1 Cover Page R&TTE EMC TEST REPORTfaenl.msi.com/ftp/CE Documents/other/RG54SE II... · compliance...

SGS-CSTC Standards Technical Services Co., Ltd.

No.198 Kezhu Road, Science Town Economic& Technology Development District

Guangzhou, China 510663

Telephone: +86 (0) 20 8215 5555Fax: +86 (0) 20 8207 5059

Email: [email protected]

Report No.:SZEMO061102379RFEPage: 1 of 28

The CE mark as shown below can be used, under the responsibility of the manufacturer, after completion of an EC Declaration ofConformity and compliance with all relevant EC Directives.

Robinson LoLaboratory Manager

This report refers to the General Conditions for Inspection and Testing Services, printed overleaf.This report details the results of the testing carried out on one sample. The results contained in this test report do not relate to othersamples of the same product. The manufacturer should ensure that all products in series production are in conformity with the productsample detailed in this report.This report may only be reproduced and distributed in full. If the product in this report is used in any configuration other than tha t detailedin the report, the manufacturer must ensure the new system complies with all relevant standards. Any mention of SGS InternationalElectrical Approvals or testing done by SGS International Electrical Approvals in connection with, distribution or use of the productdescribed in this report must be approved by SGS International Electrical Approvals in writing.The report must not be used by the client to claim product certification, approval, or endorsement by NVLAP, NIST, or any agency of thefederal government.All test results in this report can be traceable to National or International Standards.

Member of the SGS Group (SGS SA)

1 Cover Page

R&TTE EMC TEST REPORTApplication No.: SZEMO061102379RF

Applicant: TP-LINK TECHNOLOGIES CO., LTD

Equipment under Test (EUT)

Name: 54M Wireless USB Adapter

Model No.: TL-WN321G

Teade mark: TP-LINK

Standards: EN 301 489-17 V1.2.1 (2002-08)

Date of Receipt: 15 November 2006

Date of Test: 16 to 27 November 2006

Date of Issue: 05 December 2006

Test Result : PASS *

* In the configuration tested, the EUT detailed in this report complied with the standards specified above.

Please refer to section 2 of this report for further details.

* The other tests (e.g. Low Voltage Directive) required in R&TTE directive were not included in the report,

only part tests related to EMC were performed and reported in this report. Hence to clarify compliance

with R&TTE directive shall comply with the other essential required tests additionally.


Report No.: SZEMO061102379RFEPage: 2 of 28

2 Test Summary

Electromagnetic Compatibility (EMC) Part for Tx & Rx

Test Test Requirement Test Method Class / Severity Remark Result

Radiated Emission,

30MHz to 1GHz

EN 301 489-17:2002 V1.2.1

clause 7.1

EN 301 489-1:2002V 1.4.1 clause 8.2

EN55022Table 4 Enclosure PASS*

Conducted

Emission

(150K to 30MHz)

EN 301 489-17:2002 V1.2.1

clause 7.1

EN 301 489-1:2002V 1.4.1 clause 8.4

EN55022Table 8 For AC port PASS*

Harmonic Emission

on AC, 50Hz to

2kHz

EN 301 489-17:2002 V1.2.1

clause 7.1

EN 61000-3-2:2000

Clause 7 of

EN61000-3-3



3 ContentsPage

1 COVER PAGE ................................ ................................ ................................ ................................ ............................. 1

2 TEST SUMMARY ................................ ................................ ................................ ................................ ....................... 2

3 CONTENTS ................................ ................................ ................................ ................................ ................................ . 3

4 GENERAL INFORMATION ................................ ................................ ................................ ................................ ....... 4

4.1 CLIENT INFORMATION ................................ ................................ ................................ ................................ .......... 4

4.2 GENERAL DESCRIPTION OF E.U.T. ................................ ................................ ................................ ..................... 4

4.3 DETAILS OF E.U.T. ................................ ................................ ................................ ................................ .............. 4

4.4 DESCRIPTION OF SUPPORT UNITS ................................ ................................ ................................ ...................... 4

4.5 STANDARDS APPLICABLE FOR TESTING ................................ ................................ ................................ ............. 4

