365 Noise Mod Main
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Transcript of 365 Noise Mod Main
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oise & oise Rejection
Noise Sources Characterizing Noise
Signal-to-Noise Ratio (SNR, S/N) Power Spectral Density
Modes of Interference
Slide 1
Noise Rejection: Filtering Modulation
Shielding & Grounding Differential Amplifier Averaging
FIG. 1: Whether noise is a nuisance or a signal may depend on whom you ask.(Cartoon by Rand Kruback. Used with permission of Agilent Technologies.)
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oise
NoiseNoise is any unsteady component of the measurement signalthat causes the instantaneous value of the signal to differ fromits true value.
Slide 2
Time
x(t)
x t s t n t( ) ( ) ( )
ActualSignal
Noise
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oise Sources
Internal Temperature-induced random noise in conductors
(Johnson noise) Random current fluctuations in transistors (Shot noise)
Slide 3
Flicker noise
External AC Interference
Communication Interference Switching Interference Mechanical/Structural Vibration
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Average Signal PowerAverage power (in Watts) dissipated when voltage signal is connectedto a 1 resistor:
Assume the actual signal s(t) and the noise n(t) are independent ofone another:
oise Characterization
x tT
x t dtT 2 20
1( ) ( )
x t s t n t2 2 2( ) ( ) ( )
Slide 4
Root Mean Square (RMS) voltage of a signal is:
Ex: For x(t) = A sin( t + ), the average power of x(t) is:
SignalPower
NoisePower
x t x t( ) ( )rms 2
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Signal-to-Noise Ratio (SNR, S/N)Characterizes the noisiness of a particular signal, x(t) = s(t) + n(t):
SNR is usually expressed in decibels (dB):
oise Characterization
SN
Signal PowerNoise Power
s tn t
2
2
( )( )
Slide 5
The uncertainty of a measurement is the inverse of the SNR.
SN
Signal PowerNoise Power
or
S N Signal RMSNoise RMS
dB
dBrms
rms
s tn t
s tn t
10 10
20 20
10 10
2
2
10 10
log log ( )( )
log log ( )( )
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Random Noise Observe random signal for several observation periods:
Signal is different from period to period. The average power for each observation period is about the
same.
oise Characterization
Slide 7
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oise Characterization
Random Signal Can be approximated by a periodic signal, in which the first
observation period portion of the signal is repeated. Theapproximation is valid if: The observation period is long.
Slide 8
The approximation is only used for calculating the powerdistribution in the random signal.
n t
n t n t n t Periodic
n t A
M k t
P
P
P k O kk
( ):
( ): ( ) ( )
( ) cos( )
Random Signal
Periodic Approximation
-012
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oise Characterization
Average Power Spectrum
If kth harmonic is applied across a 1
resistor, the average power dissipated
n t n t A
M k tP k O kk
( ) ( ) cos( ) -012
W k
Slide 9
Power Spectrum : plot of W k vs k(similar to Line Spectrum).
Cumulative Power for the first N harmonics is:
2 2
0
1cos ( )
OT
k k O k O
k
W M k t dt T
-
W A M N kk
N
14
120
2 2
1
W
W N
W 3
W 1
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oise Characterization
Cumulative Power Spectrum In the limiting case when T O ,
O 0 , W N becomes acontinuous function of frequency
:
W ( )
W W T N O
( )lim
Slide 10
Power Spectral Density ( )The derivative of the cumulativepower W ( ) :
( ) ( )
( ) ( )
dd
W
f ddf
W f
[Watt /(rad/sec)]
or
[Watt /Hz]
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oise Characterization
Power Spectral Density ( ) Signal power is a stationary quantity that can be used to quantify
random signals. Power Spectral Density, , is a quantity that is a measure of how
the power of a random signal is distributed among all possible
Slide 11
.
The power of a signal due to frequencycomponents between 1 and 2 is:
The total power of a signal is the areaunder the curve:
W d
1 2 1
2
, ( )
1 2 W dTOT 0 ( )
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oise Characterization
Special Random Signals White Noise :Uniform power spectral density
( ) Aconstant
0
A
Slide 12
Band Limited White Noise :Band limited uniform power spectraldensity
( )
A C
C
constant 0
0
C
A
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Sources of oise
Internal Thermal (Johnson) Noise
Temperature-induced random motion of the electrons in resistors andsemiconductors causes a corresponding random voltage. Johnson Noise is a type of white noise with uniform power spectral
density: 2
Slide 13
where
Thermal noise amplitude roughly obeys a Gaussian distribution. Can only be reduced by reducing temperature and measurement
bandwidth.
J
o
o
k J/ K R
T K
. -1 38 10 23
vo s z
[ ] - Boltzmann' s constant
Resistance in the device [ ]
Absolute temperature of the device [ ]
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Shot NoiseQuantization of electrons causes fluctuation of current flowing throughtransistor junctions. Shot noise is white noise with a uniform power spectral density:
for current measurement:
Sources of oise
2
Slide 14
for voltage measurement:
where
Q: What is the RMS voltage due to Johnson and Shot noise?
nI
S nV f I qR( ) 22 [volts / Hz]2
q C RI An
-
1 59 1019
. [ ] - Electron charge Resistance in the device [ ] Nominal current flowing in the device [ ]
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Sources of oise
Internal Flicker Noise
Low-frequency noise, including random drift, present in transistors.Many naturally occurring processes, such as ocean currents, alsoexhibit 1/ f type behavior:
C
Slide 15
Flicker noise is usually important at low frequencies, f < 1000 Hz. Avoid DC measurement when very small signals are to be
measured.
vo s zF n f
C f
n f f F
Material dependent constant
Frequency [Hz]
1 1( )
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oise Propagation
Noise measured at the output:When a device, such as an amplifier, amplifies the input signal,so too does it amplify internal noise:
Slide 16
Device
T ( j )
Input
x(t)
Output
y(t)
W f df outTOT
0
out in f T j f f 2 2
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oise Example:
A voltage amplifier uses transistors in its circuitry, and has a total resistance of 10 k , withnominal current of 30 mA, at a temperature of 40 oC. Its frequency response function can beapproximated as an ideal low-pass filter with gain of 10 and cutoff frequency of 1000 Hz.a) Determine total noise power at the amplifier output, considering both Johnson and Shotnoise.
