all you need for emc testIng the complete product · PDF fileall you need for emc testIng the...

InnovatIve equIpment for emc testIng and measurIng

all you need for emc testIng

the completeproduct range

emc testIngemI measurIng

the full range of em test: solutIons for all IndustrIal sectors

> service & support> accredited calibration laboratory> extended warranty > emc-testing laboratory> emc-seminars and workshops> rental service

pages 4 – 5

pages 6 – 7

pages 8 – 15

pages 16 – 25

pages 26 – 39

pages 40 – 53

pages 54 – 63

pages 64 – 69

pages 70 – 77

pages 78 – 83servIces

the emc company

operation concept and software

telecom

Industry

medical

residential

Broadcast

components & safety

renewable energy

military

aircraft

accessories

aBout em test

sImulators & emc-equIpment

automotive

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nfide nce for sure!

accredited laboratories

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Em TEsT: the complete overvIew of emc solutIons

the emc companyany electronic or electrical device is part of a complex environ-ment, heavily charged with conducted and radiated interference. every electronic or electrical device is required to operate as intended in this environment without generating electromagne-tic disturbances affecting other devices in its vicinity. a wide range of standards and directives regulate both the suscepti-bility as well as the maximum permissible emission level for each device. for you as a manufacturer both aspects need to be carefully examined and considered from the very early stages of

development to obtain a high-quality product in terms of electro-magnetic compatibility. em test offers outstanding expertise in emc. our solutions and know-how in testing the suscepti-bility and measuring emissions are recognised worldwide. em test is the leading manufacturer of high-class, fully com-pliance emc testing and measurement equipment for the elec-tronics industry in the automotive, telecom, medical, industrial electronics, avionics and military sectors.

standards provide a driving force in the emc business and form the framework for any manufacturer of electronic products and systems, protecting and safeguarding the environment from unnecessary electromagnetic interference. standards are vital in this sector and test equipment manufacturers make a valua-ble contribution in highlighting technical aspects and practical applications for the equipment specified in the standards. this leads to more application-oriented standards, which directly benefit the user. em test experts are members of national and international research groups and standards committees.

In this way we contribute towards adaptive and practical stan-dards. consequently, we guarantee that the technical specifi-cations are integrated in our products and testing procedures are interpreted according to the relevant standards. we thereby anticipate future developments of standards for the benefit of our customers.

not only do we manufacture and supply test equIpment we also provIde complete solutIons, e.g.:

> full complIance wIth current requIrements and adaptaBIlIty to future developments

> accessorIes for easy and complIant test set-up InstallatIons

> user-frIendly test routInes, lIBrarIes of standards and test report generatIon

electromagnetIc compatIBIlIty InnovatIve technology

for emc testIng and measurIng

specIfIed In standards

Com

pany

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presentatIon of the results as a well arranged test report

the functIon Keys

parameters and complete test routines are selected via function keys. comprehensive navigation makes operation as easy as possible. service and self-check routines enable the user to verify the generator.

outstandIng ease of operatIon

cursor keys and rotary knob ensure maximum user-friendly operation of the simulator.

clear dIsplay

menus and parameters are clearly arranged in the lcd display for quick and accurate programming of tests.

gpIB and usB Interfaces faIl1 and faIl2

every generator is equip-ped with both gpIB and usB interfaces for remote control. fail1 and fail2 inputs are implemented for dut monitoring pur-poses.

a closer looK at the softwareeverythIng Is there, everythIng Is possIBle

Test Report iso.control

Page 2 of 3

A c c e s s o r i e s Serial No.

Oscilloscope 119987

Datalogger 737882

Absorbing clamp 6777

T e s t I n f o r m a t i o n

Pulse selection : Pulse 3b Test completed

Pulse selection : Pulse 4 Test completed

Pulse selection : Pulse 2b Test completed

T e s t P r o c e d u r e Pulse selection: Pulse 3b

Test file: 3b.tst

Test generator: UCS200M Software No.: 0073490

Serial No.: V0897847256

Va (Alternator): 13.5 V Current limit: 15 A

Software: iso.control Version: 5.0.2

T e s t S e t u p Pulse selection: Pulse 3b

Vs: +100 V

f1: 10 kHz

t4: 10 ms

t5: 90 ms

tr: 5 ns

td: 100 ns

Ri: 50 Ohm

Coupling: Battery

Test duration: 1 m

T e s t P r o c e d u r e Pulsauswahl : Puls 4

Test File: 4.tst

Test generator: VDS200N50.1 Software No.: 0083243

Serial No.: V08324656

Coupling network: UCS200M Serial No.:

Vb (Battery): 12.0 V Current limit: 15 A

Software: iso.control Version: 5.0.2

TEsT rEporT

Test Report iso.control Test Report iso.control

the operatIon conceptthe BasIs for versatIle and multIple applIcatIons

easy selectIon of predefIned norms and products

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Em TEsT: the complete overvIew of emc solutIonsEm TEsT: the complete overvIew of emc solutIons

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automotIvethe vds 200n series is used to simulate the various battery supply waveforms recommended by international standards and car manufacturer standards. the wide range of manufac-turer requirements make this an extremely important area, which is covered by the vds 200n series.additionally, the vds 200n series serves as a powerful dc voltage supply for the dut during tests with automotive tran-sients.

autowave is used for the following applications:> generation of all kinds of voltage profiles via software> replay of imported data or plot files, record & play> recording voltage variations in the actual vehicle> replaying the measured data via a suitable

dc source or amplifier> analysis of recorded voltages and currents> export of measured data to other software tools

Technical DaTa (OveRview)

voltage range 0 v – 60 v with 0.1 v steps

VDs 200N10 I = 0 a – 10 a cont., 15 a peak

VDs 200N15 I = 0 a – 15 a cont.

VDs 200N30 I = 0 a – 30 a cont., 70 a for 500 ms



VDs 200N150 I = 0 a – 150 a cont.

VDs 200N200 I = 0 a – 200 a cont.

VDs 200N200.1 I = 0 a – 200 a cont., 1,000 a for 500 ms

VDs 200N30.1 range I: -5 v ± 30 v

I = 50 a cont., 150 a for 200 ms

range II: - 5 v ± 60 v

I = 30 a cont., 90 a for 200 ms

VDs 200N50.1 range I: -5 v ± 30 v

I = 85 a cont., 220 a for 200 ms


I = 50 a cont., 150 a for 200 ms

frequency range dc up to 100 khz*

* only for ford emc-cs-2009.1

preprogrammed pulses 2b, 4, sinewave, sinewave sweep, etc.

source impedance Zq = < 10 mΩ


wave generator 2 output channels standard

4 output channels optional

output range ±10 v / 50 Ω

resolution 16 bit

frequency range dc – 50 khz

sample rate up to 500 khz

waveform segments dc voltage, sine wave, sine wave sweep,

sine ramped, square wave, triangular

wave, saw-tooth wave, ramp up/down,

exponential wave, damped oscillation, etc.

functions Iteration of up to 9 parameters per level,

up to 9 levels

pseudo-random distribution of parameters

wave recorder 2-channel measuring input

Input range ±5 v, 10 v, 20 v, 50 v, 100 v

OveRview

Application Battery simulation

Transients Ford specifications

power Fail Transient Emission

Conducted & radiated immunity

ElectrostaticDischarge

products vds 200n-seriesautowave

ucs 200n-seriesld 200nld 200s-series

amp 200n-seriesrcB 200rcB 200n1cn 200n1

pfs 200n-series

Bs 200n80Bsm 200n40an 2050n-series

cws 500n2cws 500n3

ditoesd 30n

standards Iso 16750manufacturer

Iso 7637manufacturer

manufacturer manufacturer cIspr 25Iso 7637manufacturer

Iso 11452-Xmanufacturer

Iso 10605manufacturer

BatterysImulatIon

vds 200n-serIesBattery supply simulator and dc voltage source signal generator and recorder

autowave

Iso 7637-2, Iso 16750, manufacturer specifications

> stand-alone, programmable dc source

> manual & remote operation

> 60 v/15 a up to 200 a (2,000 a inrush current)

> simulation + measuring + analysing

> 16 bit resolution, 80 gByte hard disk memory

> simultaneous record & play function

Iso 16750, vehicle manufacturer specifications

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> rc-generator, test pulses 5a/5b as per Iso 7637-2


> real source impedance, selectable

Iso 7637-2, sae J1113, manufacturer specifications


pulses as per toyota tsc 7001g

LD 200s18 field decay

LD 200s19 load dump pulse 1

load dump pulse 2

load dump pulse 3

the ucs 200n ultra compact simulator for automotive transi-ents unites the capabilities of an eft/burst simulator, a micro-pulse simulator and the required coupling network in one box. the ucs 200n can be equipped to meet all international and car manufacturer specifications from around the globe. the coupling network can carry currents up to 200 a depending on the model. for non-standard tests the waveform parameters of the micropulse generator can be varied over a wide range. the built-in coupling network can be used and controlled by any unit of the ld 200n series and vds 200n series.

load dump pulses simulate the sudden disconnection (e.g. by corrosion) of the battery from the alternator while the alterna-tor is generating current to load the battery. such load dump pulses are high-energy pulses with a high destructive potential.the ld 200n simulates these high-energy pulses having a duration time in the range of hundreds of milliseconds.


pulse 3a/3b as per Iso 7637-2

open-circuit 25 v – 1,000 v

rise time 5 ns

pulse duration 150 ns

ri 50 Ω

3a > negative, 3b > positive

micropulses as per Iso 7637-2

open-circuit 20 v – 600 v

pulses 1, 1a, 2a and 6

ri 2, 4, 10, 20, 30, 50, 90 Ω

output coaxial connector 50 Ω

additional standard test routines sae J1455 inductive & mutual

nIssan B2, c8, c50, c300

Jaso a2, B2, d2

freestyle


rise time tr 1 µs – 10 µs

duration td 50 µs – 10,000 µs

ri 2 – 450 Ω

dut supply 60 v

transIents

ucs 200n-serIesultra compact simulator for automotive transients for pulses 1, 1a, 2a, 3a/3b and 6

ld 200n

Iso 7637-2, Iso 7637-3, sae J1113, Jaso d001, manufacturer specifications


pulse 5a as per Iso 7637-2


rise time 5 ms – 10 ms

pulse duration 40 ms – 400 ms

ri selectable 0.5 – 38 Ω in 0.1 Ω steps

pulse 5b as per Iso 7637-2 clipped load dump

clip voltage 15 v – 99.5 v in 0.5 v steps

manufacturer specifications sae 1455, Jaso, chrysler, ford

scania, mercedes, nissan, etc.

freestyle

rise time tr < 1 μs

10 μs – 90 μs with 10 μs steps

100 μs – 900 μs with 100 μs steps

1 ms – 10 ms with 1 ms steps

pulse duration 10 ms to 1,200 ms

Internal resistor 0.5 – 38 Ω in 0.1 Ω steps

dut supply 60 v

> test pulses acc. to Iso, Jaso, nIssan, sae


> freestyle pulse shape generation

load dump pulses simulate the sudden disconnection (e.g. by corrosion) of the battery from the alternator while the alterna-tor is generating current to load the battery. such load dump pulses are high-energy pulses with a high destructive potential.the ld 200sx simulates these high-energy pulses having a duration time in the range of hundreds of milliseconds.

transIents

ld 200s-serIes

> field decay and load dump as per toyota

> spark gap test included


automotive high-energy load dump generator for pulses 5 and 7

tsc 7001g

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ford emc-cs-2009 transIent emIssIon

Bs 200nX/Bsm 200n40electronic switch for transient emission testing /mechanical switch for transient emission testing

Iso 7637-2 (2011)

> 60 v / up to 100 a

> electronic and mechanical switch

> Inverse-polarity protected


amplifier output characteristics

frequency range dc - 250 khz

signal power 250 w (nominal) or 800 w (nominal)

output voltage 50 v rms, max. 150 v p-p

output current max. 5 a rms or max. 16 a rms

harmonic distortion (thd) < 0.1 %

current protection short circuit protected

overvoltage protection for voltages > 20 v fed back by the dut

signal generator output characteristics

frequency range dc, 10 hz – 250 khz (sinusoidal)

output voltage +/-10 v

dc offset 0-10 v, programmable, to control ext. dc amp.

measurement frequency-selective voltage/current

measurement (rms)

accessories

radiation loop 120 mm radiation loop for magnetic field

testing as per ford emc-cs-2009.1, rI 140

loop sensor to measure the magnetic field strength

cn 200n1

transformer assembly with built-in

0.5 Ω/250 w resistive load as per

ford emc-cs-2009.1

the rcB 200 series are transient pulse generators specifically designed as per ford test requirements to simulate „real-world fast transients“, actually being generated by a specific type of relay switching selected components in a defined circuit. a va-riety of pulses is generated by using different arrangements of component layouts.

a complete overview of em test accessories for the various test applications is given on pages 68 – 74.

the amp 200n series is a low-frequency signal source that ge-nerates sinusoidal signals used for simulating ripple noise and ground shift noise required by a variety of automotive stan-dards industry e.g. ford emc-cs-2009.1, cI 210, cI 250 and rI 150. additionally, the amp 200n can be used to generate ma-gnetic fields by means of a radiation loop or small helmholtz coils as per rI 140 of ford emc-cs-2009.1.controlled by the autowave a large number of different standard requirements can be covered.

ford es-Xw7t-1a278-ac and ford emc-cs-2009.1chrysler dc-10615, dc-11224, cs-11809, cs-11979, daimlerchrysler dc-10614, dc-10615, dc-11224, fiat 9.90110, fiat 9.90111, ford es-Xw7t-1a278-ac, ford emc cs-2009.1 gm 3097, Iso 11452-8, Iso 11452-10, Iveco 16-2119, Jaguar/landrover emc-cs-2010Jlr, mitsubishi es-X82114, es-X82115, mBn 10284-2, nIssan 28401 nds02, psa B21 7110, renault 36.00.808/--g, --h, --J, --K, --l, sae J1113-2, sae J1113-22, tata motors tst/ts/wI/257, volkswagen tl 825 66, volvo std 515-0003, germanischer lloyd gl vI 7-2, do-160e/f/g, mIl-std-461e/f

> ford cI-220, pulses a1, a2, B1, B2, c1, c2

> ford cI-260, pulse f

> ford rI-130, pulses a2-1 and a2-2 (rcB 200n1)

> Built-in dds to generate sinusoidal signals up to 250 khz

> Built-in lf amplifier, 250 w or 800 w

> output voltage max. 150 v p-p

transient generators for ford test requirementsrcB 200 / rcB 200n1amp 200n-serIes

low-frequency signal source for supply simulation and magnetic field testing

audio transformer assembly for conducted immunity testingcn 200n1


pFs 200N30 max. battery supply voltage 60 v

nominal current I = 0 a – 30 a cont.

