Advanced Detection of Electronic Counterfeits (ADEC) · PDF file · 2013-04-29and...

Supporting Americas Advanced Technology

NOKOMIS

Copyright Nokomis, Inc. 2013

Advanced Detection of Electronic Counterfeits

(ADEC) 19 April 2013

Presenter: Bogdan A. Pathak

Authors: Walter J. Keller and Bogdan A. Pathak

Nokomis Inc.

(724) 483-3946

[email protected]


NOKOMIS


• Nokomis is dedicated to the detection, identification, classification and diagnostics of electronics based on electronic emission signatures – Nokomis products exploit EM emissions for our customer’s benefit

– Providing unique detection and diagnostics capabilities since 2002

• Over $15 Million in R&D Resulted in ADEC Core Sensor

– Sensitive receiver developed over several years

– Application specific digital signal processing/automated detection techniques leveraged

– 17 Phase I SBIRs, 7 Phase II SBIRs, 11 Phase III SBIRs

• Experienced staff/specific skill set for application – Multiple years experience in sensitive EM/RF effects analysis

– Significant institutional experience in electronic device detection, analysis and diagnostics methodologies

Nokomis Background

2


NOKOMIS


• Small business - offices in Charleroi, PA; Toledo, OH;

Athens, GA

• Unique capability to support ADEC • Three anechoic chambers – largest is 50’ x 18’x 15’

• 50,000 square foot facility

• Secure facility for assessment of

counterfeit modalities

• All employees are U.S. citizens

• Substantial Counterfeit Part

Repository (18000 parts in inventory)

• Unique signature assessment capabilities

Company Overview

3


NOKOMIS


ADEC Part Screening

Configurations

• Detects anomalies in electronic parts

• Detects counterfeits and verifies trusted parts

− Piece part screening

− Part screening on fully integrated boards

Screening of Boards After Integration Piece Part Screening

4


NOKOMIS


Current Counterfeit Dilemma and

Applicability of ADEC

5


NOKOMIS


Uncovering Counterfeits

• The counterfeit problem

continues to increase in size,

scope and sophistication

• Limitations with standard

methods of electronic

component screening

– Low chance of counterfeit ID

– Too costly

– Overly specific

• Poorly labeled chips

• Pin continuity

• Temperature testing

Large percentage of counterfeit

components not identified until

problems occur during use!

6


NOKOMIS


Counterfeit Problem

• Counterfeit part incident reports from January

through the end of August 2012 averaged 107.3

per month, up slightly from 107.1 in 2011 − 1,336 separate verified counterfeit part incidents

− Transactions involved more than 834,079 parts

− Sources include GIDEP and ERAI

• Integrated Circuit (IC) counterfeiting especially

critical Field Programmable Gate Array

(FPGA), Memory and Microprocessor

counterfeiting continue to increase

• Government screening methods still incapable

of ensuring integrity of system subcomponents − Counterfeits highly likely to be responsible for

critical system functions in military systems

now!

7


NOKOMIS


US Defense Electronic Parts

Supply Chain

8


NOKOMIS


Industry Standard Testing Methods

• Sophisticated counterfeits can

evade detection methods

– High-quality labeling

– Functional component

• Up-marked

• Recycled

• Limited testing risky

– Counterfeits easily overlooked

– Single questionable component

– Can compromise entire system

• More extensive testing required

- Expensive

- Time-intensive

Source: NASA briefing; Workshop and Exhibition on

COUNTERFEIT ELECTRONIC PARTS; October 1, 2009

9


NOKOMIS

Copyright Nokomis, Inc. 2013 10

Unintended Emissions

Application to Counterfeits

All electronics give off unintentional radiated emissions • All electronics radiate electromagnetic

energy that is characteristic of their function, design, and construction

• Integrated circuits can be characterized by emission signatures, and changes to those signatures indicate counterfeit devices

• Electromagnetically reactive markers whose signatures (fingerprint) change predictably can be leveraged to provide authentication, and provide dynamic levels of security

Integrated Circuit (IC) Signature


NOKOMIS


ADEC Piece Part Screening

• ADEC System repurposes mature device detection technology for counterfeit detection

– Phenomenology heavily researched

– Capability proven through extensive testing • Government-sponsored

• Substantial IR&D

– Leveraged to detect counterfeit electronics

• Counterfeit detection modality is non-contact and non-invasive

– Radio frequency measurements

• Multiple channels/high throughput

• Emissive content analyzed

• Embedded processing assets

• Algorithms assess component signature

• Unintended emissions are produced by all electronic components

– Autonomous analysis and categorization

– Authentic or suspected counterfeit determined

ADEC Detects Counterfeits

Prior to Integration

into Weapon Systems

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NOKOMIS


ADEC:

