2016 第11屆 下世代無線通訊產品模擬量測和認證測試解決方案研討會 auden

5/31 (二) 9:00 ~ 16:40 內湖維多利亞酒店(台北市中山區敬業四路168號)耀登科技軟硬體研討會今年第11屆盛大舉辦。2016年5月31日耀登科技將在臺北維多麗亞酒店舉辦 下世代無線通訊產品模擬量測和認證測試解決方案研討會。此研討會提供目前最新前瞻量測及模擬技術: 本次有cDASY6最新軟體介紹、材料介電特性量測的DAK-TL、近場EMC量測的TDS以及最先進生醫電磁軟體Sim4Life在現場展出。讓業界對於電磁量測與模擬之先進技術能藉此研討會進行交流和經驗分享。

9:00 - 9:20 9:20 - 9:309:30 - 9:45 9:45 - 10:10

10:10 - 10:30 10:30 - 11:30

11:30 - 12:30 12:30 - 13:3013:30 - 13:45 13:45 - 14:30

14:30 - 15:0015:00 - 15:2015:20 - 15:40

15:40 - 16:00

16:00 - 16:15 16:15 - 16:3016:30 - 16:40

Time Agenda Speaker

Registration

Opening & Welcome Remarks Prof. Niels Kuster

Update on SAR, HAC & OTA Dr. Mark Douglas

Measurement Standards

DAK-TL - Fully Automated Dielectric and Dr. Sven Kühn

Magnetic Material Characterization Test

System for Thin Layers (incl Demo)

Coffee Break

Outlook on Sim4Life V2.2.3 & Dr. Nik Chavannes

SEMCAD Matterhorn V15.6 (Release Highlights)

Selected Applications of Aiping Yao

Sim4Life V2.2.3 & SEMCAD Matterhorn V15.6

Lunch

EM-Phantoms - Roadmap for Body-worn/Wearable Dr. Sven Kühn

and Medical Device Testing

cSAR3D: Real-time SAR Assessment with Dr. Mark Douglas

Vector Technology (incl. Demo)

cDASY6 Software Dr. Mark Douglas

Coffee Break

SPEAG TDS (Time Domain Sensors): Dr. Sven Kühn

Photonic Technologies for Absolute and Traceable

Measurements in EMC/EMI Near-Field and Signal

Integrity Analysis

SPEAG ICEy Dr. Sven Kühn

(Interference & Compatibility Evaluation System):

Introducing Absolute and Traceable Measurements

in EMC/EMI/SI Near-Field and Radiated Emission

Analysis

Q & A

Gift Event

Closing Remarks

Auden

SpeagAuden