Inrush current max. I = 70 a for 500 ms











switching time (on/off) < 1 µs


Bs 200Nx electronic switch

voltage max. 60 v dc

current max. 100 a

voltage drop < 1 v at 100 a

peak voltage max. 1.000 v

peak current max. 400 a for 200 ms

switching time 300 ns +/- 20 % into test load

on/off time min. 10 ms to 500 ms

AN 20100N artificial network

frequency range 0.1 to 150 mhz

operation voltage 1.000v dc / 250 v ac (up to 1 khz)

operation current 100 a continuous

Impedance 50 Ω // 5uh +/-10 %

Insertion loss < 3 dB

Bsm 200N40 mechanical switch

operation voltage max. 16 v dc

operation current 40 a dc

pfs 200n-serIespower fail simulator

chrysler pf 9326, fiat 9.90110, ford es-Xw7t-1a278-aB, ford wdr 00.00 ea, Jaso d001-94, mitsubishi es-X82010, nissan 28401 nds 02, psa B21 7090, psa B21 7110, renault 36.00.808/--d, renault 36.00.808/--e, renault 36.00.808/--f, toyota tsc3500g, toyota tsc3590g, toyota tsc7203g, Bmw gs 95003-2, daimlerchrysler dc-10615 rev. a, freightliner 49-00085, hyundai es 39110-00, mack trucks 606gs15, volvo emc requirements (1998), volvo emc requirements (2002), renault 36.00.808/--g, daimlerchrysler dc-10842, toyota tsc6203g

> voltage dropout, voltage dip, micro-interruption

> 60 v/30 a up to 200 a


> frequency range 30 hz to 250 khz

> 2 audio transformers 2 x 200 watt

> Built-in low inductive load resistor 0.5 Ω, 250 w

ford emc-cs-2009.1, sae J1113-2, germanischer lloyd gl vI 7-2

the pfs 200n power fail simulator generates fast voltage dips and drops (micro-interruptions) which enable mainly vehicle manufacturers to comply with standard requirements. electro-nic switch technology in the pfs 200n ensures very fast rise and fall time (below 1 microsecond) requirements are met.

the Bs 200nx is used to measure transient emissions to the wiring harness of parts and components installed in a vehi-cle. additionally the required lIsns and the reference load ca Bs200nx are available. the lIsns and the switch can be opera-ted independently as required for the measurements.

power faIl

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esd as per Iec 61000-4-2 ed.2 and Iso 10605

test voltage max. 30 kv

discharge air/contact discharge

polarity positive/negative

hold-on time > 5 s

specification contact discharge 0.2 – 30 kv

rise time tr 0.8 ns ± 25 %

peak of discharge currents 3.75 a/kv

r/c parameters 150pf/330 Ω –– 330pf/330 Ω

150pf/2,000 Ω –– 330pf/2,000 Ω

100pf/1,500 Ω –– customized

special technical highlights

- rc network values indicated on the lcd

- ad or cd discharge mode indicated on the lcd

- Bleed-off function to discharge the eut

- temperature and humidity sensor included

- usB or optical interface included

- esd.control software

- ac or dc power supply (battery mode included)

- power supply: ac (88 – 250 v), dc (11 – 16 v)

- Battery mode included for several hours

electrostatic discharges between objects can cause persistent disturbances or even destruction of sensitive electronics or controls. dito is the most advanced esd tester for accurate si-mulation of esd pulses according to the latest standards.Its efficient battery power concept allows users to generate up to 50,000 pulses at maximum test voltage from a single batte-ry. standard and pre-programmed user test routines make esd testing an easy and comfortable procedure.

the esd 30n is the state-of-the art esd tester for all test requi-rements demanding more than 15 kv. powered by the mains it also offers a built-in battery for testing without mains. Benefits like bleed-off function, sensor for temperature and rel. humidity and automatic polarity change-over are only a few to make the esd 30n an outstanding tester.


esd as per Iec 61000-4-2

test voltage 0.5 – 16.5 kv



hold-on time > 5 s

r/c parameter 150 pf/330 Ω

specification contact discharge 500 v to 10 kv



esd as per Iso 10605




r/c parameters 100 pf/1,500 Ω

150 pf/330 Ω

330 pf/330 Ω

150 pf/2,000 Ω

330 pf/2,000 Ω

electrostatIcdIscharge

dItothe ultimate esd tester

esd 30n

Bellcore gr-1089-core, en 300340, en 300342-1, en 300386 v1.3.2, en 301489-1, en 301489-7, en 301489-17, en 301489-24, en 55024, Iec 61000-4-2, Itu-t K.20, Itu-t K.21, Itu-t K.45, Iso 10605, Jaso d001-94, chrysler pf 9326, daimlerchrysler pf-10540, fiat 9.90110, ford wdr 00.00ea, renault 36.00.400/B, renault 36.00.400/c, toyota tsc3500g, toyota tsc3590g, volvo emc requirements (1998), en 300329

> ergonomic design

> modular concept

> easy to handle

> up to 30 kv contact & air discharge

> Interchangeable discharge networks

> for automotive, industrial and military applications

Iec 61000-4-2, Iso 10605, sae J1113-13, sae J1455, Bmw 600 13.0 (part 2), Bmw gs 5002 (1999), daimlerchrysler dc-10613, daimlerchrysler dc-10614, mercedes av emv, ford es-Xw7t-1a278-aB, gmw 3097, gmw 3097 (2001), gmw 3100, gmw 3100 (2001), mazda mes pw 67600, mitsubishi es-X82010, nissan 28401 nds 02, porsche, psa B21 7110, renault 36.00.808/-d, renault 36.00.808/-e, renault 36.00.808/-f, smart de1005B, vw tl 824 66, mBn 10284-2:2002, renault 36.00.808/-g

esd tester up to 30 kv

the cws 500n3 is a state-of-the-art solution in a compact one-box design to test immunity to conducted audio frequency disturbances and low-frequency magnetic fields. the cws 500n3 includes signal generator, lf amplifier, coupling transformer, frequency selective current and voltage monitor, software and gpIB interface. the icd.control-software supports test routines, controls ex-ternal measuring devices and automatically generates test reports with all test data included.


conducted immunity Iso 11452-10, mIl std 461

output level 0.001 v – max. 6.5 vrms

output current max. 15 a

frequency range 10 hz to 250 khz

output power nominal 100 w

output power peak 400 w

output impedance < 0.5 Ω

harmonic distortion < 20 dBc at max. power

coupling audio transformer included

measurements freq. selective voltage/current meter

verification load 0.5 Ω & 4 Ω included

radiated immunity Iso 11452-8, mIl std 461

magnetic field max. 1,000 a/m up to 1 khz

radiation loop as per mIl std 461

magnetic loop sensor as per mIl std 461

current sensor Included

cws 500n3audio frequency and magnetic field testing

Iso 11452-8, Iso 11452-10, vehicle manufacturer specifications, sae J1113, mIl-std 461

> conducted & radiated immunity up to 250 khz

> Built-in voltage/current measurement

> Built-in coupling transformer 1 : 2

Bulk current Injection (BcI) is a test procedure to test immunity to electrical disturbances caused by narrowband electroma-gnetic energy. the test signal is injected by means of a current injection probe. In physical terms the current injection probe is a current transformer laid around the wiring harness. Immunity tests are performed varying the level and the frequency of the injected test signal. the BcI test method is widely known in the automotive industry as well as in the military/aircraft industry to test single components of a complex system.

conducted andradIated ImmunIty

Bulk current Injection (BcI) testingcws 500n2

Iso 11452-4, Iso 11452-5, vehicle manufacturer specifications


BcI method Iso 11452-4

output power 100 w (nominal)

output impedance 50 Ω

max. vswr 1 : 2.0

output level -13 dBm – 50 dBm

frequency range 9 khz – 400 mhz (1,000 mhz)

modulation am 1 – 3,000 hz, 1 – 99 % depth

pm 1 – 3,000 hz

duty cycle 10% – 80 %

harmonic distortion > 20 dBc

output n-connector

Built-in power meter channel 1 forward power

channel 2 reverse power

channel 3 injected current

Built-in coupler max 200 w/1 ghz

Built-in rf switch automatic commutation to an external

amplifier

> compact simulator as per Iso 11452-4; en 61000-4-6

> 9 khz to 400 mhz, 100 w (expandable up to 1 ghz)

> system solution is fully designed and supported by em test

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renewaBleenergy the ucs 500n5/ucs 500n7 ultra compact simulators are the

most versatile testers for covering transient and power-fail re-quirements according to international (basic and generic) and product family standards with voltage capability of up to 7 kv. In addition to the Iec 61000-4-5 standard for surge testing they also comply to ansI/Ieee c62.41 requirements for surge and ring wave testing.


eft as per Iec 61000-4-4, ed. 2


rise time tr 5 ns

pulse duration td 50 ns

source impedance Zq = 50 Ω


surge as per Iec 61000-4-5

open-circuit voltage 1.2/50 µs 160 v – 5,000 v

short-circuit current 8/20 µs 80 a – 2,500 a

polarity positive/negative/alternating

mag. field as per Iec 61000-4-9 100, 300, 1,000 a/m

dips as per Iec 61000-4-11

ac voltage/current max. 400 v/16 a (p–n)

Inrush current more than 500 a

mag. field as per Iec 61000-4-8 1, 3, 10 and 30 a/m with mc 2630

100, 300 and 1,000 a/m with mc26100

telecom surge as per Iec 61000-4-5

open-circuit 10/700 µs 160 v – 5,000 v

short-circuit current 4/300 µs 4 a – 125 a

transIents

ucs 500n5.2compact tester for eft/burst, surge and power fail

Iec 61000-4-4, Iec 61000-4-5, Iec 61000-4-8, Iec 61000-4-9, Iec 61000-4-11, Iec 61000-4-29, en 61000-6-1, en 61000-6-2, en 55024, en 300340, en 300342-1, en 300386 v1.3.2, en 301489-1, en 301489-7, en 301489-17, en 301489-24, Itu-t K.20, Itu-t K.41, Itu-t K.45, en 300329

> small and compact all-in-one tester

> Iec 61000-4-4/-5/-8/-9/-11/-29

> Built-in single-phase cdn

Technical DaTa



rise time tr 5 ns













100, 300 and 1,000 a/m with mc26100

ring wave as per Iec 61000-4-12

open-circuit voltage 0.5 µs/100 khz 6,000 v with 12 Ω and 30 Ω source impedance




ucs 500n7.2

> testing beyond the limits, 5.5 kv eft & 7 kv surge

> optional rwg module as per 61000-4-12


Iec 61000-4-4, Iec 61000-4-5, Iec 61000-4-8, Iec 61000-4-9, Iec 61000-4-11, Iec 61000-4-12, Iec 61000-4-29, en 61000-6-1, en 61000-6-2, Itu-t K.20, Itu-t K.21, Itu-t K.45, Bellcore gr-1089-core, ansI/Ieee c62.41, en 61543, Iec 61008-1, Iec 61009-1, Ieee 1547, ul 1741

compact tester for eft/burst, surge, ring wave and power fail

the ucs 500n7 is the most economical test solution for fully compliant immunity tests and ce marking. a built-in cdn is used for testing single-phase euts up to 400 v/16 a, while tests on three-phase euts can be performed by adding an au-tomatically controlled external coupling network up to 690 v with max. 100 a.em test supplies a large range of accessories for various ap-plications.

