(1/8) J. Mekki RadWG meeting – 03/02/2015 CHARM facility update 03/02/2015.
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(1/8) J. Mekki RadWG meeting – 03/02/2015 CHARM facility update 03/02/2015
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Transcript of (1/8) J. Mekki RadWG meeting – 03/02/2015 CHARM facility update 03/02/2015.
(1/8)J. Mekki RadWG meeting – 03/02/2015
CHARM facility update
03/02/2015
(2/8)J. Mekki RadWG meeting – 03/02/2015
1st year - 2014
(3/8)J. Mekki RadWG meeting – 03/02/2015
Group Technical responsible Equipement
EN/STI
Giovanni Spiezia/Raffaello Secondo/Salvatore Danzeca
RadMON V6
Ruben G, Alia / Slawosz SRAMs
Gilles Foucard/Paul Peronnard JDI tester
IT/CS Alberto Garcia Molero IT beacons
TE/CRG
Nikolaos Trikoupis/ Juan Casas Cubillos Cryogenic electronics crate
LEDs
TE/EPC
Slawosz Uznanski Componentso SRAM RenesasoADS1271 Delta-Sigma ADC
Lionel Foro / Louis de Mallac Components testerComponents(Op-amp, Comparator, power MosFETs etc …)
UM2_EN/STI
Raffaello Secondo Cubesat
Julien Mekki Capa MOS
INFN Massimiliano Fiorini PCB board and wires
10 users
14 equipment
1st year - 2014
(4/8)J. Mekki RadWG meeting – 03/02/2015
1st Run Analysis
Radiation levels at the different locations are being analysed
Benchmarking is being performed between experimental measurements (RadMON / BLM) and Fluka
simulations
Results will be provided to the users as soon as they are availableTID1 MeV
neutron eq. fluence
HEH fluence Thermal neutrons fluence
Dedicated test positionRadiation test period
(5/8)J. Mekki RadWG meeting – 03/02/2015
2nd year - 2015
(6/8)J. Mekki RadWG meeting – 03/02/2015
2nd year - 2015
(7/8)J. Mekki RadWG meeting – 03/02/2015
2nd year - 2015
(8/8)J. Mekki RadWG meeting – 03/02/2015
List of possible users (2015)Group Technical
responsibleEquipement Target
Dose/CriterionComments / Request form
EN/STI
Paul PeronnardComponents(To be defined)
To be defined No request form received yet
Ruben G, Alia SRAMs To be defined Test foreseenNo request form received yet
S, Danzeca Floating Gate sensors To be defined Test foreseenNo request form received yet
TE/EPC
Slawosz Uznanski FGCLite prototype To be defined Test foreseenNo request form received yet
Lionel Foro / Louis de Mallac Components tester (upgrade of the existing one)Components to be tested (op-amp/comparator/Power Mos …)
Test will be 200 Gy / slots Test will be doneNo request form received yet
Vincent Barbet Full power converter To be defined Test foreseenNo request form received yet
TE/MPE
Yan Bastian Remote I/Os interlocks equipment
1 kGyStart: Low Dose Rate 1-2Gy/hAnd 10 Gy/h Estimation: around 15 days at position 15
Test will be doneRequest form received
(9/8)J. Mekki RadWG meeting – 03/02/2015
Group Technical responsible
Equipement Target Dose/Criterion
Comments / Request form
UM2/CERN Raffaello Secondo Cubesat To be defined No request form yet
TE/MPEJens Steckert nDQQDG board Test with blown up beam
To be definedTest in direct beam (another iteration is needed)No request form yet
PH/ESEFrancis Anghinolfi ASICs test Test with
the blown-up beamTo be defined
First discussion already doneNo request form yet
EN/EL
Carl Crommelinck Data concentrator with different I/O
To be defined First discussion already doneNo request form yetResults needed by end of summer
Stephane Delarue Light sytem To be defined Test to be done No request form yet
Vincent Chareyre UPS To be defined Test foreseenNo request form yet
BE/RFWolfgang Hofle High Bandwidth solid state
amplifiersTo be defined Test foreseen
No request form yet
TE/CRG Nikolaos Trikoupis No requirement yet
PH/AIDHartmut Hillemanns MAPS sensor on PCB Test with the blown up
beamTo be defined
Request form received
List of possible users (2015)
Already 16 use
rs
More to
be added
(10/8)J. Mekki RadWG meeting – 03/02/2015
Information