Sensitivity and Discrimination

• Sensor technology state-of-the art for extracting extremely weak phenomena

• Ultra-sensitive Hiawatha receiver forms core of ADEC system ‒ Product of more than $15M in

targeted government investment

‒ Unique design features • Extremely sensitive front-end

• Multi-channel

• High throughput

• Substantial back-end processing o Achieves significant processing gain

• Developed specifically for unintended emissions assessment of electronics

High End Commercially

Available Capability

ADEC

12


NOKOMIS

Copyright Nokomis, Inc. 2013 13

Where Does ADEC Fit In?

VisualMark

Perm

Internal

VisualADEC

Basic DC

Test

Min Func.

Test

Full Spec.

Extended

Test &

Qual

No die Possible Possible Yes Yes Yes Yes Yes Yes

Wrong-die Possible Possible Likely Yes Yes Yes Yes Yes

Board pull Possible No No Yes Possible Likely Yes Yes

Failed real

partNo No No Likely Possible Likely Yes Yes

Speed up-

markingPossible Possible No Yes No Possible Yes Yes

Spec up-

markingPossible Possible No Yes No Possible Yes Yes

Temp up-

rangePossible Possible No Likely No No Yes Yes

Lesser part

/ knock-offPossible Possible Possible Yes Possible Possible Likely Yes

high-end

counterfeitNo No Possible Yes No No Possible Possible

non-

functional

devices

Type of Analysis

Co

un

terfe

it T

yp

es

Functional

Devices

• ADEC offers improved performance at lower cost compared to existing methods

Expense

Sophis

tica

tion

*Modified from “Basic Detection Methods for Counterfeit Components,” Integra, March 2010


NOKOMIS


Comparative Costs

• Visual Inspection

• Visual and acetone tests: $0.05 / piece

• X-ray or de-capsulation: $125 / piece

• Minimal Functionality Tests

• Simple devices: $1K – $2K NRE + $1 / piece

• Complex devices: $3K – $5K NRE + $2 / piece

• Full Functionality Tests

• Simple devices: $2K – $5K NRE + $5 / piece

• Complex devices: $5K – $20K NRE + $7.5 / piece

(assumes software exists for component)

• Burn-in: $2K – $5K NRE + $2/piece

• ADEC System: $.5K - $1K NRE + $0.25 / piece

*Cost data of existing methods taken from “Basic Detection Methods for Counterfeit Components,” Integra, March 2010

14


NOKOMIS


ADEC User Interface:

Logging In

• Standard user login upon system startup – Username

– Password

• Optional: additional verification from fingerprint reader – Strengthens identity proofing

• User classifications – Admin: Full access to basic

and advances features

– Operator: Access to all basic features; limited access to advanced features

15


NOKOMIS



Basic User Screen

Push

button to

start scan

Status bar

Primary

status

display

Active

part to

screen

Button to

select part

to screen

Editable

Serial No.

{

System

connection

status

16


NOKOMIS


• System startup

• Select part

• Initiate scan

• Scan performed

• Result displayed

• Detection history appended

• Load next part

The ADEC User Interface:

The User’s Experience

17


NOKOMIS



Part Selection

• Select from parts within ADEC signature database

– Filter by manufacturer

– Filter by part type

• Microcontroller

• Microprocessor

• Programmable Logic

• Memory

• Other

– Manual search field

• Database easily updated as new parts are identified and characterized

18


NOKOMIS



Advanced Features

• Advanced mode for

maintenance engineers

and R&D (admin level

users)

• Spectral display for

each channel

• Manual tuning

• Review, append, and

export logs

• Record received data

for additional analysis

19


NOKOMIS


Recent Work Emphasis

• Nokomis maintains continually growing inventory of counterfeit components – Emission collection and analysis

– Part information is recorded and stored • Source and date received

• Reason for being suspect

• Any source or traceability information available

• Parts database contains substantial counterfeits – Over 90 different part types with 18,000+ total