4.6 TEST LOCATION ................................ ................................ ................................ ................................ ................... 5

4.7 TEST FACILITY ................................ ................................ ................................ ................................ ..................... 5

4.8 DEVIATION FROM STANDARDS................................ ................................ ................................ ............................. 5

4.9 ABNORMALITIES FROM STANDARD CONDITIONS ................................ ................................ ................................ 5

4.10 OTHER INFORMATION REQUESTED BY THE CUSTOMER ................................ ................................ ..................... 5

5 EMC REQUIREMENTS SPECIFICATION IN EN 301 489-17 ................................ ................................ ............. 6

5.1 EMI (EMISSION)................................ ................................ ................................ ................................ ................... 6

5.1.1 Radiated Emission ................................ ................................ ................................ ................................ ........ 6

5.1.2 Conducted Emission................................ ................................ ................................ ................................ ..... 7

5.2 HARMONICS TEST RESULTS................................ ................................ ................................ ................................ 9

5.2.1 E.U.T. Operation ................................ ................................ ................................ ................................ ........... 9

5.2.2 Measurement Data ................................ ................................ ................................ ................................ ....... 9

5.3 FLICKER TEST RESULT................................ ................................ ................................ ................................ ...... 12

5.3.1 E.U.T. Operation ................................ ................................ ................................ ................................ ......... 12

5.3.2 Measurement Data ................................ ................................ ................................ ................................ ..... 13

5.4 IMMUNITY................................ ................................ ................................ ................................ ............................ 14

5.4.1 ESD................................ ................................ ................................ ................................ ............................... 15

5.4.2 Radiated Immunity ................................ ................................ ................................ ................................ ...... 16

5.4.3 Electrical Fast Transients (EFT) ................................ ................................ ................................ ............... 17

5.4.4 Surge ................................ ................................ ................................ ................................ ............................ 18

5.4.5 RF Common Mode 0.15MHz to 80MHz ................................ ................................ ................................ ... 19

5.4.6 Voltage Dips and Interruptions................................ ................................ ................................ .................. 20

6 APPENDIX A: INSTRUMENTS USED DURING TEST ................................ ................................ ...................... 21

7 APPENDIX B: PHOTOGRAPHS OF TEST SETUP................................ ................................ ............................ 23

7.1 RADIATED EMISSION ................................ ................................ ................................ ................................ .......... 23

7.2 CONDUCT EMISSION ................................ ................................ ................................ ................................ .......... 23

7.3 ESD................................ ................................ ................................ ................................ ................................ .... 24

7.4 RADIATED IMMUNITY ................................ ................................ ................................ ................................ .......... 24

7.5 RF COMMON MODE................................ ................................ ................................ ................................ ........... 25

7.6 HARMONICS & FLICKER TEST SETUP ................................ ................................ ................................ ............... 25

7.7 EFT / SURGE / VOLTAGE DIPS AND INTERRUPTIONS ................................ ................................ ....................... 26

7.8 EUT CONSTRUCTIONAL DETAILS................................ ................................ ................................ ................. 26-28



4 General Information

4.1 Client Information

Applicant: TP-LINK TECHNOLOGIES CO., LTD

Address of Applicant: Building 7, Section 2, Honghualing Industrial Park, Xili, Nanshan District,

4.2 General Description of E.U.T.

Name: 54M Wireless USB Adapter

Model No.: TL-WN321GFunction: CCK & OFDM Wireless USB Adapter.

4.3 Details of E.U.T.

EUT Power Supply: 5V DC supplied by PC USB port

Test PC information: Test PC: 230Vac/50Hz

4.4 Description of Support Units

The TP-LINK TL-WN321G USB Wireless Adapter gives you the flexibility to install your PC or notebook PC in the most convenient location available, without the cost of running the network cables.

Its auto-sensing capability allows high packet transfer up to 54Mbps for maximum throughput, or dynamic range shifting to lower speeds due to distance or operating limitations in an environment with a lot of electromagnetic interference. It can also interoperate with all 11Mbps wireless (CCK) products. Yourwireless communications are protected by up to 128-bit WEP and WPA encryption, so your data stayssecure.