OveRview

Application

Transients Damped os-cillatory and ringwave

Conducted and radiated immunity

Voltage surge and safety

powerQuality

Harmonics & Flicker

AC/DC supply Anomaly si-mulation


products ucs 500nxcnI 501/503- series

ocs 500n-seriesdow module

cws 500n1-seriescws 500n2

vss 500n10.3

pfs 503n-seriesucs 500nx

dpa 500ndpa 503naIf 503n-seriesacs 503n-series

netwave-seriessingle phasenetwave-seriesthree phase

ditoesd 30n

standards Iec 61000-4-4Iec 61000-4-5

Iec 61000-4-12Iec 61000-4-18

Iec 61000-4-6 Iec 61730-2 Iec 610004-11 Iec 61000-3-2Iec 61000-3-3Iec 61000-3-11Iec 61000-3-12

Iec 61000-4-13Iec 61000-4-14Iec 61000-4-17Iec 61000-4-27Iec 61000-4-28

Iec 61000-4-2


17

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compact tester for ring wave and damped oscillatory waves fast damped oscillatory wave option for ocs 500n6-seriesocs 500n-serIes dow module

ansI/Ieee c37.90, ansI/Ieee c62.41, Iec 60255-1, Iec 61000-4-10, Iec 61000-4-12, Iec 61000-4-18, Ieee 1547

Iec 61000-4-18ansI/Ieee c62.41, en 61000-6-1, en 61000-6-2, en 61543, Iec 60601-1-2, Iec 61000-4-12, Iec 61000-4-4, Iec 61000-4-5, Iec 61008-1, Iec 61009-1, Iec 61326, Iec 61850-3, Itu-t K.20, Itu-t K.21, Itu-t K.45

> 100 khz ring wave & 100 khz/1 mhz damped oscillatory

> conducted immunity and magnetic field test

> Built-in coupling network

> fast damped oscillatory wave 3/10/30 mhz

the ocs 500n6 is used for ring wave testing up to 6 kv, slow damped oscillatory wave testing (100 khz and 1 mhz) up to 3 kv, and optional fast damped oscillatory wave at 3, 10, and 30 mhz. a ring wave is a non-repetitive damped oscillatory transient oc-curring in low-voltage power, control and signal lines supplied by public and non-public networks. damped oscillatory waves

are repetitive transients occurring mainly in power, control and signal cables installed in high-voltage and medium-voltage stations. the ocs 500n6 can also be used to perform magnetic field tests as required in Iec 61000-4-10 using a magnetic field coil such as the ms 100.

the single and three-phase coupling/decoupling networks of the cnI 501/503 x series, are used for coupling eft/Burst and surge pulses on dc-lines or three-phase (4-wire or 5-wire sup-ply lines) mains supply systems for voltages up to 1,000 vdc/ 3 x 690 vac. a particularly interesting series due to the increa-sing demand for testing inverters used in the area of renewable energies (e.g. photovoltaic systems, wind power stations, elec-tric cars).

damped oscIllatory and rIngwave


damped oscillatory as per Iec 61000-4-18

output voltage open-circuit 250 v – 3,000 v +/- 10 %

rise time/oscillation frequency 1/t 75 ns/100 khz and 1 mhz

decaying peak 5 must be > 50 % of peak 1 value

peak 10 must be < 50 % of peak 1 value

source impedance 200 Ω


repetition rate 40/s for 100 khz and 400/s for 1 mhz

direct output at the front panel for ext cdn & magn. field antenna

coupling network 1-phase or 3-phase

damped oscillatory magnetic field

as per Iec 61000-4-10 ms 100 (square 1 m × 1 m) antenna


output voltage open-circuit 250 v – 6,000 v

rise time first peak t1/oscillation frequency 0.5 µs/100 khz

decaying of pk1 to pk2 40 % – 110 %

decaying of pk2 to pk3 & decaying of pk3 to pk4 40 % – 80 %

output impedance 12 Ω, 30 Ω (200 Ω external)

wave shape short-circuit

rise time first peak tr t1 < 1 µs

oscillation frequency 1/t 100 khz


CNI for UCs 500N5 (5,5 kV)

cnI 503a.1 3 x 690 v (ac), 16 a

cnI 503a.2 3 x 690 v (ac), 1000v (dc), 16 a

cnI 503a2.1 3 x 690 v (ac), 32 a

cnI 503a3.1 3 x 690 v (ac), 1000v (dc), 63 a

cnI 503a3.2 3 x 690 v (ac), 63 a

cnI 503a4.2 3 x 690 v (ac), 100 a

cnI 503a4.4 3 x 690 v (ac), 1000v (dc), 100 a

CNI for UCs 500N7 (7 kV)

cnI 503B s1 3 x 690 v (ac), 16 a

cnI 503B s2 3 x 690 v (ac), 32 a

cnI 503B s3 3 x 690 v (ac), 63 a

cnI 503B s4 3 x 690 v (ac), 100 a

cnI 503B 7.4 3 x 690 v (ac), 1000 v (dc), 32 a

cnI 503B 9.3 3 x 690 v (ac), 1000v (dc), 100 a

other models and configurations on

request


CNI for UCs 500N7 (+ / - / pE)

cnI 501B s2 7 kv, 1,000 v (dc), 16 a

cnI 501B s3 7 kv, 1,000 v (dc), 32 a

cnI 501B s4 7 kv, 1,000 v (dc), 63 a

other models and configurations on

request

cnI 50X-serIescombined coupling/decoupling networks for burst and surge

> surge as per ansI/Ieee c62.41 in combination with ucs 500n7

> automatic selection of surge impedance

> fully remote controlled by em test generators


fast damped oscillatory Iec 61000-4-18


rise time voltage waveform 5 ns +/- 30 %

oscillation frequency 3 mhz, 10 mhz, 30 mhz, +/- 10 %

decaying voltage waveform peak 5 must be > 50 % of peak 1

peak 10 must be < 50 % of peak 1

source impedance 50 Ω +/- 20 %


repetition rate max. 5000/s +/- 10 %

Burst duration 50ms +/- 20 %, at 3 mhz

15ms +/- 20 %, at 10 mhz

5ms +/- 20 %, at 30 mhz

Burst period 300 ms +/- 20 %

short circuit current 9a – 88a +/- 20 %

rise time current waveform at 3 mhz: <330 ns

at 10 mhz: <100 ns

at 30 mhz: <33 ns

decaying current waveform peak 5 must be >25 % of peak 1

peak 10 must be <25 % of peak 1

also

avaIlaBle as

1 OR 3-Phase

veRsiOn

uP TO 32 a

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electronic and electrical equipment may be affected by voltage dips, short interruptions and voltage variations of the power supply. dips and interruptions are caused by faults in the net-work or installations or by sudden large changes of load. te-sting for such a phenomena is required in order to ensure that electronic and electrical equipment does not fall into unsafe operation conditions.

power qualIty

simulator for dips, short interruptions and voltage variationspfs 503n-serIes

> true 3-phase voltage dip generator as per Iec 61000-4-11 / -34

> dip mode, line(s) to neutral or line to line

> external variac for star and delta power mains systems

Iec 61000-4-11, Iec 61000-4-29, Iec 60601-1-2:2002, en 61000-6-1, en 61000-6-2 , Iec 61000-4-34


ac voltage l-l max. 3 × 440 v

ac current max. 3 × 32/63/100 a

frequency 50/60 hz

dc voltage max. 250 v

dc current max. 32, 63, 100 a

Inrush current > 500 a (pfs 503n32)

> 1.000 a (pfs 503n63 / pfs 503n100)

short-circuit protected

dip mode line to line

line to neutral

lines to neutral

other models:

pFs 503N32.1 3 x 690 v, 32 a

pFs 503 N63.1 3 x 690 v, 63 a

pFs 503N100.1 3 x 690 v, 100 a

the voltage surge simulators vss 500n generate high-voltage transients as required by several Iec standards. the voltage surge pulses are used to test the isolation (voltage withstand) capability of components, sockets, connectors, cables and many other items. as per safety test requirements the insulation between acces-sible parts or parts connected to them and hazardous live parts must be able to withstand surges due to transients caused, e.g. by thunderstorms and entering the apparatus through the antenna terminal.

voltage surge and safety

surge tester 10 kv for solar panel testing

> 7 load ranges from 10nf to 180nf


Iec 61730-1, Iec 61730-2, Iec 60060, ul 1703


surge as per Iec 60255-5

open-circuit voltage 500 v – 10,000 v

wave shape

front time tr 1.2 µs

time to half value 50 µs

load capacitance ranges 30 nf – 40 nf

40 nf – 50 nf

50 nf – 65 nf

65 nf – 85 nf

85 nf – 110 nf

110 nf – 140 nf

140 nf – 180 nf


output direct hv-banana connector

vss 500n10.3

the cws 500n1 is the most compact single-box test equipment for conducted rf immunity testing as per Iec 61000-4-6 and re-lated standards. as well as 1 khz 80 % am the cws 500n1 also generates 2 hz 80 % am for testing medical appliances and 1 hz pm with 50 % duty cycle required for testing safety equipment such as fire alarms. em test supplies a large range of cdns, em clamps, current injection clamps and calibration accessories.

Bulk current Injection (BcI) is a test procedure for testing the immunity to electrical disturbances from narrowband electro-magnetic energy. the test signal is injected by means of a cur-rent injection probe. In physical terms the current injection probe is a current transformer laid around the wiring harness. Immunity tests are performed varying the level and the fre-quency of the injected test signal. the BcI test method is wide-ly known in the automotive industry as well as in the military/aircraft industry for testing single components of a complex system.


output power 80 w


max. vswr 1 : 1.2 at all phase angles and at max. power

(without destruction)

frequency range 9 khz – 1 ghz (internal signal generator)

frequency range with built-in

amplifier

100 khz – 300mhz


pm 1 – 3,000 hz

duty cycle 10 % – 80 %


preprogrammed modulations amplitude modulation

80 % ±5 %, 1 khz ±10 %

80 % ±5 %, 2 hz, 1 khz

pulse modulation 1 hz, 50 % duty cycle acc. to en 50130-4

other models:

CWs 500N1.1

output power, frequency range 25 w, 100 khz – 250 mhz

CWs 500N1.2



cws 500n1-serIesthe single-box solution for rf-conducted immunity testing the single-box solution for rf-conducted immunity testing

cws 500n2

Iec 61000-4-6, Iec 60601-1-2:2002, en 300340, en 300342- 1, en 300386 v1.3.2, en 301489-1, en 301489-7, en 301489-17, en 301489-24, en 55024, en 50130-4, en 61000-6-1, en 61000-6-2, en 300329, namur ne21

Iec 61000-4-6, en 61000-6-1, en 61000-6-2, Iec 60601-1-2:2002, Iso 11452-4, Iso 11452-5, daimlerchrysler dc-10614, ford es-Xw7t-1a278-aB, ford esXw7t- 1a278-ac, gmw 3097 (2001), gmw 3097 (2004), mBn 10284-2:2002, psa B21 7110, renault 36.00.808/-d, renault 36.00.808/-g, mIl std 461d/cs 114, mIl std 461e/cs 114, rtca/do 160 section 20, fiat 9.90110




max. vswr 1 : 2.0




pm 1 – 3,000 hz



output n-connector




Built-in coupler max. 200 w/1 ghz


amplifier

> rf-conducted immunity testing as per Iec 61000-4-6

> up to 300 mhz test frequency

> self-calibration procedures for cdns and coupling clamps




solutIon for

naMuR ne 21

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3-phase flicker impedance up to 75 aaIf 503n-serIes

> flicker impedance as per Iec 60725

> for flicker analysis as per Iec 61000-3-3

> Built-in Zref and Ztest

Iec 61000-3-3, Iec 61000-3-11, en 61000-3-3, en 61000-3-11, Iec 60725


phase 3-phase

Z ref ra = 0.24 Ω Xa = 0.15 Ω

rn = 0.16 Ω Xn = 0.10 Ω

Z test ra = 0.15 Ω Xa = 0.15 Ω

rn = 0.10 Ω Xn = 0.10 Ω

accuracy Z ref, Z test < 3 %

eut power supply

line voltage 3 × 400 v

line frequency 47 – 63 hz

other models

AIF 503N32 line current: max. 32 a per line



three-phase ac voltage sourcesacs 503n-serIes

> ac power sources for three-phase up to 90 kva

> large inrush current capability

> controlled by dpa 503n and dpa.control software

Iec 61000-3-2, Iec 61000-3-3, Iec 61000-3-11, Iec 61000-3-12, en 61000-3-2, en 61000-3-3, en 61000-3-11, en 61000-3-12, JIs c 61000-3-2


voltage range 0 to 300 v

voltage resolution 0.025 %

output frequency 40 hz to 80 hz

output connector 3-phase cee-connector

frequency resolution 0.02 hz

frequency accuracy, stability 100 ppm

total harmonics distortion thd less than 0.1 %

output voltage stability Better than 0.1 %

output voltage accuracy Better than 0.5 %

other models:

ACs 503N16 3 x 300 v (p-n), 16,000 va

ACs 503N30 3 x 300 v (p-n), 30,000 va

ACs 503N60 3 x 300 v (p-n), 60,000 va

ACs 503N90 3 x 300 v (p-n), 90,000 va

the aIf 503n-series three-phase flicker impedances offer two different impedance values. Z ref is used as the flicker impe-dance as per en/Iec 61000-3-3 and specified by Iec 60725. Z test is used for equipment intended for connection to a public low-voltage distribution system having a service current supply capability of more than 100 a specified in en/Iec 61000-3-11.

the acs 503n-series are three-phase ac sources, specifically designed for harmonics and flicker testing. It meets the cor-responding specifications as per en/Iec 61000-3-2, en/Iec 61000-3-3 and JIs c 61000-3-2 as well as per en/Iec 61000-3-11 and en/Iec 61000-3-12 for measuring duts having a nominal current up to 75 a per phase. the acs 503n-series provides the perfect sinusoidal and stable voltage signal specified to per-form fully compliant harmonics and flicker analysis despite of the mains supply frequency and steadyness of the voltage.