counterfeit parts and counting

– Parts received from 6 distributors

• Emphasis on programmable logic, microcontrollers, microprocessors, and memory

20


NOKOMIS


Parts Database/Inventory

Manufacturer Part Number Part Type

Quantity -

Suspect Received From

Programmable Logic 13 Parts

A Xilinx XC3042A FPGA 5 SMT

W Altera EPM7032LC44-12 MAX7000 Series CPLD 24 Inland Empire

X Altera EPM7160ELC84-12 CPLD 10 PCX

Y Lattice Semiconductor GAL16V8D 15LP D302DD08 PLD 20 Inland Empire

Z Lattice Semiconductor pLSI 1016-60LJ 13450B05 PLD 12 Inland Empire

AA Lattice Semiconductor MACH131-12JC 0108MDM A CPLD 20 Inland Empire

AC Actel A1020A ACT1 anti-fuse FPGA 3 Inland Empire

AD Lattice Semiconductor GAL18V10 PLD 31 Inland Empire

BG Xilinx XCR5064C-10VQ44I CPLD 10 PCX

BH Xilinix XC7354-10PC68C CPLD 10 PCX

BI AMD MACH435-15JC-20JI CPLD 10 PCX

BX AT&T Micro ATT65630 CPLD 10 PCX

CG Xilinx XC95108-15TQ100I XC9500 Family CPLD 0 (Avnet - Navy)

Microcontrollers 7 Parts

L Philips MAB8421P Microcontroller 2 4 Star

P National Semiconductor HPC46003V17 Microcontroller 6 4 Star

Q Motorola MC6809CPC65P Microcontroller 34 AERI

V Motorola MC68HC705P6CDW HCMOS Microcontroller 850 Inland Empire

CJ Freescale/Motorola MC68334GCEH20 32-bit Microcontroller 5 Sensible Micro

CL Atmel AT89S8252-24JC Microcontroller 20 Sensible Micro

CQ Motorola MC68HC11F1CPU4 Microcontroller 20 Sensible Micro

Memories 23 Parts

H Texas Instruments TBP28L22N PROM 2 4 Star

J Hyundai HY628100BLLG-70 RAM 2 4 Star

O Atmel AT29C040A-90PC Flash memory 5 4 Star

T Atmel AT29LV040A-15TU Memory 83 AERI

AE Xilinx 1765DSC Configuration PROM 2500 Inland Empire

AF Texas Instruments 8044X 288 TBP18S030N PROM (?) 25 Inland Empire

AG AMD/Fujistsu/ Spansion AM29F032B-120EC 0644MBM Flash Memory 10 Inland Empire

AH Toshiba XC6913 TC58NVG0S3AFT05 EEPROM 10 Inland Empire

AI Intel MD2764-45/B 8243 T245051B UV Eraseable PROM 10 Inland Empire

AJ IDT IDT 7006 S70GB X5DC9613EP Dual Port SRAM 10 Inland Empire

AK SGS Thompson HPD1L535 M628128-20E1 SRAM 25 Inland Empire

BE Intel 28F400B5 Boot Flash ROM(?) 10 Inland Empire

BL Samsung K6X1008C2D-GF70 Static RAM 10 PCX

BM IDT IDT7MMV4101 Static RAM 10 PCX

BN Toshiba TC551001CF-70L Static RAM 10 PCX

BP AMD AM29F200BB-50SI Boot Sector Flash Memory 10 PCX

BQ Atmel AT29C512-90TU Flash Memory 10 PCX

BR Sharp LH28F320BJE-PTTL90 Flash Memory 10 PCX

BS Intel MD2716M/B EPROM 10 PCX

BV Samsung KM41C4000DJ-6 Dynamic RAM 10 PCX

BW Samsung K6F1616U6C-FF55 Static RAM 10 PCX

CH Xicor X28C256KMB-25 Byte Alterable EEPROM 0 Crestw ood

CM ISSI IS41LV16256B-35TL DRAM 39 Sensible Micro

Manufacturer Part Number Part Type

Quantity -

Suspect Received From

Microprocessor 3 Parts

AB Zilog Z8681PS Z8 ROMLESS 8517 ROMless Microcomputer 8 Inland Empire

BJ NEC D70208L-10 Microprocessor 10 PCX

BK Intel TN80C188EB1 Embedded Processor 10 PCX

Others - OF INTEREST 19 Parts

K National Semiconductor ADC0817CCN 16 ch, 8-bit ADC 9 4 Star

M Philips NE568AN Phase-locked loop 5 4 Star

N Rockw ell R6522P Versatile Interface Adapter 2 4 Star

AL NEC NEC D71084C 8948AY2D1 Clock Pulse Generator/Driver 106 Inland Empire

AM Philips SCN2681AC1A44

Dual UART asynchronous

receiver/transmitter 43 Inland Empire

AN AMD AM7990PC/80 3363LJL

Local Area Netw ork Controller

for Ethernet 7 Inland Empire

AP Texas Instruments ADC1205 12-bit Plus sign ADC 4 Inland Empire

AQ Analog Devices AD7237ABN 0319 8690171 Dual 12-bit DAC 11 Inland Empire

AV TI CD4046BF3A PLL 10 Inland Empire

BB Texas Instruments 74LS138N FJG3421 9109VG 3-line to 8-line decoder 8 Inland Empire