It’s a wireless lan card.

4.5 Standards Applicable for Testing

The customer requested (R&TTE) EMC part tests for 54m Wireless USB Adapter.

The standards used were EN 301 489-17 V1.2.1 (2002-08).

Table 1 : Tests Carried Out Under EN 301 489-17 V1.2.1 : 2002

EMI TEST Rx / Tx

Clause 7.1 Radiated Emission EN 301 489-1 : 2002 clause 8.2, EN 55022 √

Conducted Emission EN 301 489-1 : 2002 clause 8.3/ 8.4/ 8.7, EN55022

√

Harmonic Current EN 301 489-1 : 2002 clause 8.5 EN 61000-3-2 √

Voltage Fluctuation & Flicker EN 301 489-1 : 2002 clause 8.6 EN 61000-3-3 √

EMS TEST

Clause 7.2 RF EM fields (RI) EN 301 489-1 : 2002 clause 9.2, EN 61000-4-3 √

Electrostatic Discharge (ESD) EN 301 489-1 : 2002 clause 9.3, EN 61000-4-2 √

Fast transients (EFT) EN 301 489-1 : 2002 clause 9.4, EN 61000-4-4: √

RF Common Mode (CI) EN 301 489-1 : 2002 clause 9.5, EN 61000-4-6 √

Transient & Surge in Vehicular EN 301 489-1 : 2002 clause 9.6, ISO7637-1/-2 ×

Voltage dips & Interruption EN 301 489-1 : 2002 clause 9.7, EN 61000-4-11 √

Surge EN 301 489-1 : 2002 clause 9.8, EN 61000-4-5 √

×: Indicates that the test is not applicable.

√: Indicates that the test is applicable.



4.6 Test Location

All tests were performed at:

SGS-CSTC Standards Technical Services Co., Ltd., Guangzhou EMC Laboratory, No.198 Kezhu Road,

Science Town Economic& Technology Development District Guangzhou, China 510663

Tel: +86 20 8215 5555 Fax: +86 20 8207 5059

No tests were sub-contracted.

4.7 Test Facility

The test facility is recognized, certified, or accredited by the following organizations:

• NVLAP – Lab Code: 200611-0SGS-CSTC Standards Technical Services Co., Ltd., Guangzhou EMC Laboratory is recognized under the National Voluntary Laboratory Accreditation Program (NVLAP/NIST). NVLAP Code: 200611-0. Effectivethrough December 31, 2004.

• ACASGS-CSTC Standards Technical Services Co., Ltd., EMC Laboratory can also perform testing for the Australian C-Tick mark as a result of our NVLAP accreditation.

• VCCI

The 3m Semi-anechoic chamber and Shielded Room (7.5m x 4.0m x 3.0m) of SGS-CSTC Standards

Technical Services Co., Ltd. have been registered in accordance with the Regulations for Voluntary

Control Measures with Registration No.: R-2197 and C-2383 respectively.Date of Registration: September 29, 2005. Valid until September 28, 2008.

• SGS UK(Certificate No.: 32), SGS-TUV SAARLAND and SGS-FIMKOHave approved SGS-CSTC Standards Technical Services Co., Ltd., EMC Laboratory as a supplier ofEMC TESTING SERVICES and SAFETY TESTING SERVICES.

• CNAL – LAB Code: L0141SGS-CSTC Standards Technical Services Co., Ltd., EMC Laboratory has been assessed and in compliance with CNAL/AC01:2005 accreditation criteria (identical to ISO/IEC 17025:2005 General Requirements) for the Competence of Testing Laboratories.

• FCC – Registration No.: 556682SGS-CSTC Standards Technical Services Co., Ltd., Shenzhen EMC Laboratory has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptanceletter from the FCC is maintained in our files. Registration 556682, Aug. 04, 2005

• Industry Canada (IC)The 3m Semi-anechoic chamber of SGS-CSTC Standards Technical Services Co., Ltd. has been registered by Certification and Engineering Bureau of Industry Canada for radio equipment testing with Registration No.: 6002.

4.8 Deviation from Standards

None.

4.9 Abnormalities from Standard Conditions

None

4.10 Other Information Requested by the Customer

None.