Input channels 2 (1 × current & voltage)

eut connection 1-phase

a/d converter 16 bit

class of instrument class a as per Iec/en 61000-4-7, ed. 2

voltage input 10 – 530 vrms

overload 4,000 v peak

Input range internal 50 a peak – 16 a continuous

Input range external standard delivered model max. 140 a

(factory setting 2 turns 70 a)

harmonic analysis Iec/en 61000-3-2 and Iec/en 61000-3-12,

according to Iec/en 61000-4-7, JIs c 61000-3-2

harmonic range 1 – 50 th harmonic

grouping Interharmonics acc. to Iec/en 61000-4-7, ed. 2

display urms, Irms, Ipeak, upeak, p, q, s, power factor,

thd (u), thd (I), crest factor (u), crest factor (I)

flicker analysis Iec/en 61000-3-3 and Iec/en 61000-3-11,

according to Iec/en 61000-4-15

flicker data pst and plt, vrms, dmax, dc, dt, p 50 % s,

p 10 % s, p 3 % s, p 1 % s, p 0.1 %

flicker impedance: phase | neutral 0.24 Ω + j 0.15 Ω | 0.16 Ω + j 0.10 Ω

dpa 500nsingle-phase power analyser, h&f analyser

Iec 61000-3-2, Iec 61000-3-3, Iec 61000-3-11, Iec 61000-3-12, Iec 61000-4-7, Iec 61000-4-15, Iec 60601-1-2:2002, en 61000-6-1, en 61000-6-2, en 301489-1, en 301489-7, en 301489-17, en 301489-24, en 300386-2, en 61000-3-2, en 61000-3-3, en 61000-3-11, en 61000-3-12, en 61000-4-7, en 61000-4-15, JIs c 61000-3-2

> single-phase harmonics/flicker analyser

> Built-in single-phase flicker impedance

> real-time analysis using internal computer and dsp





class of instrument class a as per Iec/en 61000-4-7 ed.2



current input depends on ct model used

Input range standard delivered model max. 140 a






display urms, Irms, upeak, Ipeak, p, q, s, power factor,




flicker data pst and plt, vrms, dmax, dc, dt, p50%s,

p 10 % s, p 3 % s, p 1 % s, p 0.1 %

dpa 503n3-phase power analyser, h&f analyser

Iec 61000-3-2, Iec 61000-3-3, Iec 61000-3-11, Iec 61000-3-12, Iec 61000-4-7, Iec 61000-4-15, Iec 60601-1-2:2002, en 61000-6-1, en 61000-6-2, en 301489-1, en 301489-7, en 301489-17, en 301489-24, en 300386-2, en 61000-3-2, en 61000-3-3, en 61000-4-7, en 61000-4-15, en 61000-3-11, en 61000-3-12JIs c 61000-3-2

> three-phase harmonics/flicker analyser

> external three-phase flicker impedance aIf 503


harmonics and interharmonics are caused by modern elec-tronic power conditioning modules used to control loads and reduce power consumption. such most commonly non-linear modules are the source of voltage at unwanted frequenci-es superimposed on the supply voltage. voltage fluctuations caused by varying load currents may influence luminance or spectral distribution of lighting systems. the impression of unsteadiness of visual sensation induced by this light sti-mulus is called flicker. flicker also needs to be limited to a

minimum. the dpa 500n is used for single-phase applica-tions and the dpa 503n supports both single and 3-phase applications. acs 500n is a single-phase and the acs 503n a 3-phase ac source, specially designed for harmonics and flicker testing. It meets the corresponding specifications as per Iec/en 61000-3-2 and Iec/en 61000-3-3. It provides the perfect sinusoidal and stable voltage signal specified to give fully compliant har-monics and flicker analyses irrespective of the mains supply frequency and steadiness of the voltage.

harmonIcs & flIcKer

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esd as per Iec 61000-4-2 and Iso 10605




hold-on time > 5 s




r/c parameters 150pf/330 Ω –– 330pf/330 Ω

150pf/2,000 Ω –– 330pf/2,000 Ω

100pf/1,500 Ω –– customized










electrostatic discharges between objects can cause persistent disturbances or even destruction of sensitive electronics or controls. dito is the most advanced esd tester for accurate si-mulation of esd pulses according to the latest standards.It's efficient battery power concept allows users to generate up to 50,000 pulses at maximum test voltage from a single bat-tery. while standard and pre-programmed user test routines make esd testing an easy and comfortable procedure.







hold-on time > 5 s










150 pf/330 Ω

330 pf/330 Ω

150 pf/2,000 Ω

330 pf/2,000 Ω



esd 30n


> ergonomic design

> modular concept

> easy to handle




Iec 61000-4-2, Iso 10605, sae J1113-13, sae J1455, Bmw 600 13.0 (part 2), Bmw gs 5002 (1999), daimlerchrysler dc-10613, daimlerchrysler dc-10614, mercedes av emv, ford es-Xw7t-1a278-ac, gmw 3097, gmw 3097 (2001), gmw 3100, gmw 3100 (2001), mazda mes pw 67600, mitsubishi es-X82010, nissan 28401 nds 02, porsche, psa B21 7110, renault 36.00.808/-d, renault 36.00.808/-e, renault 36.00.808/-f, smart de1005B, vw tl 824 66, mBn 10284-2:2002, renault 36.00.808/-g


sImulatIon of ac and dc supply anomalIesnetwave is an ac/dc power source, specifically designed to meet the requirements as per Iec/en 61000-4-13, Iec/en 61000-4-14, Iec/en 61000-4-17, Iec/en 61000-4-28. Its output power with low distortion and high stability, even if supplying dynamic loads, guarantees full compliant measure-

multifunction ac/dc power sourcenetwave-serIes sIngle phase

> wide power bandwidth; dc – 5 khz

> high inrush current capability

> Built-in arbitrary waveform generator, 16 Bit

Iec 61000-4-13, Iec 61000-4-14, Iec 61000-4-17, Iec 61000-4-27, Iec 61000-4-28, Iec 61000-4-29, Iec 61000-3-2, Iec 61000-3-3, Iec 61000-3-11, Iec 61000-3-12, JIs c 61000-3-2, mIl-std 704, rtca/do 160 section 16, airbus, Boeing

ments for harmonics and flicker as per Iec/en 61000-3-2, JIs c 61000-3-2 and Iec/en 61000-3-3 as well as per Iec/en 61000-3-11 and Iec/en 61000-3-12. the three-phase netwave models additionally support testing as per Iec/en 61000-4-27.

netwave-serIes three phasemultifunction ac/dc power source

Technical DaTa - sinGle Phase

output voltage

netwave 3, netwave 7 0 v – 300 vac (p-n); 0 v – ± 425 vdc

netwave 7.2 0 v – 360 vac (p-n); 0 v – ± 500 vdc

output power

netwave 3 ac mode: 3,500 va, dc mode: 4,500 w

netwave 7, netwave 7.2 ac mode: 7,500 va, dc mode: 9,000 w

output current

netwave 3 12 a (rms) continuous

21 a (rms) short-term (max. 3 s)

100 a repetitive peak

netwave 7, netwave 7.2 26 a (rms) continuous



output frequency dc – 5,000 hz




total harmonic distortion (thd) less than 0.5 %

dc offset in ac mode < 20 mv with linear load

slew rate 8 v / µs

Technical DaTa - ThRee Phase

output voltage

netwave 20, netwave 30,

netwave 60

0 v – 3*300 vac (p-n); 0 v – ± 425 vdc

netwave 20.1, netwave 30.1,

netwave 60.1

0 v – 3*360 vac (p-n); 0 v – ± 500 vdc

output power

netwave 20.x 22,500 va ac, 27,000 w dc



output current

netwave 20.x 26 a (rms) continuous













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24

telecom

OveRview

Application power mains simulation

Transients Conducted Immunity

radiated Immunity

Harmonics & Flicker


products ucs 500nxpfs 503n-seriesvds 200n-series

ucs 500nxvcs 500nxtss 500nxeft 500n-seriesucs 200nvss 500n10

cws 500n1-seriescws 500n2

ucs 500nx dpa 500nacs 500n netwave-seriessingle phasenetwave-seriesthree phase

ditoesd 30n

standards Itu K …etsI

Itu K …etsIBellcorefcc part 68

Itu K … etsI

Itu K …etsI

Itu K …etsI

Itu K …etsIBellcore

the ucs 500n5/ucs 500n7 ultra compact simulators are the most versatile testers for covering transient and power-fail re-quirements according to international (basic and generic) and product family standards with voltage capability of up to 7 kv. In addition to the Iec 61000-4-5 standard for surge testing, they also complies to ansI/Ieee c62.41 requirements for surge and ring wave testing.




rise time tr 5 ns













100, 300 and 1,000 a/m with mc26100




transIents, radIated ImmunItyand power maIns sImulatIon

ucs 500n5compact tester for eft/burst, surge and power fail



> Iec 61000-4-4/-5/-8/-9/-11/-29


Technical DaTa



rise time tr 5 ns













100, 300 and 1,000 a/m with mc26100






ucs 500n7






the ucs 500n7 is the most economical test solution for fully compliant immunity tests and ce marking. a built-in cdn is used for testing single-phase euts up to 400 v/16 a, while tests on three-phase euts can be performed by adding an au-tomatically controlled external coupling network up to 690 v with max. 100 a.em test supplies a large range of accessories for various ap-plications.

Tele

com

Tele

com

27





wave shape as per Iec 60469-1

rise time tr 1.0 µs

pulse duration 50 µs

short-circuit current 125 a – 5,000 a






coupling network external option

VCs 500N12 500 v – 12,000 v / 6,000 a

surge pulses occur due to direct or indirect lightning strikes to an external (outdoor) circuit. this leads to currents or elec-tromagnetic fields causing high-voltage or current transients. another source of surge pulses is switching transients origi-nating from switching disturbances and system faults. due to

the characteristic of the phenomenon almost every electrical and electronic device is affected by such lightning events. sur-ge tests should therefore be widely performed. surge voltages can reach several thousands of volts while surge currents re-ach levels of several thousands of amps.













coupling network l – n with Z = 2 Ω

l-pe, n-pe, l+n-pe; Z = 12 Ω

em.safe current limiter function

transIents

ucs 500n5vsurge tester 5.0 kv surge tester 8 kv

vcs 500n8

Iec 61000-4-5, Iec 61000-4-9, en 300329, en 300340, en 300342-1, en 300386 v1.3.2, en 300386-2, en 301489-1, en 301489-7, en 301489-17, en 301489-24, en 55024, Itu-t K.20, Itu-t K.41, Itu-t K.45

Iec 61000-4-5, Iec 61000-4-9, en 300329, en 300340, en 300342-1, en 300386 v1.3.2, en 300386-2, en 301489-1, en 301489-7, en 301489-17, en 301489-24, en 55024, Itu-t K.20, Itu-t K.21, Itu-t K.41, Itu-t K.45















> 5.0 kv/2.5 ka surge, Iec 61000-4-5/-9

> preprogrammed standard test routines included


> testing beyond the limits, 8 kv/4 ka, Iec 61000-4-5/-9


> Built-in single or 3-phase cdn

vcs 500n10surge tester up to 10 kv surge & telecom tester 7 kv

vcs 500n7t

> Iec 61000-4-5, Itu

> 7.0 kv/3.5 ka surge & 7.0 kv telecom surge 10 µs/700 µs







rise time tr 1,0 µs










telecom surge 250 v – 7,000 v

front time 10 µs


short-circuit current 6.0 – 175 a

rise time tr 4 µs


VCs 500N10T 500 v – 10.000 v

> still compact in size but up to 10 kv/5 ka, Iec 61000-4-5/-9


> external cdns for power mains and I/o line applications


also

avaIlaBle as

vcs 500n10T

wIth 10 kv

also

avaIlaBle as

vcs 500n12

wIth 12 kv

Tele

com

Tele

com

29


28

telecommunication networks are exposed to lightning events. therefore telecommunication equipment connected to the out-side world needs to have appropriate protection that demons-trates an acceptable level of immunity to surge transients. this would prevent failure during lightning events. telecom surge simulators of the tss 500 series are used to test the immunity of telecommunication equipment.



telecom surge as per Itu K …

wave shape

front time tf 1.2 µs

duration td 50 µs

wave shape open-circuit

front time tf 10 µs

duration td 700 µs

wave shape short-circuit current 4 – 100 a

rise time tr 4 µs

duration td 300 µs

surge B as per fcc part 68


front time tf 9 µs

duration td 720 µs


rise time tr 5 µs

duration td 320 µs

transIents

tss 500n4telecom surge tester 4 kv telecom surge tester 10 kv

tss 500n10

fcc 97-270 (part 68), Iec 61000-4-5, Itu-t K.17, Itu-t K.20, Itu-t K.21, Itu-t K.28, Itu-t K.45, Iec 60950-1

fcc 97-270 (part 68), Iec 61000-4-5, Itu-t K.17, Itu-t K.20, Itu-t K.21, Itu-t K.28, Itu-t K.45, en 60950-1




wave shape


duration td 50 µs



duration td 700 µs

wave shape short-circuit current 12.5 – 250 a

rise time tr 4 µs

duration td 300 µs



front time tf 9 µs

duration td 720 µs


rise time tr 5 µs

duration td 320 µs

> compact telecom surge generator as per Itu

> Built-in 1.2/50 µs & 10/700 µs transients

> Built-in coupling network; 4 × 100 Ω and 2 × 25 Ω

> extra-high voltage telecom surge generator as per Itu

> up to 10 kv peak voltage



first level lightning 2,000 v/1,000 a

rise time tr 10 µs

duration td 250 µs

second level lightning 4,000 v/2,000 a

rise time tr 10 µs

duration td 250 µs

first level lightning surge 3,000 v/2,000 a

rise time tr 10 µs

duration td 250 µs

high exposure premises 4,000 v/4 × 500 a

rise time tr 10 µs

duration td 250 µs

4 wire application 4 × 500 a for t, r, t1, r1

tss 500n4Btelecom surge tester telecom surge tester

tss 500n6B

> compact telecom surge generator as per gr 1089

> all 10/360 µs, 10/1,000 µs and 2/10 µs included

> Built-in resistors and coupling network

Bellcore gr-1089-core, Itu-t K.12, Itu-t K.28, Itu-t K.45Bellcore gr-1089-core


first-level lightning

pulse 10/1,000 µs with 6 Ω 1,000 v & 167 a per conductor

rise time tr/pulse duration td 10 µs/1,000 µs

pulse 10/360 µs with 10 Ω 1,000 v & 100 a per conductor

rise time tr/pulse duration td 10 µs/360 µs







Intra-building lightning





second-level lightning



cnB 500 optional coupler for 12 pairs

> high-power telecom surge generator as per gr 1089

> 10/250 µs for open-circuit voltage and short-circuit current

> up to 4 kv peak voltage and 2 ka peak current

Tele

com

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30

telecom surge tester telecom surge generator for surge a pulses as per fcc part 68tss 500n2B tss 500n2f