BD VLSI VL82C315AFC2 03200C

related to 386SX System Cache

Control 10 Inland Empire

BT OKI M82C53-2 Programmable Interval Timer 10 PCX

BU National Semiconductor DP8571AN Timer Clock Peripheral 10 PCX

BY Motorola MC3371D FM Receiver IC 10 PCX

BZ Maxim MAX180BCQH Data Acquisition System 10 PCX

CD AMD AM79M574-1JC

Metering Subscriber Line

Interface 10 PCX

CI Texas Instruments TLC32044IN Voice-Band Analog Interface 0 Crestw ood

CK Crystal/Cirrus CS8412-CS Digital Audio Receiver 5 Sensible Micro

CN CMD G65SC51P-4 CMOS Interface Adapter 26 Sensible Micro

Others 26 Parts

E Texas Instruments TL604CP P-MOS analog sw itch 5 4 Star

F International Rectif ier IR2110S High and Low Side Driver 1 4 Star

G Sprague UDN6118A Flourescent light driver 12 4 Star

I Philips NE571D Compandor 12 4 Star

R Allegro UDN2985A Source Driver 20 AERI

S Intersil CA3240AE1 Amplif ier 25 AERI

AR Maxim MAX4391CPA

Micropow er Inverting Sw itching

Regulator 238 Inland Empire

AS Linear Technology LT1086IT Low -Drop Out Voltage Regulator 6 Inland Empire

AT ON Semiconductor MC33274ADR2 operational amplif ier 12500 Inland Empire

AU Texas Instruments LMC660CM CMOD quad operational amplif ier 890 Inland Empire

AW Phillips 74HC14N L0D1C5 Inverting Schmitt Trigger 2 Inland Empire

AX Analog Devices T0212 CMP04F Quad Precision Comparator 20 Inland Empire

AY Fairchild PF30AD CD4051BCN Analog Multiplexer/ Demultiplexer 12 Inland Empire

AZ Motorola MC54HC4066J KKFH9052 Quad Analog Sw itch 60 Inland Empire

BA AT&T LBR3 406690867 1350K 9322 K62 Quad Analog Sw itch 8 Inland Empire

BC Xicor X2864BJ-25 650 Inland Empire

CA Motorola MC33076D Op Amp 10 PCX

CB Intersil HA3-2544C-5 Video Op Amp 10 PCX

CC National Semiconductor 5962-9081201MPA High Speed Buffer 10 PCX

CE National Semiconductor 5962-8769301EA Multiplexer 10 PCX

CF Analog Devices ADE7755ARSZ Energy Metering IC 10 PCX

CP Analog Devices AD515AJH Op Amp 10 Sensible Micro

21


NOKOMIS


Recent Pilot Testing

• 7 parts provided by a Fortune 500 company – Contained sprinkled sampling of both counterfeits and

authentic parts for an aviation specific program

• Nokomis procured 40 certified authentic parts from the OCM separately to provide baseline

• 2 Groups conducted separate testing on the parts – Group 1: Determine if exploitable content present

– Group 2: Characterize performance of automated system

• Groups prevented from sharing data until conclusion of tests


NOKOMIS


Recent Pilot Results

• All blind studies accurately identified the

same 2 parts as authentic and the same 5

parts as counterfeit

– Each part scanned for 3 seconds

– 100% true positive rate

– 0% false alarm rate

– 100% specificity


NOKOMIS


Next Steps

• The ADEC system will be available for purchase at

the end of August 2013

– Contact Nokomis if you have counterfeit detection needs

• Nokomis intends to perform multiple additional

pilot tests to continue to validate system

performance and reliability

– Industry and government partners are necessary for this

testing

– Contact Nokomis if your entity is interested in partnering

on a pilot test


NOKOMIS


Summary

• ADEC technology effectiveness verified – Demonstrated against multiple counterfeits

– Cost-effective technology for identifying high-quality IC counterfeits

• Highly autonomous system – Simple user interface

– All functionality autonomous after user selections made

• Multiple algorithm combination greatly improves component

screening results – High confidence fingerprinting of components/low false positives

• Statistical results favorable and improvements continuously

being implemented

• Undertaking additional Pilot activities across several

programs to further improve results and develop a wider

statistical range of parts and applications

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Advanced Detection of Electronic Counterfeits (ADEC) · PDF file · 2013-04-29and...

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Transcript of Advanced Detection of Electronic Counterfeits (ADEC) · PDF file · 2013-04-29and...