5 EMC Requirements Specification in EN 301 489-17

5.1 EMI (Emission)

5.1.1 Radiated Emission

Test Date: 21 November 2006

Test Method: EN 301 489-1 clause 8.2.2 (EN55022)

EUT Operation:

Ambient: Temp.: 24.0 °C, Humid.: 50% Press.: 1015 mBar

Status: Test EUT in Tx & Rx on mode.

Test Procedure: Scan from 30M to 1GHz, find the maximum radiation frequency to measure.

5.1.1.1 Measurement Record Uncertainty: ± 6dB

Vertical

Frequency(MHz)

CableLoss (dB)

AntennaFactor(dB/m)

PreampFactor(dB)

ReadLevel

(dBuV)

Level(dBuV/m)

Limit Line (dBuV/m)

OverLimit (dB)

71.71 0.86 7.06 28.00 56.03 35.95 40.00 -4.05

131.85 1.28 7.78 27.59 50.88 32.35 40.00 -7.65

164.83 1.34 9.55 27.36 51.09 34.62 40.00 -5.38

299.66 1.90 13.85 26.72 39.23 28.26 47.00 -18.74

396.66 2.19 16.25 27.39 42.51 33.56 47.00 -13.44

626.55 2.76 20.5 27.53 39.01 34.74 47.00 -12.26

Horizontal

Frequency(MHz)

CableLoss (dB)

AntennaFactor(dB/m)

PreampFactor(dB)

ReadLevel

(dBuV)

Level(dBuV/m)

Limit Line (dBuV/m)

OverLimit (dB)

143.49 1.30 8.43 27.50 49.50 31.73 40.00 -8.27

163.86 1.34 9.56 27.36 50.12 33.66 40.00 -6.34

231.76 1.58 11.73 27.00 49.64 35.95 47.00 -11.05

297.72 1.89 13.81 26.73 44.67 33.64 47.00 -13.36

396.66 2.19 16.25 27.39 42.51 33.56 47.00 -13.44

529.55 2.63 18.59 27.68 41.70 35.24 47.00 -11.76



5.1.2 Conducted Emission


Test Method: EN 301 489-1 clause 8.4.2 (EN55022)

Detector: Peak for pre-scan (9kHz Resolution Bandwidth)

Quasi-Peak if maximised peak within 6dB of Quasi-Peak limit

EUT Operation:

Ambient: Temp.: 21.0 °C, Humid.: 52% Press.: 1015 mBar

Status: Keep EUT On mode.

Test Procedure: Scan from 0.15M to 30MHz, find the maximum radiation frequency to measure.

5.1.2.1 Measurement Data Uncertainty: ± 3dB

An initial pre-scan was performed on the live and neutral lines with peak detector.

Quasi-Peak and Average measurement were performed at the frequencies with maximized peak

emission were detected.



Live

Frequency(MHz)

CableLoss (dB)

LISNFactor(dB)

ReadLevel

(dBuV)

Level(dBuV)

Limit Line (dBuV)

OverLimit (dB)

Remark

0.170 -0.04 -0.04 47.74 47.66 64.96 -17.30 QP

0.170 -0.04 -0.04 44.22 44.14 54.96 -10.82 Average

0.201 -0.10 -0.04 39.58 39.44 53.57 -14.13 Average

0.201 -0.10 -0.04 41.66 41.52 63.57 -22.05 QP

0.325 0.00 -0.04 32.96 32.92 49.58 -16.66 Average

0.325 0.00 -0.04 35.47 35.43 59.58 -24.15 QP

0.402 0.00 -0.04 34.97 34.93 47.81 -12.88 Average

0.402 0.00 -0.04 36.41 36.37 57.81 -21.44 QP

0.499 0.00 -0.04 39.75 39.71 56.02 -16.31 QP

0.499 0.00 -0.04 36.28 36.24 46.02 -9.78 Average

0.661 0.00 -0.04 35.52 35.48 56.00 -20.52 QP

0.661 0.00 -0.04 31.14 31.10 46.00 -14.90 Average

Neutral

Frequency(MHz)

CableLoss (dB)