Bellcore gr-1089-core fcc 97-270 (part 68)




4 wire application t, r, t1, r1


ac power port surge 160 v – 2,500 v

rise time tr < 2.0 µs

pulse duration > 10 µs

short-circuit current > 1,000 a

rise time tr < 2.0 µs


coupling network l to n, l to pe, n to pe; Zi = 2.5 Ω

metallic surge max. 1,000 v

rise time tr < 10 µs


short-circuit current min. 100 a per conductor



longitudinal surge max. 1,500 v



short-circuit current min. 200 a per conductor



> high-power telecom surge generator as per gr 1089

> 10/1,000 µs for open-circuit voltage and short-circuit current

> up to 2 kv peak voltage and 200 a per wire peak current

> compact telecom surge generator as per fcc part 68

> Built-in 10/160 µs & 10/560 µs transients

> Built-in resistors and coupling network






hold-on time > 5 s




r/c parameters 150 pf/330 Ω –– 330 pf/330 Ω

150 pf/2,000 Ω –– 330 pf/2,000 Ω

100 pf/1,500 Ω –– customized










electrostatic discharges between objects can cause persistent disturbances or even destruction of sensitive electronics or controls. dito is the most advanced esd tester for accurate si-mulation of esd pulses according to the latest standards.Its efficient battery power concept allows users to generate up to 50,000 pulses at maximum test voltage from a single bat-tery, while standard and pre-programmed user test routines make esd testing an easy and comfortable procedure.







hold-on time > 5 s










150 pf/330 Ω

330 pf/330 Ω

150 pf/2,000 Ω

330 pf/2,000 Ω



esd 30n


> ergonomic design

> modular concept

> easy to handle






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the cws 500n1 is the most compact single-box test equipment for conducted rf immunity testing as per Iec 61000-4-6 and related standards. as well as 1 khz 80 % am, the cws 500n1 also generates 2 hz 80 % am to test medical appliances, and 1 hz pm with 50 % duty cycle required to test safety equipment such as fire alarms. em test supplies a large range of cdns, em clamps, current injection clamps and calibration accessories.

Bulk current Injection (BcI) is a test procedure to test the immunity to electrical disturbances from narrowband electro-magnetic energy. the test signal is injected by means of a cur-rent injection probe. In physical terms the current injection probe is a current transformer laid around the wiring harness. Immunity tests are performed varying the level and the fre-quency of the injected test signal. the BcI test method is widely known in the automotive industry as well as in the military/air-craft industry to test single components of a complex system.







frequency range with built-in

amplifier

100 khz – 300mhz


pm 1 – 3,000 hz




80 % ±5 %, 1 khz ±10 %

80 % ±5 %, 2 hz, 1 khz

pulse modulation 1 hz, 50% duty cycle acc. to en 50130-4

other models:

CWs 500N1.1


CWs 500N1.2



cws 500n1-serIesthe single-box solution for rf-conducted immunity testing the single-box solution for rf-conducted immunity testing

cws 500n2






max. vswr 1 : 2.0



modulation am 1 - 3,000 hz, 1 - 99 % depth

pm 1 – 3,000 hz



output n-connector




Built-in coupler max. 200 w/1 ghz


amplifier



















harmonic range 1 – 50th harmonic






flicker data pst and plt, vrms, dmax, dc, dt, p50 %s,

p10 %s, p3 %s, p1 %s, p0.1 %


harmonics and interharmonics are caused by modern elec-tronic power conditioning modules used to control loads and reduce power consumption. such most commonly non-linear modules are the source of voltage at unwanted frequencies su-perimposed on the supply voltage. voltage fluctuations caused by varying load currents may influence luminance or spectral distribution of lighting systems. the impression of unsteadi-ness of visual sensation induced by this light stimulus is called flicker. flicker also needs to be limited to a minimum. the dpa

500n is used for single-phase applications and the dpa 503n supports both single and 3-phase applications. acs 500n is a single-phase and the acs 503n a 3-phase ac source, specially designed for harmonics and flicker testing. It meets the corresponding specifications as per Iec/en 61000-3-2 and Iec/en 61000-3-3. It provides the perfect sinusoidal and stable voltage signal specified to give fully compliant har-monics and flicker analyses irrespective of the mains supply frequency and steadiness of the voltage.

harmonIcs & flIcKer

dpa 500nsingle-phase power analyser, h&f analyser single-phase ac voltage source up to 6 kva

acs 500n6





> ac power source up to 300 v/20 a single phase



Iec 61000-3-2, Iec 61000-3-3, en 61000-3-2, en 61000-3-3, JIs c 61000-3-2


ACs 500N6




output power 6,000 va

output safety banana-connector

ACs 500N3





output safety banana-connector

solutIon for

naMuR ne 21

also

avaIlaBle as

acs 500n3

3,000 va

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power maIns sImulatIon


> true 3-phase voltage dip generator as per Iec 61000-4-11







frequency 50/60 hz

ac voltage l-n max. 250 v

ac current max. 32, 63, 100 a

frequency 50/60 hz



Inrush current > 500 a (pfs 503n32)

> 1.000 a (pfs 503n63 / pfs 503n100)



line to neutral

lines to neutral

other models:

pFs 503N32 3 x 440 v, 32 a

pFs 503N63 3 x 440 v, 63 a

pFs 503N100 3 x 440 v, 100 a









output voltage


netwave 60

0 v – 3*300 vac (p-n); 0 v – ± 425 vdc


netwave 60.1

0 v – 3*360 vac (p-n); 0 v – ± 500 vdc

output power




output current





66 a (rms) short-term (max. 3s )






output voltage



output power



output current




netwave 7, netwave 7.2 26 a (rms) continuous









slew rate 8 v/µs





multifunction ac/dc power sourcenetwave-serIes three phase

the voltage surge simulator vss 500n10 generates high-voltage transients as required by Iec 60065 and ul 6500 standards for safety tests on audio, video and similar electronic apparatus.


voltage surge simulationvss 500n10

> testing equipment safety up to 10 kv

> special pulse-shaping network




rise time tr < 100 ns

pulse duration > 2 ms

Internal resistor 1,000 Ω

polarity positive

Iec 60065, ul 6500, Iec 60950

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the vds 200n series is used to simulate the various battery supply waveforms recommended by international standards and car manufacturer standards. the wide range of manufac-turer requirements make this an extremely important area, which is covered by the vds 200n series.additionally, the vds 200n series serves as a powerful dc voltage supply for the dut during tests with automotive tran-sients.


voltage range 0 v – 60 v with 0.1 v steps

VDs 200N10 I = 0 a – 10 a cont., 15 a peak

VDs 200N15 I = 0 a – 15 a cont.




VDs 200N150 I = 0 a – 150 a cont.

VDs 200N200 I = 0 a – 200 a cont.

VDs 200N200.1 I = 0 a – 200 a cont., 1,000 a for 500 ms

VDs 200N30.1 range I: -5 v ± 30 v

I = 50 a cont., 150 a for 200 ms


I = 30 a cont., 90 a for 200 ms

VDs 200N50.1 range I: -5 v ± 30 v

I = 85 a cont., 220 a for 200 ms


I = 50 a cont., 150 a for 200 ms

preprogrammed pulses 2b, 4, sinewave, sinewave sweep, etc.

source impedance Zq = < 10 mΩ

BatterysImulatIon

vds 200n-serIesBattery supply simulator and dc voltage source

Iso 7637-2, Iso 16750, manufacturer specifications

> stand-alone, programmable dc source


> 60 v/15 a up to 200 a (2,000 a inrush current)

the ucs 200n ultra compact simulator for automotive transi-ents unites the capabilities of an eft/burst simulator, a micro-pulse simulator and the required coupling network in one box. the ucs 200n can be equipped to meet all international and car manufacturer specifications from around the globe. the coupling network can carry currents up to 200 a depending on the model. for non-standard tests the waveform parameters of the micropulse generator can be varied over a wide range. the built-in coupling network can be used and controlled by any unit of the ld 200n series, vds 200n series and pfs 200n series.


pulse 3a/3b as per Iso 7637-2


rise time 5 ns

pulse duration 150 ns

ri 50 Ω

3a > negative, 3b > positive

micropulses as per Iso 7637-2


pulses 1, 1a, 2a and 6

ri 2, 4, 10, 20, 30, 50, 90 Ω

output coaxial connector 50 Ω

additional standard test routines sae J1455 inductive & mutual

nIssan B2, c8, c50, c300

Jaso a2, B2, d2

freestyle


rise time tr 1 µs – 10 µs

duration td 50 µs – 10,000 µs

ri 2 – 450 Ω

dut supply voltage 60 v

dut current (nominal) 50 a, 100 a, 150 a and 200 a

transIents

ucs 200n-serIesultra compact simulator for automotive transients for pulses 1, 1a, 2a, 3a/3b and 6

Iso 7637-2, Iso 7637-3, sae J1113, Jaso d001, manufacturer specifications

> test pulses acc. to Iso, Jaso, nIssan, sae


> freestyle pulse shape generation

eft 500n5-serIes/ucs500n5e electronic-fast-transient simulator

eft 500n8electronic-fast-transient simulator


ucs 500n5e


wave shape into a 50 Ω load 100 v – 2,750 v

rise time tr 5 ns


wave shape into a 1,000 Ω load 200 v – 4,800 v

rise time tr 5 ns

pulse duration td 35 ns – 150 ns



output 50 Ω coaxial connector to connect external coupler

coupling network to l, n, pe all combinations

verification

coaxial output wave shape on 50 Ω and 1,000 Ω

cdn output wave shape 5/50 ns on 50 Ω during common

mode coupling

dut power mains supply ac 250 v/16 a, 50/60 hz; dc 250 v/10 a

other models:

EFT 500N5.1 3-phase couplingnetwork, 3 x 440 v ac/32 a





open-circuit 1,000 v – 7,000 v


rise time tr 5 ns


wave shape into a 1,000 Ω load 1,000 v – 7,000 v

rise time tr 5 ns






verification



mode coupling



Iec 61000-4-4 ed.2 (2004), Iec 61000-4-4 amd.1 ed.2 (2010),en 61000-4-4:2005-07

> fast-transient simulator as per Iec 61000-4-4, ed. 2

> output voltage 7 kv, spike frequency up to 1 mhz




> output voltage 5,5 kv, spike frequency up to 1 mhz


ucs 500n5e/eft 500n5 – an eft/burst generator – is an in-telligent solution offering exactly what you need for full-compli-ance immunity tests for electrical/fast transient phenomena. the distinct operation features, convenient dut connection fa-cilities, a clearly arranged menu structure and display concept as well as the preprogrammed standard test routines make te-sting easy, reliable and safe. extendable with a variety of test accessories the eft 500nx is a universal device for a broad range of tests, including three-phase applications up to 100 a.

transIents

alsO

available as

eFT 500n8.1

3 x 440 v ac/32 a

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IndustrymedIcalresIdentIalBroadcast

OveRview

Application Transients Conducted Immunity

radiated Immunity

power mainssimulation


Harmonics &Flicker

products ucs 500nxeft 500n-seriesvcs 500nxocs 500n-seriestss 500nx

cws 500n1-seriescws 500n2cws 500n4

ucs 500nxocs 500n-series

pfs 503n-seriesucs 500nxnetwave-seriessingle phasenetwave series three phase

ditoesd 30n

dpa 500nacs 500ndpa 503nacs 503n-seriesaIf 503n-series

standards Iec 61000-4-4Iec 61000-4-5Iec 61000-4-12Iec 61000-4-18

Iec 60601-1-2Iec 61000-4-6Iec 61000-4-16

Iec 61000-4-8Iec 61000-4-9Iec 61000-4-10

Iec 61000-4-11Iec 61000-4-13Iec 61000-4-14Iec 61000-4-27Iec 61000-4-28Iec 61000-4-29

Iec 61000-4-2 Iec 61000-3-2Iec 61000-3-3Iec 61000-3-11Iec 61000-3-12JIs c 61000-3-2

the ucs 500n5/ucs 500n7 ultra compact simulators are the most versatile testers for covering transient and power-fail re-quirements according to international (basic and generic) and product family standards, with voltage capability of up to 7 kv. In addition to the Iec 61000-4-5 standard for surge testing, they also comply to ansI/Ieee c62.41 requirements for surge and ring wave testing.




rise time tr 5 ns













100, 300 and 1,000 a/m with mc26100




transIents




> Iec 61000-4-4/-5/-8/-9/-11/-29


Technical DaTa



rise time tr 5 ns













100, 300 and 1,000 a/m with mc26100






ucs 500n7






the ucs 500n7 is the most economical test solution for fullycompliant immunity tests and ce marking. a built-in cdn is used for testing single-phase euts up to 400 v/16 a, while tests on three-phase euts can be performed by adding an au-tomatically controlled external coupling network up to 690 v with max. 100 a.em test supplies a large range of accessories for various ap-plications.


