ANALYSIS OF SINGLE EVENT TRANSIENT EFFECTS IN ANALOGUE...

Universidad de Sevilla (AICIA)

Centro Nacional de Microelectrónica (IMB-CNM)

ANALYSIS OF SINGLE EVENT TRANSIENT EFFECTS IN ANALOGUE

TOPOLOGIES Fourth International Workshop on Analogue and Mixed Signal Integrated

Circuits For Space Applications (AMICSA) August 27th 2012

ESA/ ESTEC Noordwijk

F. Márquez, F. Muñoz, M. A. Aguirre, F. R. Palomo (Universidad de Sevilla-AICIA)

M. Ullán (Instituto de Microelectrónica de Barcelona)



Outline Introduction Motivation Description of the implemented tool SET emulation models Single Event Simulation Analyzer methodology Examples of tool performance

Conclusions and future work

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Introduction

High-energy particle impacts become critical as technology shrinks.

Single Event Effects (SEE) are a major concern not only in digital domain but also in analogue cells.

Dealing with the analysis of analogue

circuits is a challenging tread as the number of transistors increases.

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Motivation: SET sensitivity evaluation

The work presented has been carried out in colaboration with IMB-CNM and Arquimea. Need for a SET sensitivity evaluation in a reconfigurable System-

on-chip for radiation-hardening purposes.

A tool to evaluate the SET sensitivity at transistor level in complex circuits. Provide a useful information about critical nodes of the circuit

under test to the analog designer. Easy to use by the circuit designer.

Development of the tool will be continued under FT-Unshades (digital SEU sensitivity evaluation)

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INPUT NETLIST

AutomaticTool

Simulationparameters(nodes, Qc,

impact times,heuristics)

OceanScript

Cadencesoftware

Output File(Extracted

data)

Comparisonwith non-irradiated

performance

AUTOMATIC TOOL

InstrumentedNetlist

Single Event Simulation Analyzer

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The circuit designer has to define the test-bench of the circuit under test: A netlist that describes the circuit is

required as an input.

The tool automatically creates an instrumented netlist. SET models for impacts emulation are

added to every possible target. The user provides configuration

parameters for simulation and analysis of the circuit.

A simulation script is automatically

created. Compares an ideal (non-irradiated)

output and the signal affected by injected SETs.

Results of the analysis of circuit’s vulnerabilities are extracted.



INPUT NETLIST

AutomaticTool



OceanScript

Cadencesoftware


data)


performance

AUTOMATIC TOOL

InstrumentedNetlist

Single Event Simulation Analyzer

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The circuit designer has to define the test-bench of the circuit under test: A netlist that describes the circuit is











INPUT NETLIST

AutomaticTool



OceanScript

Cadencesoftware


data)


performance

AUTOMATIC TOOL

InstrumentedNetlist

Single Event Simulation Analyzer The circuit designer has to define the

test-bench of the circuit under test: A netlist that describes the circuit is









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SET emulation

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SET emulation based on charge injection models: Current sources with double exponential dynamics* Use of configurable parameters (AHDL implementation)

*REF: G. Messenger, “Collection of Charge on junction nodes from ion tracks”, IEEE Transactions on nuclear science, vol.29, nº 6, Dec. 1982



Single Event Simulation Analyzer Starting point: Input netlist

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To extract the Spectre netlist, the tool requires a test-bench for the analog scheme under test.

INPUT NETLIST

AutomaticTool



OceanScript

Cadencesoftware


data)


performance

AUTOMATIC TOOL

InstrumentedNetlist



Single Event Simulation Analyzer Starting point: circuit test-bench

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This test bench is the same used by the designer to test the performance of the analog circuits




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This test bench is the same used by the designer to test the performance of the analog circuits




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The only extra effort required is to place the SET models (provided to the user)



Single Event Simulation Analyzer From the input netlist, the tool:

• Step 1: generates an instrumented netlist • Step2 : creates a simulation script that automatically:

• analyzes the SET sensitivity of the analog circuit . • Extracts critical information and provides an output file with

the results.

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Single Event Simulation Analyzer Step 1: Netlist instrumentation: Technology information is

provided to the designer. SET emulation models are

added to generate a new netlist.

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INPUT NETLIST

AutomaticTool



OceanScript

Cadencesoftware


data)


performance

AUTOMATIC TOOL

InstrumentedNetlist



Define the technology Welcome to SET analyzer >> loadtech ST130nm.txt Successful

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A technology file is loaded (provided to the designer) with the required information for SET models placement, making this process technology independent.