LISNFactor(dB)

ReadLevel

(dBuV)

Level(dBuV)

Limit Line (dBuV)

OverLimit (dB)

Remark

0.167 -0.04 -0.05 45.41 45.32 65.11 -19.79 QP

0.167 -0.04 -0.05 42.06 41.97 55.11 -13.14 Average

0.329 0.00 -0.04 37.52 37.48 59.48 -22.00 QP

0.329 0.00 -0.04 33.36 33.32 49.48 -16.16 Average

0.402 0.00 -0.04 37.21 37.17 57.81 -20.64 QP

0.402 0.00 -0.04 35.06 35.02 47.81 -12.79 Average

0.499 0.00 -0.04 36.86 36.82 46.02 -9.20 Average

0.499 0.00 -0.04 40.45 40.41 56.02 -15.61 QP

0.661 0.00 -0.05 38.33 38.28 56.00 -17.72 QP

0.661 0.00 -0.05 34.71 34.66 46.00 -11.34 Average

0.831 0.05 -0.05 38.91 38.91 56.00 -17.09 QP

0.831 0.05 -0.05 34.39 34.39 46.00 -11.61 Average



5.2 Harmonics Test Results

Test Requirement: EN 301 489-1 clause 8.4.2 (EN55022)

Test Method: EN 61000-3-2


Frequency Range 100Hz to 2kHz

Measurement Time: 3 mins

Class / Severity: Class A

5.2.1 E.U.T. Operation

Operating Environment:

Temperature: 25.0 °C Humidity: 56 % RH Atmospheric Pressure: 1015 mbar

EUT Operation: Test the EUT in On Mode.

5.2.2 Measurement Data

-0.15

-0.10

-0.05

0.00

0.05

0.10

0.15

-300

-200

-100

0

100

200

300

Cu

rre

nt(A

mp

s)

Vo

ltag

e(V

olts

)

0.000

0.001

0.002

0.003

0.004

0.005

0.006

Cu

rre

ntR

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40



THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000Highest parameter values during test:

V_RMS (Volts): 230.22 Frequency(Hz): 50.00I_Peak (Amps): 0.082 I_RMS (Amps): 0.015I_Fund (Amps): 0.005 Crest Factor: 7.659Power (Watts): 1.2 Power Factor: 0.444

Harm# Harms(avg)100%Limit%of LimitHarms(max)150%Limit %of Limit Status

2 0.0013 0.003 0.004 0.0 0.005 0.006 0.00 Pass4 0.0015 0.003 0.002 0.0 0.005 0.003 0.00 Pass6 0.0017 0.003 0.001 0.0 0.004 0.002 0.00 Pass8 0.0009 0.003 0.001 0.0 0.004 0.001 0.00 Pass

10 0.00011 0.002 0.000 0.0 0.004 0.001 0.00 Pass12 0.00013 0.002 0.000 0.0 0.003 0.001 0.00 Pass14 0.00015 0.002 0.000 0.0 0.003 0.000 0.00 Pass16 0.00017 0.002 0.000 0.0 0.003 0.000 0.00 Pass18 0.00019 0.002 0.000 0.0 0.002 0.000 0.00 Pass20 0.00021 0.002 0.000 0.0 0.002 0.000 0.00 Pass22 0.00023 0.001 0.000 0.0 0.002 0.000 0.00 Pass24 0.00025 0.001 0.000 0.0 0.002 0.000 0.00 Pass26 0.00027 0.001 0.000 0.0 0.001 0.000 0.00 Pass28 0.00029 0.001 0.000 0.0 0.001 0.000 0.00 Pass30 0.00031 0.001 0.000 0.0 0.001 0.000 0.00 Pass32 0.00033 0.001 0.000 0.0 0.001 0.000 0.00 Pass34 0.00035 0.001 0.000 0.0 0.001 0.000 0.00 Pass36 0.00037 0.001 0.000 0.0 0.001 0.000 0.00 Pass38 0.00039 0.001 0.000 0.0 0.001 0.000 0.00 Pass40 0.000