41

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ucs 500n5e /eft 500n5 – an eft/burst generator – is an intel-ligent solution offering exactly what you need for full-compli-ance immunity tests for electrical/fast transient phenomena. the distinct operation features, convenient dut connection fa-cilities, a clearly arranged menu structure and display concept as well as the preprogrammed standard test routines make te-sting easy, reliable and safe. extendable with a variety of test accessories the eft 500nx is a universal device for a broad range of tests, including three-phase applications up to 100 a.

transIents

eft 500n8




open-circuit 1,000 v – 7,000 v


rise time tr 5 ns


wave shape into a 1,000 Ω load 1,000 v – 7,000 v

rise time tr 5 ns






verification



mode coupling




> output voltage 7 kv, spike frequency up to 1 mhz


surge pulses occur due to direct or indirect lightning strikes to an external (outdoor) circuit. this leads to currents or elec-tromagnetic fields causing high-voltage or current transients. another source of surge pulses is switching transients origi-nating from switching disturbances and system faults. due to the characteristic of the phenomenon almost every electrical and electronic device is affected by such lightning events. sur-ge tests should therefore be widely performed. surge voltages can reach several thousands of volts while surge currents re-ach levels of several thousands of amps.

transIents

vcs 500n8



















electronic-fast-transient simulator surge tester 8 kveft 500n5-serIes/ucs500n5e electronic-fast-transient simulator


ucs 500n5e



rise time tr 5 ns


wave shape into a 1,000 Ω load 200 v – 4,800 v

rise time tr 5 ns






verification



mode coupling


other models:






> output voltage 5,5 kv, spike frequency up to 1 mhz


















> 5.0 kv/2.5 ka surge, Iec 61000-4-5/-9



ucs 500n5vsurge tester 5.0 kv

alsO

available as

eFT 500n8.1

3 x 440 v ac/32 a

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transIents




wave shape




wave shape






VCs 500N12 500 v – 12,000 v / 6,000 a

vcs 500n10surge tester up to 10 kv surge & telecom tester 7 kv

vcs 500n7t

> Iec 61000-4-5, Itu







wave shape




wave shape








front time 10 µs



rise time tr 4 µs


VCs 500N10T 500 v – 10,000 v / 5,000 a







telecommunication networks are exposed to lightning events. therefore telecommunication equipment connected to the out-side world need to have appropriate protection that demons-trates an acceptable level of immunity to surge transients. this would prevent failure during lightning events. telecom surge simulators of the tss 500 series are used to test the immunity of telecommunication equipment.




wave shape


duration td 50 µs



duration td 700 µs


rise time tr 4 µs

duration td 300 µs



front time tf 9 µs

duration td 720 µs


rise time tr 5 µs

duration td 320 µs

transIents


tss 500n10


fcc 97-270 (part 68), Iec 61000-4-5, Itu-t K.17, Itu-t K.20, Itu-t K.21, Itu-t K.28, Itu-t K.45, en 60950-1




wave shape


duration td 50 µs



duration td 700 µs


rise time tr 4 µs

duration td 300 µs



front time tf 9 µs

duration td 720 µs


rise time tr 5 µs

duration td 320 µs







also

avaIlaBle as

vcs 500n10T

wIth 10 kv

also

avaIlaBle as

vcs 500n12

wIth 12 kv

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compact tester for ring wave and damped oscillatory wavesocs 500n-serIes





transIents























Bulk current Injection (BcI) is a test procedure for testing the immunity to electrical disturbances caused by narrowband electromagnetic energy. the test signal is injected by means of a current injection probe. In physical terms the current in-jection probe is a current transformer laid around the wiring harness. Immunity tests are performed varying the level and the frequency of the injected test signal. the BcI test method is widely known in the automotive industry as well as in the military/aircraft industry for testing single components of a complex system.

the single-box solution for rf-conducted immunity testingcws 500n2





max. vswr 1 : 2.0




pm 1 – 3,000 hz



output n-connector






amplifier




the cws 500n1 is the most compact single-box test equipment for conducted rf immunity testing as per Iec 61000-4-6 and related standards. as well as 1 khz 80 % am, the cws 500n1 also generates 2 hz 80 % am for testing medical appliances, and 1 hz pm with 50 % duty cycle required for testing safety equipment such as fire alarms. em test supplies a large range of cdns, em clamps, current injection clamps and calibration accessories.








frequency range with build-in

amplifier

100 khz – 300 mhz


pm 1 – 3,000 hz




80 % < ± 5 %, 1 khz < ± 10 %

80 % < ± 5 %, 2 hz, 1 khz

pulse modulation 1 hz, 50 % duty cycle acc. to en 50130-4

other models

CWs 500N1.1


CWs 500N1.2

output power, freuqency range 50 w, 10 khz –230 mhz

cws 500n1-serIesthe single-box solution for rf-conducted immunity testing





fast damped oscillatory wave option for ocs 500n6dow module

Iec 61000-4-18












Burst duration 50 ms +/- 20 %, at 3 mhz

15 ms +/- 20 %, at 10 mhz

5 ms +/- 20 %, at 30 mhz


short circuit current 9a – 88 a +/- 20 %

rise time current waveform at 3 mhz: < 330 ns

at 10 mhz: < 100 ns

at 30 mhz: < 33 ns

decaying current waveformpeak 5 must be > 25 % of peak 1


the ocs 500n6 is used for ring wave testing up to 6 kv, slow damped oscillatory wave testing (100 khz and 1 mhz) up to 3 kv, and optional fast damped oscillatory wave at 3, 10, and 30 mhz. a ring wave is a non-repetitive damped oscillatory transient occurring in low-voltage power, control and signal lines supplied by public and non-public networks. damped

oscillatory waves are repetitive transients occurring mainly in power, control and signal cables installed in high-voltage and medium-voltage stations. the ocs 500n6 can also be used to perform magnetic field tests as required in Iec 61000-4-10 using a magnetic field coil such as the ms 100.

solutIon for

naMuR ne 21

also

avaIlaBle as

1 OR 3-Phase

veRsiOn

uP TO 32 a

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power maIns sImulatIon


> true 3-phase voltage dip generator as per Iec 61000-4-11/-34







frequency 50/60 hz

ac voltage l-n max. 250 v

ac current max. 32, 63, 100 a

frequency 50/60 hz



Inrush current > 500a (pfs 503n32)

> 1.000a (pfs 503n63 / pfs 503n100)



line to neutral

lines to neutral

other models:

pFs 503N32.1 3 x 690 v, 32 a

pFs 503N63.1 3 x 690 v, 63 a

pFs 503N100.1 3 x 690 v, 100 a








the cws 500n4 is the state-of-the-art solution in a compact one-box design to test for immunity to conducted, common mode disturbances in the frequency range 0 hz (dc) to 150 khz. such test requirements are specified in Iec 61000-4-16 and co-ver continuous mode testing as well as short term testing with dc, 16 2/3 hz, 50 hz and 60 hz plus a sweep mode from 15 hz to 150 khz. complemented by an ac voltage source or a motor variac, the cws 500n4 forms a complete test system allowing the coupling of the disturbance signals onto the various types of lines by means of specified coupling networks.

compact simulator for conducted common-mode immunity testingcws 500n4

Iec 60533, Iec 61000-4-16, Iec 61326, Iec 61543, Iec 61850-3, Iec 60255-22-7, Iec/en 60870-5, en 50121-4


signal level continuous 0.1 – 35 v rms or dc

test levels short-term 1 – 330 v rms or dc

test frequencies dc, 16 2/3 hz, 50 hz and 60 hz

frequency range 15 hz - 165 khz (sweep mode)

generator impedance 50 Ω, guaranteed also under short-circuit

conditions

Build-in voltmeter rms measurement

Build-in rectifier for dc testing with mv 2606n2.2

Build-in semi conductor power switch

fall/rise time between 1 µs – 5 µs

> compact simulator as per Iec 61000-4-16

> dc to 150 Khz







output voltage



output power



output current




netwave 7, netwave 7.226 a (rms) continuous









slew rate 8 v/µs


output voltage


netwave 60

0 v – 3*300 vac (p-n); 0 v – ± 425 vdc


netwave 60.1

0 v – 3*360 vac (p-n); 0 v – ± 500 vdc

output power


netwave 30.x 30,000 va ac, 36,000w dc


output current











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48













harmonic range 1 – 50th harmonic



thd(u), thd(I), crest factor(u), crest factor(I)




p10%s, p3%s, p1 % s, p 0.1 %

















thd(u), thd(I), crest factor(u), crest factor(I)




p 10 % s, p 3 % s, p 1 % s, p 0.1 %


harmonics and interharmonics are caused by modern elec-tronic power conditioning modules used to control loads and reduce power consumption. such most commonly non-linear modules are the source of voltage at unwanted frequencies su-perimposed on the supply voltage. voltage fluctuations caused by varying load currents may influence luminance or spectral distribution of lighting systems. the impression of unsteadi-ness of visual sensation induced by this light stimulus is called flicker. flicker also needs to be limited to a minimum. the dpa

500n is used for single-phase applications and the dpa 503n supports both single and 3-phase applications.acs 500n is a single-phase and the acs 503n a 3-phase ac source, specially designed for harmonics and flicker testing. It meets the corresponding specifications as per Iec/en 61000-3-2 and Iec/en 61000-3-3. It provides the perfect sinusoidal and stable voltage signal specified to give fully compliant har-monics and flicker analyses irrespective of the mains supply frequency and steadiness of the voltage.

harmonIcs & flIcKer

dpa 500nsingle-phase power analyser, h&f analyser single-phase ac voltage source up to 6 kva

acs 500n6





> ac power source up to 300 v/20 a single phase



Iec 61000-3-2, Iec 61000-3-3, en 61000-3-2, en 61000-3-3, JIs c 61000-3-2


ACs 500N6





output connector safety banana-plug

ACs 500N3





output connector safety banana-plug






hold-on time > 5 s





150 pf/2,000 Ω –– 330 pf/2,000 Ω











electrostatic discharges between objects can cause persistent disturbances or even destruction of sensitive electronics or controls. dito is the most advanced esd tester for accurate si-mulation of esd pulses according to the latest standards.Its efficient battery power concept allows users to generate up to 50,000 pulses at maximum test voltage from a single batte-ry, while standard and preprogrammed user test routines make esd testing an easy and comfortable procedure.







hold-on time > 5 s










150 pf/330 Ω

330 pf/330 Ω

150 pf/2,000 Ω

330 pf/2,000 Ω



esd 30n


> ergonomic design

> modular concept

> easy to handle




Iec 61000-4-2, Iso 10605, sae J1113-13, sae J1455, Bmw 600 13.0 (part 2), Bmw gs 5002 (1999), daimlerchrysler dc-10613, daimlerchrysler dc-10614, mercedes av emv, ford es-Xw7t-1a278-ac, gmw 3097, gmw 3097 (2001), gmw 3100, gmw 3100 (2001), mazda mes pw 67600, mitsubishi es-X82010, nissan 28401 nds 02, porsche, psa B21 7110, renault 36.00.808/-d, renault 36.00.808/-e, renault 36.00.808/-f, smart de1005B, vw tl 824 66, mBn 10284-2:2002, renault 36.00.808/-g


also

avaIlaBle as

acs 500n3

3,000 va

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51


phase 3-phase

Z ref ra = 0.24 Ω Xa = 0.15 Ω

rn = 0.16 Ω Xn = 0.10 Ω

Z test not available

accuracy Zref, Ztest < 3 %

eut power supply


line current 16 a per phase max.


aIf 503n163-phase flicker impedance 16 a 3-phase flicker impedance up to 75 a

aIf 503n-serIes

Iec 61000-3-3, Iec 61000-3-11, en 61000-3-3, en 61000-3-11, Iec 60725


> for flicker analysis as per Iec 61000-3-3

> for 3-phase euts up to 16 a nominal current


> for flicker analysis as per Iec 61000-3-3/-11

> Built-in Zref and Ztest

Iec 61000-3-3, Iec 61000-3-11, en 61000-3-3, en 61000-3-11, Iec 60725


phase 3-phase

Z ref ra = 0.24 Ω Xa = 0.15 Ω

rn = 0.16 Ω Xn = 0.10 Ω

Z test ra = 0.15 Ω Xa = 0.15 Ω

rn = 0.10 Ω Xn = 0.10 Ω

accuracy Z ref, Z test < 3 %

eut power supply



other models








class of instrument class a as per Iec/en 61000-4-7 ed.2



current input depends on ct model used

Input range standard delivered model max. 140 a






display urms, Irms, upeak, Ipeak, p, q, s, power factor,





p 10 % s, p 3 % s, p 1 % s, p 0.1 %

dpa 503n3-phase power analyser, h&f analyser three-phase ac voltage sources

acs 503n-serIes

Iec 61000-3-2, Iec 61000-3-3, Iec 61000-3-11, Iec 61000-3-12, Iec 61000-4-7, Iec 61000-4-15, Iec 60601-1-2:2002, en 61000-6-1, en 61000-6-2, en 301489-1, en 301489-7, en 301489-17, en 301489-24, en 300386-2, en 61000-3-2, en 61000-3-3, en 61000-4-7, en 61000-4-15, en 61000-3-11, en 61000-3-12JIs c 61000-3-2

> three-phase harmonics/flicker analyser

> external three-phase flicker impedance aIf 503


> ac power sources for three-phase up to 90 kva



Iec 61000-3-2, Iec 61000-3-3, Iec 61000-3-11, Iec 61000-3-12, en 61000-3-2, en 61000-3-3, en 61000-3-11, en 61000-3-12, JIs c 61000-3-2





output connector 3-phase cee-connector

frequency resolution 0.02 hz


total harmonics distortion thd less than 0.1 %



other models:

ACs 503N16 3 x 300 v (p-n), 16,000 va

ACs 503N30 3 x 300 v (p-n), 30,000 va

ACs 503N60 3 x 300 v (p-n), 60,000 va

ACs 503N90 3 x 300 v (p-n), 90,000 va

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components & safety

OveRview

Application surge Telecom surge

oscillatory Current surge

Voltage surge

safety

products ucs 500nxvcs 500nxvss 500nx

tss 500nxtss 500n6B

ocs 500n-seriesdow module

css 500n2css 500n10

vss 500n10.2vss 500n12-seriesvss 500n6vss 500n15.1

vss 500n10

standards Iec 61000-4-5 Itu K …BellcoreIec 60950

Iec 61000-4-18Iec 60255

protection devices

solar panels,relays andswitches

Iec 60065ul 6500Iec 60950

the ucs 500n5/ucs 500n7 ultra compact simulators are the most versatile testers for covering transient and power-fail re-quirements according to international (basic and generic) and product family standards, with voltage capability of up to 7 kv. In addition to the Iec 61000-4-5 standard for surge testing, they also comply to ansI/Ieee c62.41 requirements for surge and ring wave testing.




rise time tr 5 ns













100, 300 and 1,000 a/m with mc26100




transIents




> Iec 61000-4-4/-5/-8/-9/-11/-29


Technical DaTa



rise time tr 5 ns













100, 300 and 1,000 a/m with mc26100






ucs 500n7






the ucs 500n7 is the most economical test solution for fullycompliant immunity tests and ce marking. a built-in cdn is used for testing single-phase euts up to 400 v/16 a, while tests on three-phase euts can be performed by adding an au-tomatically controlled external coupling network up to 690 v with max. 100 a.em test supplies a large range of accessories for various ap-plications.