Slide 17
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b) Assuming that the measured input signal is a pure sinusoid having amplitude of 0.33 Vand frequency of 10 Hz, calculate the SNR of the output signal (in dB).
Slide 18
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Sources of oise
External AC Interference
60/120/180/240 Hz sinusoidal interference due to power lines,fluorescent lights, fans, etc.
Communication Interference
Slide 19
Radio/TV (1-100 MHz), cordless phone, cellular communicationinterference.
Switching InterferenceSwitching interference due to switching power supplies, relays,lightning, arc welders, auto ignition systems, etc.
Mechanical/Structural VibrationNormally under 20 Hz.
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oise Spectrum
Slide 20
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Modes of Interference
Series Mode InterferenceNoise or interference voltage V SM enters the measurement system inseries with the measurement signal voltage ETH .
RC / 2V SM ZOUT
Slide 21
ETH
RC / 2
ZL
Source Load
V L
V ZZ R Z
E V E V
EV
LL
OUT C LTH SM TH SM
dB
TH
SM
( )
log S N 20 10
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Modes of Interference
Common Mode InterferenceThe potentials on both sides of the signal circuit are raised by acommon voltage V CM relative to a common earth ground .
RC / 2ZOUT V A
Slide 22
V E V V V
V V V E
A TH CM
B CM
L A B TH
- Differential Measurement
Source Load
V L = V A V BETH
RC / 2
ZL
V B
V CM
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Shielding & Grounding Inductive Coupling
AC Power line in close proximity toone of the measurement leads willgenerate a series mode interference:
oise Rejection
V M d iSM
Slide 23
where i is the power line current M is the mutual inductance.
Solution:
(1) Physical separation
(2) Shorter cable length(3) Twisted pair
M d1
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Shielding & Grounding Capacitive Coupling
Induce both common mode andseries mode noise.
oise Rejection
V C
C C V V C
C C V B AC E AC 1 2
;
Slide 24
Solution:(1) Physical separation(2) Shielding
V V V V V
CM E
SM B E -
V AC
GND
Screen (Shield) Measurement Circuit
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Shielding & Grounding Ground Loop
oise Rejection
V
V i Z Z R Z
V V V
E E E SEC
RE
L R S
U
-
0
2
Forms loop TUPS
( )
Slide 25
E V V E V i Z Z i Z
E V i Z Z Z
E iR
V
V i R
V i Z
th P S
th E E E SE
V
E RE
V
th E E E SE RE
th EC
SM
SM EC
CM E RE
P S
- - -
-
2
2
( )
( )
( )
( )
Solution:
Single Ground for all devices !!using low-impedance grounding
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oise Rejection
Filtering
Slide 26
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oise Rejection
Filtering
Slide 27
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oise Rejection
Modulation
Slide 28
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oise Rejection
Averaging The S/N ratio of a periodic signal can be increased by takingrepeated measurements of the signal.
Periodic signal s(t) = s(t + kT ) k = 1, 2, 3, ...
Slide 29
2nd Sample:3rd Sample:
th Sample:
Sum:
Average:
s t T n ts t T n t
N s t N T n t
Ns t n tN
kk
N
( ) ( )( ) ( )
( ( ) ) ( )
( ) ( )
-
1
2
3
1
2
1
Time
Volt
T
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oise Rejection
Averaging Average after N repeated measurements:
If nk(t) is zero mean,
x t s tN
n t s t n tkk
N
( ) ( ) ( ) ( ) ( ) 11
Slide 30
is zero mean
n t
N N nn
nn
( )
2
2
SN
s t
SN
s t s t
N
N s tS
N N S
N
Orig n
N n n n
N Orig
2
2
2
2
2
2
2
2 avg
avg
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oise Rejection - Common Mode
oise Differential Amplifier (Instrumentation Amplifier)
E
ZOUT V A
-
Ri R F
Slide 31
V E V V V
V RR
V V RR
E
A TH CM
B CM
OUT F
iB A
F
iTH
- - Differential Measurement
Source
V OUT
V B
V CM
Ri
R F
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More realistic Op Amp model:If a common mode voltage V CM exists
Common Mode Rejection Ratio (CMRR)
oise Rejection - Common Mode
oise
-+ AOL
V -
V +V O
V A V V A V O OL CM CM - -( )
Slide 32
CMRR Differential GainCommon Mode Gain A
AOL
CM
-+ AOL
V -
V +V O
V CM CMRR
V A V V A V
V A V V V O OL
OL
CM
O OLCM
-
-
-
-
( )
( )
CMRR
CMRR
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oise Rejection - Common Mode
oise Instrumentation Amplifier
-+
R 2 R 2 -
+
R1
V A
RG
Slide 34
V RR V V O G A B
-1 2
1
( )
OUT R 2
R 2
-+
R1
V B
Closed-loop differential-input device Committed gain amplifier. High input impedance, high CMRR, low offset drift, low input bias current.