Highest parameter values during test:Voltage (Vrms): 230.22 Frequency(Hz): 50.00I_Peak (Amps): 0.082 I_RMS (Amps): 0.015I_Fund (Amps): 0.005 Crest Factor: 7.659Power (Watts): 1.2 Power Factor: 0.444

Harm# Harmonics V-rms Limit V-rms % of Limit Status

2 0.143 0.460 31.16 OK3 0.580 2.071 28.02 OK4 0.088 0.460 19.02 OK5 0.067 0.921 7.23 OK6 0.075 0.460 16.32 OK7 0.066 0.691 9.61 OK8 0.037 0.460 8.01 OK9 0.070 0.460 15.28 OK

10 0.033 0.460 7.27 OK11 0.029 0.230 12.48 OK12 0.018 0.230 7.80 OK13 0.018 0.230 7.87 OK14 0.013 0.230 5.61 OK15 0.011 0.230 4.90 OK16 0.014 0.230 6.16 OK17 0.008 0.230 3.40 OK18 0.013 0.230 5.75 OK19 0.008 0.230 3.34 OK20 0.015 0.230 6.65 OK21 0.010 0.230 4.56 OK22 0.011 0.230 4.64 OK23 0.008 0.230 3.64 OK24 0.007 0.230 2.91 OK25 0.007 0.230 3.11 OK26 0.009 0.230 3.94 OK27 0.009 0.230 3.81 OK28 0.008 0.230 3.38 OK29 0.008 0.230 3.53 OK30 0.005 0.230 2.33 OK31 0.006 0.230 2.43 OK32 0.006 0.230 2.67 OK33 0.007 0.230 2.97 OK34 0.003 0.230 1.35 OK35 0.004 0.230 1.94 OK36 0.004 0.230 1.61 OK37 0.006 0.230 2.52 OK38 0.003 0.230 1.22 OK39 0.004 0.230 1.92 OK40 0.005 0.230 1.96 OK



5.3 Flicker Test Result

Test Requirement: EN 301 489-1 clause 8.4.2 (EN55022)

Test Method: EN 61000-3-3


Measurement Time: 10 mins

Class / Severity: Clause 5 of EN 61000-3-3

5.3.1 E.U.T. Operation

Operating Environment:

Temperature: 25.0 °C Humidity: 56 % RH Atmospheric Pressure: 1015 mbar

EUT Operation: Test the EUT in On Mode.



5.3.2 Measurement Data

0.25

0.50

0.75

1.00

Pst

14

:55

:07

0.065

0.070

0.075

Plt

14

:55

:07

Parameter values recorded during the test:Vrms at the end of test (Volt): 230.11Highest dt (%): 0.00 Test limit (%): 3.30 PassTime(mS) > dt: 0.0 Test limit (mS): 500.0 PassHighest dc (%): 0.00 Test limit (%): 3.30 PassHighest dmax (%): 0.00Test limit (%): 4.00 Pass

Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass



5.4 Immunity

Performance Criteria of EN 301 489-17, subclause 6.2 table 1.

Criteria During Test After Test

A

Shall operate as intended,May show degradation of performance(see note 1), Shall be no loss of function,Shall be no unintentional transmissions.

Shall operated as intended, Shall be no degradation of performance (see note 2)Shall be no loss of function Shall be no loss of stored data or userprogrammable functions

B

May show loss of function (one or more)

May show degradation of performance(see note 1)

No unintentional transmissions

Function shall be self-recoverable,Shall operated as intended after recovering,Shall be no degradation of performance (see note 2)Shall be no loss of stored data or user programmable functions

C

May be loss of function (one or more) Function shall be recoverable by the operator,Shall operate as intended after recoveringShall be no degradation of the performance (seenote 2)

Note 1: Degradation of the performance during the test is understood as a degradation to a level not below a minimum performance level specified by the manufacturer for the apparatus asintended. In some cases the specified minimum performance level may be replaced by a permissible degradation of performance.If the minimum performance level or the permissible performance degradation is not specified bythe manufacturer then either of these may be derived from the product description and documentation (include leaflets and advertising) and what the user reasonably expect from the apparatus if used as intended.