55

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surge tester 12 kvvcs 500n12































vcs 500n10surge tester 10 kv






















transIents

ucs 500n5vsurge tester 5.0 kv surge tester 8 kv

vcs 500n8

















> 5.0 kv/2.5 ka surge, Iec 61000-4-5/-9






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5656

telecom surge testertss 500n6B

> compact telecom surge generator as per gr 1089

> all 10/360 µs, 10/1,000 µs and 2/10 µs included

> Built-in resistive coupling network

Bellcore gr-1089-core, Itu-t K.12, Itu-t K.28, Itu-t K.45


first-level lightning

pulse 10/1,000 µs with 6 Ω > 1,000 v & 167 a per conductor

rise time tr/pulse duration td < 10 µs/> 1,000 µs

pulse 10/360 µs with 10 Ω > 1,000 v & 100 a per conductor

rise time tr/pulse duration td < 10 µs/> 360 µs

pulse 10/1,000 µs with 10 Ω > 1,000 v & 100 a per conductor

rise time tr/pulse duration td < 10 µs/> 1,000 µs





Intra-building lightning





second-level lightning



dut supply 60 v/50 a 1 µs – 10 µs

surge & telecom tester 7 kvvcs 500n7t

> Iec 61000-4-5, Itu







wave shape




wave shape



polarity positive/negative/alternate





front time 10 µs



rise time tr 4 µs


VCs 500N10T 500 v – 10,000 v

telecommunication networks are exposed to lightning events. therefore telecommunication equipment connected to the out-side world need to have appropriate protection that demons-trates an acceptable level of immunity to surge transients. this would prevent failure during lightning events. telecom surge simulators of the tss 500 series are used to test the immunity of telecommunication equipment.




wave shape


duration td 50 µs



duration td 700 µs


rise time tr 4 µs

duration td 300 µs



front time tf 9 µs

duration td 720 µs


rise time tr 5 µs

duration td 320 µs

transIents


tss 500n10






wave shape


duration td 50 µs



duration td 700 µs


rise time tr 4 µs

duration td 300 µs



front time tf 9 µs

duration td 720 µs


rise time tr 5 µs

duration td 320 µs







also

avaIlaBle as

vcs 500n10T

wIth 10 kv

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58

surge pulses occur due to direct or indirect lightning strikes to an external (outdoor) circuit. this leads to currents or elec-tromagnetic fields causing high-voltage or current transients. another source of surge pulses is switching transients origina-ting from switching disturbances and system faults. due to the characteristic of the phenomenon almost every electrical and electronic device is affected by such lightning events. surge tests should therefore be widely performed also on component level.


charging voltage 100 – 2,500 v

short-circuit current 1,200 a

range I 1 – 18 a

range II 6 – 140 a

range III 40 – 1,200 a

wave shape




output direct hv-connector

hv test clamp

eut test box

other waveforms on request

current surge

current surge tester current surge testercss 500n10css 500n2


model Css 500N10



wave shape





eut test box

model Css 500N10.1



wave shape

rise time tr 10 µs




eut test box

other waveforms on request

> current surge generator 8/20 µs

> low current ranges to test smd protection devices

> eut test box available

> current surge generator 8/20 µs

> high current capability up to 10 ka (4 ka 10/350 µs)

> voltage/current measurement included

transIents

compact tester for ring wave and damped oscillatory waves fast damped oscillatory wave option for ocs 500n6-seriesocs 500n-serIes dow module


Iec 61000-4-18





the ocs 500n6 is used for ring wave testing up to 6 kv, slow damped oscillatory wave testing (100 khz and 1 mhz) up to 3 kv, and optional fast damped oscillatory wave at 3, 10, and 30 mhz. a ring wave is a non-repetitive damped oscillatory tran-sient occurring in low-voltage power, control and signal lines supplied by public and non-public networks. damped oscilla-

tory waves are repetitive transients occurring mainly in power, control and signal cables installed in high-voltage and medi-um-voltage stations. the ocs 500n6 can also be used to per-form magnetic field tests as required in Iec 61000-4-10 using a magnetic field coil such as the ms 100.

































Burst duration 50 ms +/- 20 %, at 3 mhz

15 ms +/- 20 %, at 10 mhz

5 ms +/- 20 %, at 30 mhz


short circuit current 9a – 88 a +/- 20 %

rise time current waveform at 3 mhz: < 330 ns

at 10 mhz: < 100 ns

at 30 mhz: < 33 ns

decaying current waveform peak 5 must be > 25 % of peak 1


also

avaIlaBle as

css 500n10.1

4 ka 10/350 μs

also

avaIlaBle as

1 OR 3-Phase

veRsiOn

uP TO 32 a

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60

surge tester 10 kv for solar panel testing



rise time tr < 100 ns

pulse duration > 2 ms

Internal resistor 1,000 Ω

polarity positive

voltage surge simulation surge tester 6 kv for safety testing of “protection relays”vss 500n12-serIes vss 500n6

> testing equipment for safety testing up to 12 kv

> Internal 40 Ω or 500 Ω resistor for current limiting


> compact in size


> constant energy

> 7 load ranges from 10 nf to 180 nf


Iec 60060, Iec 384-14, Iec 664 , Iec 60335 Iec 60255-5 Iec 61730-1, Iec 61730-2, Iec 60060, ul 1703


Vss 500N12




Internal resistor 500 Ω


Vss 500N12.1






Vss 500N6.2









wave shape



Internal impedance 500 Ω

energy 0.5 J at each test level

test level 0.55 kv – 0.9 kv – 3.0 kv – 5.0 kv – 6.6 kv

polarity positive/negative/alternate


Vss 500N15.1 500 v – 15,000 v

testlevel 0.55 kv – 0.9 kv – 3.0 kv – 5.0 kv – 6.6 kv –

9.3 kv – 14 kv

voltage surge simulationvss 500n10 vss 500n10.3

Iec 60065, ul 6500, Iec 60950

> testing equipment safety up to 10 kv

> special pulse-shaping network


must be able to withstand surges due to transients caused, e.g. by thunderstorms and entering the apparatus through the antenna terminal. the voltage surge simulator vss 500n10 generates high-voltage transients as required by Iec 60065 and ul 6500 standards for safety tests on audio, video and similar electronic apparatus.

the voltage surge simulators vss 500n generate high-voltage transients as required by several Iec standards. the voltage surge pulses are used to test the isolation (voltage withstand) capability of components, sockets, connectors, cables and many other items.as per safety test requirements the insulation between acces-sible parts or parts connected to them and hazardous live parts





wave shape

front time tr 1.2 µs

time to half value 50 µs

load capacitance ranges 30 nf – 40 nf

40 nf – 50 nf

50 nf – 65 nf

65 nf – 85 nf

85 nf – 110 nf

110 nf – 140 nf

140 nf – 180 nf



also

avaIlaBle as

vss 500n6.2

wIth reduced

voltage

also

avaIlaBle as

vss 500n15.1

wIth 15 kv

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62

aIrcraftmIlItary

OveRview

Application power mains supply simu lation

ConductedImmunity

radiatedImmunity


products netwave-series single phasenetwave-series three phaseautowavevds 200n-series

cws 500n3cws 500n2

cws 500n3cws 500n2

ditoesd 30n

standards do 160, sec. 16mIl-std-704Boeingairbus

mIl std 461do 160

mIl std 461do 160

mIl std 461do 160

netwave is an ac/dc power source, specifically designed to meet the requirements as per Iec/en 61000-4-13, Iec/en 61000-4-14, Iec/en 61000-4-17, Iec/en 61000-4-28. Its output power with low distortion and high stability, even if supplying dynamic loads, guarantees full compliant measure-

ments for harmonics and flicker as per Iec/en 61000-3-2, JIs c 61000-3-2 and Iec/en 61000-3-3 as well as per Iec/en 61000-3-11 and Iec/en 61000-3-12.the three-phase netwave models additionally support testing as per Iec/en 61000-4-27.

sImulatIon of ac and dc supply anomalIes








output voltage


netwave 60

0 v – 3*300 vac (p-n); 0 v – ± 425 vdc


netwave 60.1

0 v – 3*360 vac (p-n); 0 v – ± 500 vdc

output power




output current

netwave 20.x 26a (rms) continuous




66 a (rms) short-term (max. 3s)










output voltage



output power



output current




netwave 7, netwave 7.226 a (rms) continuous









slew rate 8 v/µs


65

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Bulk current Injection (BcI) is a test procedure to test immunity to electrical disturbances caused by narrowband electroma-gnetic energy. the test signal is injected by means of a current injection probe. In physical terms the current injection probe is a current transformer laid around the wiring harness. Immunity tests are performed varying the level and the frequency of the injected test signal. the BcI test method is widely known in the automotive industry as well as in the military/aircraft industry to test single components of a complex system.

the cws 500n3 is a state-of-the-art solution in a compact one-box design to test immunity to conducted audio frequency disturbances and low-frequency magnetic fields. the cws 500n3 includes signal generator, lf amplifier, coupling transformer, frequency selective current and voltage monitor, software and gpIB interface. the icd.control-software supports the test routines, controls external measuring devices and automatically generates test reports with all test data included.


Bulk current Injection (BcI) testingcws 500n2

Iec 61000-4-6, en 61000-6-1, en 61000-6-2, Iec 60601-1-2:2002, Iso 11452-4, Iso 11452-5, daimlerchrysler dc-10614, ford es-Xw7t-1a278-aB, ford esXw7t-1a278-ac, gmw 3097 (2001), gmw 3097 (2004), mBn 10284-2:2002, psa B21 7110, renault 36.00.808/-d, renault 36.00.808/-g, mIl std 461d/cs 114, mIl std 461e/cs 114, rtca/do 160 section 20, fiat 9.90110


BcI method mIl 461e, cs114



max. vswr 1 : 2.0




pm 1 – 3,000 hz



output n-connector





test method closed loop


amplifier

> Bulk current injection as per mIl 461e



cws 500n3audio frequency and magnetic field testing

Iso 11452-8, Iso 11452-10, vehicle manufacturer specifications, sae J1113, mIl-std 461


conducted immunity mIl std 461

output level 0.001 v – max. 6.5 vrms

output current max. 15 a


output power nominal 100 w

output power peak 400 w

output impedance < 0.5 Ω

harmonic distortion > 20 dBc at max. power

coupling audio transformer included

measurements freq. selective voltage/current meter

verification load 0.5 Ω & 4 Ω included

radiated immunity mIl std 461

magnetic field max. 1,000 a/m up to 1 khz


radiating loop as per mIl std 461

magnetic field sensor as per mIl std 461

current sensor Included

> conducted & radiated immunity up to 250 khz

> Built-in voltage/current measurement

> Built-in coupling transformer 1 : 2


wave generation 2 output channels standard

4 output channels optional

output range ±10 v/50

resolution 16 bit


sample rate up to 500 khz

waveform segments dc voltage, sine wave, sine wave sweep,

sine ramped, square wave, triangular

wave, saw-tooth wave, ramp up/down,

exponential wave, etc.

functions Iteration of up to 12 parameters per level,

up to 9 levels

rseudo-random distribution of parameters

wave recorder 2-channel measuring input

Input range ±5 v, 10 v, 20 v, 50 v, 100 v

autowave is used for the following applications:> generation of all kinds of voltage profiles via software> replay of imported data or plot files, record & play> recording voltage variations in the actual vehicle> replaying the measured data via a suitable

dc source or amplifier> analysis of recorded voltages and currents> export of measured data to other software tools

signal generator and recorderautowave

> simulation + measuring + analysing

> 16 bit resolution, 80 gByte hard disk memory

> simultaneous record & play function

do 160 section 16 requirements

the amp 200n series is a low-frequency signal source that generates sinusoidal signals used for simulating ripple noi-se and ground shift noise required by a variety of automotive standards, e.g. ford emc-cs-2009.1, cI 210, cI 250 and rI 150. additionally, the amp 200n can be used to generate magnetic fields by means of a radiation loop or small helmholtz coils as per rI 140 of ford emc-cs-2009.1contolled by the autowave a large number of different standard requirements can be covered.

