cascaded Photovoltaic SystemsLiming Liu ; Hui Li ; Yaosuo Xue ; Wenxin Liu Power Electronics, IEEE Transactions on Volume: 30 Issue: 1 Date : Jan. 2015 Page(s): 188 - 202 DOI: 10.1109/TPEL.2014.2333004


http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6099519http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Fang,%20Xi.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Misra,%20Satyajayant.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Xue,%20Guoliang.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yang,%20Dejun.QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6099519&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6099519http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6099519http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6815891http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Shanzhi%20Chen.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jian%20Zhao.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6815891http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6815891http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5255236http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Felzenszwalb,%20P.F..QT.&searchWithin=p_Author_Ids:37273317500&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Girshick,%20R.B..QT.&searchWithin=p_Author_Ids:37546866400&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.McAllester,%20D..QT.&searchWithin=p_Author_Ids:37350105800&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ramanan,%20D..QT.&searchWithin=p_Author_Ids:37393712400&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=5255236&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5255236http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5255236http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6762920http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Lin%20Gu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Deze%20Zeng.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Peng%20Li.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Song%20Guo.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6762920http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6762920http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6567202http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sagiroglu,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sinanc,%20D..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6567202&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6567202http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6567202http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6506141http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jin%20Cao.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Maode%20Ma.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hui%20Li.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yueyu%20Zhang.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Zhenxing%20Luo.QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6506141&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6506141http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6506141http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6843986http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Liming%20Liu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hui%20Li.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yaosuo%20Xue.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wenxin%20Liu.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6843986http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6843986

67. Toward efficient and privacy-preserving computing in big data eraRongxing Lu ; Hui Zhu ; Ximeng Liu ; Liu, J.K. ; Jun Shao Network, IEEE Volume: 28 Issue: 4 Date : July-August 2014 Page(s): 46 - 50 DOI: 10.1109/MNET.2014.6863131


68. A tutorial on particle filters for online nonlinear/non-Gaussian Bayesian trackingArulampalam, M.S. ; Maskell, S. ; Gordon, N. ; Clapp, T. Signal Processing, IEEE Transactions on Volume: 50 Issue: 2 Date : Feb 2002 Page(s): 174 - 188 DOI: 10.1109/78.978374 Cited by: Papers (2457)


69. Internet of Things in Industries: A SurveyLi Da Xu ; Wu He ; Shancang Li Industrial Informatics, IEEE Transactions on Volume: 10 Issue: 4 Date : Nov. 2014 Page(s): 2233 - 2243 DOI: 10.1109/TII.2014.2300753


70. Super-resolution image reconstruction: a technical overviewSung Cheol Park ; Min Kyu Park ; Moon Gi Kang Signal Processing Magazine, IEEE Volume: 20 Issue: 3 Date : May 2003 Page(s): 21 - 36 DOI: 10.1109/MSP.2003.1203207 Cited by: Papers (732)


71. Mimo for millimeter-wave wireless communications: beamforming, spatial multiplexing, or both?Sun, S. ; Rappaport, T.S. ; Heath, R.W. ; Nix, A. ; Rangan, S. Communications Magazine, IEEE Volume: 52 Issue: 12 Date : December 2014 Page(s): 110 - 121 DOI: 10.1109/MCOM.2014.6979962


72. Future internet: The Internet of ThingsLu Tan ; Neng Wang Advanced Computer Theory and Engineering (ICACTE), 2010 3rd International Conference on Volume: 5 Date : 20-22 Aug. 2010 Page(s): V5-376 - V5-380 DOI: 10.1109/ICACTE.2010.5579543 Cited by: Papers (34)


73. Robust uncertainty principles: exact signal reconstruction from highly incomplete frequency informationCandes, E.J. ; Romberg, J. ; Tao, T. Information Theory, IEEE Transactions on Volume: 52 Issue: 2 Date : Feb. 2006 Page(s): 489 - 509 DOI: 10.1109/TIT.2005.862083 Cited by: Papers (2781)