Note 2: No degradation of the performance after the test is understood as no degradation below a minimum performance level specified by the manufacturer for the apparatus as intended. In some cases the specified minimum performance level may be replaced by a permissibledegradation of performance. After test no change of actual operating data or user retrievabledata is allowed.If the minimum performance level or the permissible performance degradation is not specified bythe manufacturer then either of these may be derived from the product description and documentation (include leaflets and advertising) and what the user reasonably expect from the apparatus if used as intended.

Performance criteria A for immuni test with phenomena of continuous nature;

performance criteria B for immuni test with phenomena of transient nature;

performance criteria C for immuni test with power interruptions exceeding a certain time.



5.4.1 ESD


Test Method: EN 301 489-1 clause 9.3.2 (EN61000-4-2)

EUT Operation:

Ambient: Temp.: 25.0 °C, Humid.: 52 % Press.: 1015 mBar

Test Procedure: Compliance test was performed for On Mode

5.4.1.1 Direct Application Test Results

Observations: Test points: All Enclosure & Seams;

Direct Application Test Results

Discharge Level (kV) Pulse No. Test Point Contact Discharge Air Discharge

± 2, 4, 8 10 for every level 1 N/A A

± 2, 4 10 for every level None A N/A

5.4.1.2 Indirect Application Test Results

Observations: Test points: 1. All sides.

Indirect Application Test Results

Discharge Level (kV) Pulse No. Test Point Horizontal Coupling Vertical Coupling

± 2, 4 10 for every level 1 A A

Results

A: No degradation in the performance of the EUT was observed.

Same observations is for both CCK & OFDM modes.



5.4.2 Radiated Immunity



EUT Operation:


Test Procedure: Compliance test was performed for On Mode.

5.4.2.1 Test Results

Frequency Level Modulation EUT Face Result / Observations

0°V

0°HA

90°V

90°HA

180°V

180°HA

270°V

80MHz-1GHz

1.4GHz–2.0GHz

3V/m

1kHz,

80% Amp. Mod,

1% increment

270°HA

Remarks:A: No degradation in the performance of the E.U.T. was observed.




5.4.3 Electrical Fast Transients (EFT)



Test Level: 0.5, 1.0kV on AC

Polarity: Positive & Negative

Repetition Frequency: 5kHz

Burst Duration: 300ms

Test Duration: 2 minute per level & polarity

EUT Operation:

Ambient: Temp.: 25.0°C, Humid.: 55 % Press.: 1015 mBar



Lead under TestLevel

(±kV)Coupling

Direct/Clamp

EUT

operating

mode

Observations

(Performance Criterion)

Live ± 0.5, 1.0 Direct On ModeNo loss of performance was

observed (A)

Neutral ± 0.5, 1.0 Direct On Mode (A)

Live, Neutral ± 0.5, 1.0 Direct On Mode (A)




5.4.4 Surge

Test Date: 17 November 2006(Initial Test)

28 November 2006(Retest)


Test Level: ±1kV Live to Neutral,

Polarity: Positive & Negative

Interval: 60s between each surge

No. of surges: 5 positive, 5 negative at 0°, 90°, 180°, 270°.

EUT Operation:

Ambient: Temp.: 24 °C, Humid.: 56 % Press.: 1009 mBar



Pulse No Line-

Line

Coupling Level

(kV)

Surge

Interval

Phase

(deg)

Observation


1–5 L-N 18uF +1 60s 0° No loss of performance (A)

6–10 L-N 18uF -1 60s 0° (A)

11–15 L-N 18uF +1 60s 90° (A)

16–20 L-N 18uF -1 60s 90° (A)

21–25 L-N 18uF +1 60s 180° (A)

26–30 L-N 18uF -1 60s 180° (A)

31–35 L-N 18uF +1 60s 270° (A)

36–40 L-N 18uF -1 60s 270° (A)


The EUT passed the Surge test after retest.



5.4.5 RF Common Mode 0.15MHz to 80MHz



Test level: 3V rms on AC Ports (unmodulated emf into 150 Ω)

Modulation: 80%, 1kHz Amplitude Modulation

EUT Operation:


Test Procedure: Compliance test was performed for On Mode.