Example: SET Sensitivity for a 130 nm analog cell



Instrumented netlist Welcome to SET analyzer >> loadtech ST130nm.txt Successful >> source netlistCM130nm Source netlist netlistCM130nm successfully opened Successful

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A Spectre netlist is loaded as an input for the tool, which creates an instrumented version adding the SET emulation models

A technology file is loaded (provided to the designer) with the required information for SET models placement and particle impacts, making this process technology independent.




Script generation Step 2: Automatic script

generation

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• Configuration parameters should be defined by the user.

• Example: Impact nodes.

INPUT NETLIST

AutomaticTool



OceanScript

Cadencesoftware


data)


performance

AUTOMATIC TOOL

InstrumentedNetlist



Impact nodes selection >> listAlltargets Possible targets: SET_I0_M13 SET_I0_M12 SET_I0_M11 SET_I0_M10 SET_I0_M9 SET_I0_M8 SET_I0_M7 SET_I0_M6 SET_I0_M5 SET_I0_M4 SET_I0_M3 SET_I0_M2 SET_I0_M1 SET_I0_M0 Successful

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The tool provides a list of the possible targets which have to be properly configured for SET emulation




Impact nodes selection >> listAlltargets Possible targets: SET_I0_M13 SET_I0_M12 SET_I0_M11 SET_I0_M10 SET_I0_M9 SET_I0_M8 SET_I0_M7 SET_I0_M6 SET_I0_M5 SET_I0_M4 SET_I0_M3 SET_I0_M2 SET_I0_M1 SET_I0_M0 Successful >> Addtarget SET_I0_M5 Successful >> Addtarget SET_I0_M7 Successful >> Addtarget SET_I0_M10 Successful

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We can add all the targets for a massive campaign or only a group of them to perform a more selective analysis at a sub-block level

The tool provides a list of the possible targets which have to be properly configured for SET emulation




Script generation Step 2: Automatic script generation Configuration parameters should be defined:

• Impact nodes. • SET model parameters:

– Charge injected – Impact times

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SET model parameters >> listtargets Possible impacts in: Source Q T SET_I0_M7 (0.5p) (10n 20n) SET_I0_M5 (0.5p) (10n 20n) SET_I0_M10 (0.5p) (10n 20n) Successful

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21

Critical charge to be injected to emulate a particle impact (defined in the SEE models).




SET model parameters >> listtargets Possible impacts in: Source Q T SET_I0_M7 (0.5p) (10n 20n) SET_I0_M5 (0.5p) (10n 20n) SET_I0_M10 (0.5p) (10n 20n) Successful

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Impact times. A generated SET can be more or less critical depending on the impact time selected.

Critical charge to be injected to emulate a particle impact (defined in the SEE models).




SET model parameters >> listtargets Possible impacts in: Source Q T SET_I0_M7 (0.5p) (10n 20n) SET_I0_M5 (0.5p) (10n 20n) SET_I0_M10 (0.5p) (10n 20n) Successful >> setT SET_I0_M7 (13n 26n 31n ) Successful >> setQ SET_I0_M10 (0.25p) Successful

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Charge to be injected to emulate a particle impact (defined in the SET models).

Definition of impact times and charge




SET model parameters >> listtargets Possible impacts in: Source Q T SET_I0_M7 (0.5p) (10n 20n) SET_I0_M5 (0.5p) (10n 20n) SET_I0_M10 (0.5p) (10n 20n) Successful >> setT SET_I0_M7 (13n 26n 31n ) Successful >> setQ SET_I0_M10 (0.25p) Successful >> listtargets Possible impacts in: Source Q T SET_I0_M7 (0.5p) (13n 26n 31n ) SET_I0_M5 (0.5p) (10n 20n) SET_I0_M10 (0.25p) (10n 20n) Successful

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Charge to be injected to emulate a particle impact (defined in the SET models).




Script generation Step 2: Automatic script generation Configuration parameters should be defined:

• Impact nodes. • SEE model parameters:

– Critical charge – Impact times

• Outputs selected.

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Outputs selection >> listallnodes Possible output nodes: /net19 /vcn /vcp /vdd /net10 /Vout /net11 /vss /0 /I0/net12 /I0/net16 /I0/net32 /I0/net33 /I0/net24 /I0/net45 /I0/Vout0 /I0/net42 Successful

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A list of available nodes to be selected for analysis is provided, including internal nodes of different sub-blocks.




Outputs selection >> listallnodes Possible output nodes: /net19 /vcn /vcp /vdd /net10 /Vout /net11 /vss /0 /I0/net12 /I0/net16 /I0/net32 /I0/net33 /I0/net24 /I0/net45 /I0/Vout0 /I0/net42 Successful >> addOutput /Vout Successful >> addOutput /I0/net32 Successful

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A list of available nodes to be selected for analysis is provided, including internal nodes of different sub-blocks.