http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6863131http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rongxing%20Lu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hui%20Zhu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ximeng%20Liu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Liu,%20J.K..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jun%20Shao.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6863131http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6863131http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=978374http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Arulampalam,%20M.S..QT.&searchWithin=p_Author_Ids:37282391200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Maskell,%20S..QT.&searchWithin=p_Author_Ids:37268735800&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Gordon,%20N..QT.&searchWithin=p_Author_Ids:37339533600&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Clapp,%20T..QT.&searchWithin=p_Author_Ids:37362913800&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=978374&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=978374http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=978374http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6714496http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Li%20Da%20Xu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wu%20He.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Shancang%20Li.QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6714496http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6714496http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1203207http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sung%20Cheol%20Park.QT.&searchWithin=p_Author_Ids:38201050200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Min%20Kyu%20Park.QT.&searchWithin=p_Author_Ids:38225705700&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Moon%20Gi%20Kang.QT.&searchWithin=p_Author_Ids:37271701500&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1203207&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1203207http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1203207http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6979962http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sun,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rappaport,%20T.S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Heath,%20R.W..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Nix,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rangan,%20S..QT.&newsearch=truejavascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6979962http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6979962http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5579543http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Lu%20Tan.QT.&searchWithin=p_Author_Ids:38195157300&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Neng%20Wang.QT.&searchWithin=p_Author_Ids:37289917600&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=5579543&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5579543http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5579543http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1580791http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Candes,%20E.J..QT.&searchWithin=p_Author_Ids:37293894200&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Romberg,%20J..QT.&searchWithin=p_Author_Ids:37295333100&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Tao,%20T..QT.&searchWithin=p_Author_Ids:37393195900&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1580791&


74. A survey of spectrum sensing algorithms for cognitive radio applicationsYucek, T. ; Arslan, H. Communications Surveys & Tutorials, IEEE Volume: 11 Issue: 1 Date : First Quarter 2009 Page(s): 116 - 130 DOI: 10.1109/SURV.2009.090109 Cited by: Papers (695)


75. Spatial Modulation for Generalized MIMO: Challenges, Opportunities, and ImplementationDi Renzo, M. ; Haas, H. ; Ghrayeb, A. ; Sugiura, S. ; Hanzo, L. Proceedings of the IEEE Volume: 102 Issue: 1 Date : Jan. 2014 Page(s): 56 - 103 DOI: 10.1109/JPROC.2013.2287851 Cited by: Papers (8)


76. Cognitive radio: brain-empowered wireless communicationsHaykin, Simon Selected Areas in Communications, IEEE Journal on Volume: 23 Issue: 2 Date : Feb. 2005 Page(s): 201 - 220 DOI: 10.1109/JSAC.2004.839380 Cited by: Papers (3872)


77. A Primer on Hardware Security: Models, Methods, and MetricsRostami, M. ; Koushanfar, F. ; Karri, R. Proceedings of the IEEE Volume: 102 Issue: 8 Date : Aug. 2014 Page(s): 1283 - 1295 DOI: 10.1109/JPROC.2014.2335155 Cited by: Papers (1)


78. Smart home energy management system including renewable energy based on ZigBee and PLCJinsoo Han ; Chang-sic Choi ; Wan-Ki Park ; Ilwoo Lee ; Sang-Ha Kim Consumer Electronics, IEEE Transactions on Volume: 60 Issue: 2 Date : May 2014 Page(s): 198 - 202 DOI: 10.1109/TCE.2014.6851994


79. Feature selection based on mutual information criteria of max-dependency, max-relevance, and min-redundancyPeng, H. ; Fulmi Long ; Ding, C. Pattern Analysis and Machine Intelligence, IEEE Transactions on Volume: 27 Issue: 8 Date : Aug. 2005 Page(s): 1226 - 1238 DOI: 10.1109/TPAMI.2005.159 Cited by: Papers (819)


80. Communicating While Computing: Distributed mobile cloud computing over 5G heterogeneous networksBarbarossa, S. ; Sardellitti, S. ; Di Lorenzo, P. Signal Processing Magazine, IEEE Volume: 31 Issue: 6 Date : Nov. 2014

javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1580791http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1580791http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4796930http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yucek,%20T..QT.&searchWithin=p_Author_Ids:37276660100&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Arslan,%20H..QT.&searchWithin=p_Author_Ids:37279667100&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=4796930&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4796930http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4796930http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6678765http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Di%20Renzo,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Haas,%20H..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ghrayeb,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sugiura,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hanzo,%20L..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6678765&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6678765http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6678765http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1391031http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Haykin,%20Simon.QT.&searchWithin=p_Author_Ids:37285076500&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=1391031&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/browsePopular.jsp#http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1391031http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1391031http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6860363http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rostami,%20M..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Koushanfar,%20F..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Karri,%20R..QT.&newsearch=truehttp://ieeexplore.ieee.org/xpl/abstractCitations.jsp?tp=&arnumber=6860363&javascript:loginRedirect('saveToProjectRequiresSignIn')http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6860363http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6860363http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6851994http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jinsoo%20Han.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chang-sic%20Choi.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresu

Browse Popular - cisl.columbia.edu · Intelligent Systems and Signal Processing (ISSP), 2013...

Documents

Transcript of Browse Popular - cisl.columbia.edu · Intelligent Systems and Signal Processing (ISSP), 2013...