BatterysImulatIon

> Built-in dds to generate sinusoidal signals up to 250 khz

> Built-in lf amplifier, 250 w or 800 w

> output voltage max. 150 v p-p

amp 200n-serIeslow-frequency signal source for supply simulation and magnetic field testing

chrysler dc-10615, dc-11224, cs-11809, cs-11979, daimlerchrysler dc-10614, dc-10615, dc-11224, fiat 9.90110, fiat 9.90111, ford es-Xw7t-1a278-ac, ford emc cs-2009.1 gm 3097, Iso 11452-8, Iso 11452-10, Iveco 16-2119, Jaguar/landrover emc-cs-2010Jlr, mitsubishi es-X82114, es-X82115, mBn 10284-2, nIssan 28401 nds02, psa B21 7110, renault 36.00.808/--g, --h, --J, --K, --l, sae J1113-2, sae J1113-22, tata motors tst/ts/wI/257, volkswagen tl 825 66, volvo std 515-0003, germanischer lloyd gl vI 7-2, do-160e/f/g, mIl-std-461e/f


amplifier output characteristics


signal power 250 w (nominal) or 800 w (nominal)

output voltage 50 v rms, max. 150 v p-p

output current max. 5 a rms or max. 16 a rms

harmonic distortion (thd) < 0.1 %

current protection short circuit protected

overvoltage protection for voltages > 20 v fed back by the dut

signal generator output characteristics

frequency range dc, 10 hz – 250 khz (sinusoidal)

output voltage ± 10 v

dc offset 0-10 v, programmable, to control ext. dc amp.

measurement frequency-selective voltage current

measurement (rms)

accessories

radiation loop 120 mm radiation loop for magnetic field

testing as per ford emc-cs-2009.1, rI 140

loop sensor to measure the magnetic field strength

cn 200n1

transformer assembly with built-in

0.5 Ω / 250 w resistive load as per

ford emc-cs-2009.1

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66






hold-on time > 5 s





150 pf/2,000 Ω –– 330 pf/2,000 Ω











electrostatic discharges between objects can cause persistent disturbances or even destruction of sensitive electronics or controls. dito is the most advanced esd tester for accurate si-mulation of esd pulses according to the latest standards.Its efficient battery power concept allows users to generate up to 50,000 pulses at maximum test voltage from a single bat-tery. while standard and pre-programmed user test routines make esd testing an easy and comfortable procedure.







hold-on time > 5 s










150 pf/330 Ω

330 pf/330 Ω

150 pf/2,000 Ω

330 pf/2,000 Ω



esd 30n


> ergonomic design

> modular concept

> easy to handle






download the complete technIcal data:

www.emtest.com

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the coupling network is the central connection point in a fully automatic test set-up. with the coupling networks type cnI 501/503, burst and surge pulses as well as voltage dips and voltage variations are coupled onto the selected supply lines.

cnI 501/503combined coupling/decoupling networks for burst and surge cnI 501/cnI 503

> connection to: ucs 500 nx, eft 500 nx, vcs 500 nx

the coupling network is the central connection point in a fully automatic test set-up. with the coupling networks type cnv 501/503, surge pulses are coupled onto the selected supply lines.

cnv 501/503coupling/decoupling networks cnv 501/cnv 503 for surge

> connection to: ucs 500 nx , vcs 500 nx

the coupling networks cnv 504/508 are used to superimpose the surge pulse onto signal and data lines as well as onto telecommunication lines.

coupling/decoupling networks for signal/data and telecom lines

> connection to: ucs 500 nx, vcs 500 nx

accessorIes

cnv 504/8n.X / cnv 504/8s1

cdn for coupling surge onto unshielded and shielded high speed communication lines for data rates up to 1,000 mbit/s. protection equipment limits residual voltage at the ae side. surge, ring wave and Burst pulses can also be applied on shielded lines.

cnI 508n1 assemBly coupling/decoupling assembly for unshielded and shielded high-speed communication lines up to 1 gBIt/s

> connection to: ucs 500 nx, vcs 500 nx

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the motor variac is used for adjusting the required dip vol-tage and voltage variation continuously. for 3-phase appli-cations the variac can be used for star and delta powered euts as well.

mv3p40XXds3-phase motor variac for delta-star tests. for tests according to Iec/en 61000-4-11 and Iec/en 61000-4-34

> connection to: pfs 503 nx

the v4780 is a tap-off transformer to achieve the fixed 40 %, 70 % and 80 % dip levels. this unit is also available as a re-mote-controlled model v4780s2.

v4780/v4780s2tap-off transformer type v4780 for tests according to Iec/en 61000-4-11

> connection to: ucs 500 nx

coupling/decoupling networks for communication ports and signal/datalines as well as ac/dc power supply lines according to Iec 61000-4-16

cdn 16-t2 / cn 16-l2/l3/l4/l8

> connection to: cws 500n4

acs 500n2.3 is an electronic ac source, specifically designed for conducted low-frequency tests according Iec/en 61000-4-16. supports tests at various supply frequencies.

acs 500n2.3single-phase ac/dc voltage source 2 kva for tests according to Iec/en 61000-4-16 – galvanically isolated

> connection to: cws 500n4

the motor variac is specifically designed for conducted low-frequency tests according to Iec/en 61000-4-16. supports tests at present supply frequency.

mv2606n2.2motor variac for tests according to Iec/en 61000-4-16 – galvanically isolated

> connection to: cws 500 n4

the motor variac is used for adjusting the required dip vol-tage and voltage variation continuously.

mv26XXmotor variac type mv26xx for tests according to Iec/en 61000-4-11

> connection to: ucs 500 nx, pfs 503 nx

rds 200 is a remote-controlled dc voltage source with a built-in current sink and is used to generate battery supply variations. It is controlled via the 0 – 10 v dc analogue signal from the pfs 200n for voltage dips or by an arbitrary generator to gene-rate signals, e.g. as required by ford’s cI 230 specification.

rds 200/rds 200s1ford es-Xw7t.../emc-cs-2009, cI 230

> connection to: pfs 200 nx, autowave

type ms 100n:> 4 cm2 cross-section as per Iec 61000-4-8 ed.2:2009> 100 a/m continuous, 1,000 a/m short term> pulses up to 3,200 a/m> on request also available with wheels

ms 100nmagnetic field test antenna according to Iec/en 61000-4-8 ed. 2:2009 and Iec/en 61000-9

> connection to: ucs 500 nx, pfs 503 nx, vcs 500 nx ocs 500n

360degrees

rotatable coil

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the ctr2 is a coaxial current target designed to monitor elec-tro-static discharges as required in Iec 61000-4-2.

ctr2

> connection to: esd 30 n, dito

the ctr2-ad is a conical adapter to connect the ctr2 into a 50 Ω measuring system for verification.

ctr2-ad

> connection to: esd 30 n, dito

radiating loop as per mIl-std 461 to generate magnetic fields.

radIatIng loop


> suitable calibration adapters for all available cdns> coupling clamp (em clamp) > current injection> t-50, 50 Ώ termination resistor> r-100n, 150 Ώ to 50 Ώ adapter

cdns and clampscoupling/decoupling networks according Iec 61000-4-6

> connection to: cws 500n1, cws 500 n2

ca Iso

> connection to: ucs 200 n, ld 200 nx, ld 200 sx

a different set of resistors is used for the verification of transi-ent generators as per Iso 7637-2. the generator output is mea-sured under matched load conditions which means rI = rl.

loop sensor as per mIl 461 to measure magnetic fields.

loop sensor


InJectIon and monItorIng proBes

> current injection probes> calibration jigs> matching impedance and termination resistors

> connection to: cws 500n1, cws 500 n2

f-130a-1, f-140, f-120-6a, f-120-9a, f-33-2, f-55, f-65

> Built-in 1,700 μf capacitor and discharge resistor> Built-in current probe 10 mv/a> monitor output to measure residual capacitor voltage

ca pfsverification kit for power fail simulators acc. to Iec 61000-4-11

> connection to: ucs 500 nx, pfs 503 nx

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the capacitive coupling clamp is used to couple pulses 1, 2 and 3a + 3b onto control and data lines.

the eas 30 is necessary for the test set-up according to the relevant standard to connect the hcp and the vcp to the ground reference plane.

acc eas 30capacitive coupling clamp according to Iso 7637-3 earth grounding resistor acc. to Iec 61000-4-2

> connection to: ucs 200n > connection to: esd 30 n, dito

generates electrical and magnetic fields. set includes diffe-rent test probes.the test probes can be connected to the above-listed genera-tors for burst application. these test probes allow preliminary testing acc. to Iec 61000-4-3 during development.

Itp, Itp/hImmunity test probes for pre-compliance tests acc. to Iec 61000-4-3

> connection to: ucs 200 n, ucs 500 nx, eft 500 nx

the vcp is used to subject the dut to discharge indirectly. the 10 cm clearing distance to the dut is obtained by the wooden support.

vcp vertical coupling plane acc. to Iec 61000-4-2

> connection to: esd 30n, dito

the capacitive coupling clamp is used to couple the burst pulses onto control and data lines.

hfKcoupling clamp according to Iec/en 61000-4-4

> connection to: ucs 500 nx, eft 500 nx

the pulse shape of eft/burst generators designed as per Iec 61000-4-4 has to be verified at 50 Ω as well at 1,000 Ω load. Both matching resistors additionally include a voltage divider to measure the wave form.

ca eftcalibration set acc. to Iec/en 61000-4-4, ed. 2

> connection to: ucs 200 n, ucs 500 nx, eft 500 nx


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haven’t found any solutIon for your needs yet? no proBlem!em test also develops taIlor-made equIp-ment to meet your specIal requIrements. Just tell us your needs.

[email protected]> standard library updated continuously> 100 % compatible with windows 7®

and windows vista®

> Involvement of measuring devices> user-friendly interface> Individual configuration of tests> automation of test sequences> comprehensive reporting to match

user requirements

only software experts with wide-ranging experience who understand the day-to-day work of our customers are able to think of everything. they know the exact requirements of our customers. they listen actively and develop together with our customers complete em test software solutions that conform to the latest relevant standards. outstanding customizability and innovation characterize our software, which is guaranteed to help achieve optimum performance.

Windows 7® andWindows Vista® is either a registered trade mark or a brand of the Microsoft® Corporation in the USA and/or other countries.

our softwareIntellIgence Is a human characterIstIc. actually.

think simple: customized software for each test. the sophisticated advantages of em test-software

icd.control

the universal solution

for sinusoidal quantity

iso.control

the standard for

automotive testing

dpa.control

evaluation and

analysis, all in one

esd.control

test plan to test

report completely

reproducible

iec.control

the standard for industrial,

medical and telecommuni-

cation testing

autowave.control

battery simulation for

maximum demand

completely

compatIBle

WITH VIsTA™

and

WINDoWs 7™


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eMc-knOwleDGe FOR beGinneRs unD PROFessiOnals

our emc seminars and workshops are geared to our customer’s requirements in the fields of research, development and production.

all em test lecturers come exclusively from the practice and impart their knowlegde vividly and up close and personal manner to the participants. maximum know-how transfer and learning success are guaranteed.

emc semInars & worKshops: success can Be learned

cOMPRehensive seRvice PORTFOliO

our comprehensive professional service and support solutions leave nothing to be desired. commissioning, briefings, updates, maintenance, and repair work are given high priority at em test. thanks to the outstanding infrastructure, an optimum service project management, and especially thanks to our highly qualified and moti-vated employees, we literally achieve the highest level of em test service quality.

servIce & support: always avaIlaBlePROFessiOnal suPPORT RiGhT FROM The beGinninG

em test assists you already on the development phase of your products with technical coaching and tangible mea-sures such as layout optimization, design of devices and power supplys, grounding and shielding, microprocessor board design, and much more. not only do we determine the interference potentials but we also simultaneously develop suitable interference suppression and elimination measures in cooperation with you, our customer.

emc test laB: your product success Is our mIssIon

alwaYs The RiGhT TesTinG insTRuMenT

Bridge long-term planned investments by renting the equipment you need for as long as you need it at em test.

we have a large pool of rental equipment, which is not only state of the art, but moreover fully compliant with all emc testing requirements. with rental equipment from em test, you can respond promptly and flexibly to unex-pected testing demands. quickly and economically!

rental equIpment: ready for every testIng demandMORe waRRanTY? wiTh PleasuRe.

calibrations of em test offer more. your em test product will be checked on request and if necessary adjusted imme-diately. we are so convinced of the quality of your products that the warranty time can be extended to 3 years by having calibrated the equipment at any of the accredited calibra-tion laboratories of em test during the 2-year warranty period. hence, you’ll get 1 year warranty almost for free.

eXtended warranty: quasI for free

RePRODucible, FasT & cOMPeTenT

the accredited em test calibration laboratories in reinach (ch) and Kamen (d)perform competent, independent and reasonably priced calibrations according to dIn en Iso/Iec 17025 as well as national andinternational standards.and not just for em test products, but also for equipment from other manufacturers. and if you like also on site.

accredIted calIBratIon laBs: aBsolute complIance

em test servIces:customIZed solutIonsfor every need.

Conf id ence for sure!

accredited laboratories

EM TE

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> contact our agencies worldwide: www.emtest.com

notes

we looK forward to support you ...competence wherever you are

EM TE

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EM TE

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em test equIpment:the IntellIgent and easy way of testIngwe set Important standards In the development of emc test equIpment.

Information about scope of delivery, visual design and technical data correspond with the state of development at time of printing. technical data subject to change without further notice.

copyright by em test 2012.

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learn more:

www.emtest.com

switzerlandem test (switzerland) gmbh > Sternenhofstraße 15 > 4153 Reinachphone +41 (0)61/717 91 91 > fax +41 (0)61/717 91 99Internet www.emtest.com > e-mail [email protected]

Germanyem test gmbh > Lünener Straße 211 > 59174 Kamen phone +49 (0)23 07/2 60 70-0 > fax +49 (0)23 07/170 50Internet www.emtest.com > e-mail [email protected]

polandem test polska > ul. Ogrodowa 31/35 > 00-893 Warszawa phone + 48 518643512 Internet www.emtest.com/pl > e-mail [email protected]

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Chinae&s test technology limited > Rm 913, Leftbank Community > No. 68 Bei Si Huan Xi Lu > Haidian District > 100080 Beijingphone +86-10-82676027/28/29 > fax +86-10-82676238Internet www.emtest.com > e-mail [email protected]

malaysiaem test (m) sdn Bhd > Unit B2-6, Jalan Dataran SD2 > Dataran SD2, PJU9 > Bandar Sri Damansara > 52200 Kuala Lumpur phone +60 (03)62 73 22 01 > fax +60 (03)62 74 22 01Internet www.emtest.com > e-mail [email protected]

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