- The tool will only consider for analysis the nodes selected by the designer

- Only the information of this nodes will be saved during simulations




Outputs comparison

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Two main transient parameters have been considered: • Recovery time •Voltage deviation




Transient simulations are performed

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Analysis of the results Output file Results are automatically

extracted, analyzed and saved into an output file.

The process is transparent to the user.

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INPUT NETLIST

AutomaticTool



OceanScript

Cadencesoftware


data)


performance

AUTOMATIC TOOL

InstrumentedNetlist



Database is automatically generated

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Output Impact Qc Timp Trec Vmax /I0/net32 I0_M5 5,00E-13 1,00E-08 5.100.000 0.109233 /Vout I0_M5 5,00E-13 1,00E-08 6.400.000 0.225535 /I0/net32 I0_M5 5,00E-13 2,00E-08 5.100.000 0.109186 /Vout I0_M5 5,00E-13 2,00E-08 6.400.000 0.225493 /I0/net32 I0_M7 5,00E-13 1.3e-08 2.300.000 0.426629 /Vout I0_M7 5,00E-13 1.3e-08 3.600.000 0.183520 /I0/net32 I0_M7 5,00E-13 2.6e-08 2.300.000 0.370461 /Vout I0_M7 5,00E-13 2.6e-08 3.000.000 0.147083 /I0/net32 I0_M10 2,50E-13 1,00E-08 2.800.000 0.205726 /Vout I0_M10 2,50E-13 1,00E-08 3.900.000 0.186725 /I0/net32 I0_M10 2,50E-13 2.0e-08 3.300.000 0.143872 /Vout I0_M10 2,50E-13 2.0e-08 4.600.000 0.231184 . . .




Database is automatically generated

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Output Impact Qc Timp Trec Vmax /I0/net32 I0_M5 5,00E-13 1,00E-08 5.100.000 0.109233 /Vout I0_M5 5,00E-13 1,00E-08 6.400.000 0.225535 /I0/net32 I0_M5 5,00E-13 2,00E-08 5.100.000 0.109186 /Vout I0_M5 5,00E-13 2,00E-08 6.400.000 0.225493 /I0/net32 I0_M7 5,00E-13 1.3e-08 2.300.000 0.426629 /Vout I0_M7 5,00E-13 1.3e-08 3.600.000 0.183520 /I0/net32 I0_M7 5,00E-13 2.6e-08 2.300.000 0.370461 /Vout I0_M7 5,00E-13 2.6e-08 3.000.000 0.147083 /I0/net32 I0_M10 2,50E-13 1,00E-08 2.800.000 0.205726 /Vout I0_M10 2,50E-13 1,00E-08 3.900.000 0.186725 /I0/net32 I0_M10 2,50E-13 2.0e-08 3.300.000 0.143872 /Vout I0_M10 2,50E-13 2.0e-08 4.600.000 0.231184 . . .



Tool performance The analysis of several

analog topologies has been performed: 130nm technology Amplifier topologies:

a) Two stage Miller OpAmp

b) Telescopic OpAmp c) Fully cascoded two

stage OpAmp d) Current mirror

OpAmp (OTA)

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Vin

in

+

+

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Vout

out

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B

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in

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(a) (b)

(c) (d)

Vin-

Vout

Example: SET Sensitivity for 130 nm analog cells



Tool performance The analysis of several

analog topologies has been performed: Test-bench:

Input signal: • A= 400mV • Fin= 200MHz (T=5ns)

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(a) (b)

(c) (d)

Vin-

Vout





Tool performance

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(a) (b)

(c) (d)

Vin-

Vout

Longest Trec= 4.4ns

Longest Trec= 6.4ns Longest Trec= 6.3ns

Largest Vmax = 290mV

The analysis of several analog topologies has been performed: Test-bench:

Input signal: • A= 400mV • Fin= 200MHz (T=5ns)

Longest Trec= 5.1ns Largest Vmax = 394mV

Largest Vmax = 390mV Largest Vmax = 390mV



Conclusions and future work A first version of the tool for SET sensitivity analysis in

analog schemes has been designed Allows a rapid SET sensitivity analysis of critical nodes at

schematic level. Technology independent.

Tool posibilities and future trends Implementation of alternative SET models. Extension of the fault injection to layout simulation

(charge sharing) Unify this tool with FT-Unshades to obtain a mixed signal

SET sensitivity analizer.

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Thanks for your attention

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Contact:

[email protected] AICIA-Universidad de Sevilla

Camino de los descubrimientos S/N 41092 Sevilla (Spain)

mailto:[email protected]

ANALYSIS OF SINGLE EVENT TRANSIENT EFFECTS IN ANALOGUE...

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