Frequency LineTest

Level

Modulatio

n

Step

Size

Dwell

Time

Observation


150kHz to

80MHz

2 Wire AC

Supply

Cable

3Vrm

s

80%, 1kHz

Amp. Mod.1% 2S No Loss of Function (A)

150kHz to

80MHzLAN Cable

3Vrm

s

80%, 1kHz

Amp. Mod.1% 2S No Loss of Function (A)




5.4.6 Voltage Dips and Interruptions



Test Level: 30% of UT (Supply Voltage) for 10ms40% of UT (Supply Voltage) for 100ms 5 % of UT (Supply Voltage) for 5s.

No. of Dips / Interruptions: 3 per Level

EUT Operation:



5.4.6.1 Test Results:

EUT

operating

mode

Dropout

% UTPhase

Duration of

dropout in

Periods

No of

dropout

Time

between

dropout

Observations


On Mode 70 0° 0.5 (10ms) 3 10s No Loss of Function (A)

On Mode 70 180° 0.5 (10ms) 3 10s No Loss of Function (A)

On Mode 40 0° 5 (100ms) 3 10s No Loss of Function (A)

On Mode



6 Appendix A: Instruments Used during Test

RE in Chamber

Item Test Equipment Manufacturer Model No. Serial No.Cal.Date

(dd-mm-yy)

Cal.Due date

(dd-mm-yy)

13m Semi-Anechoic

ChamberETS-LINDGREN N/A SEL0017 28-04-2005 27-04-2007

2 EMI Test Receiver Rohde & Schwarz ESIB26 100249 22-09-2006 21-09-2007

3 EMI Test software AUDIX E3 N/A N/A N/A

4 Coaxial cable TTS N/A SEL0028 20-05-2006 19-05-2007

5BiConiLog Antenna

(26-3000MHz)ETS-LINDGREN 3142C 00042673 03-03-2006 02-03-2007

6Pre-amplifier

(0.1-1300MHz)

Agilent

Technologies8447D 2944A10861 14-07-2006 13-07-2007

7Double-ridged horn

(1-18GHz)ETS-LINDGREN 3117 00035926 30-12-2004 29-12-2006

8Pre-amplifier

(1-18GHz)Rohde & Schwarz

AFS42-00101

800-25-S-421091457 17-07-2006 16-07-2008

Conducted Emission


(dd-mm-yy)

Cal.Due date

(dd-mm-yy)

1 Shielding Room ZhongYu Electron GB-88 SEL0042 N/A N/A

2 LISN ETS-LINDGREN 3816/2 00033512 25-08-2006 24-08-2007

3 EMI Test Receiver Rohde & Schwarz ESCI 100119 09-03-2006 08-03-2007

4 Coaxial Cable SGS N/A SEL0024 31-05-2006 30-05-2007

Harmonics / Flicker test


(dd-mm-yy)

Cal.Due date

(dd-mm-yy)

1 AC Power Source California Instruments 5001ix 56644 18-07-2006 17-07-2007

2 Power Analyzer California Instruments PACS-1 72402 19-07-2006 18-07-2007

3 CTS 3.0 Software California Instruments N/A N/A N/A N/A

ESD


(dd-mm-yy)

Cal.Due date

(dd-mm-yy)

1 ESD Simulator SCHAFFNER NSG 438 414 15-03-2006 14-03-2007

2 ESD Ground Plane SGS(3m * 3m) N/A SEL0004 N/A N/A



EFT, Surge, Voltage dips and Interruption


(dd-mm-yy)

Cal.Due date

(dd-mm-yy)

1 ProPLUS SystemThermo

ELECTRONN/A 0412194 09-03-2006 08-03-2007

2ProPLUS Capacitive

Clamp

Thermo

ELECTRONN/A 0501362 11-02-2005 10-02-2007

Radiated Immunity


(dd-mm-yy)

Cal.Due date

(dd-mm-yy)

13m Semi-Anechoic

ChamberETS-LINDGREN N/A N/A 28-04-2005 27-04-2007

2 Signal Generator Rohde & Schwarz SML03 102319 01-08-2005 01-08-2007

3Amplifier

80M-1GHzAmplifier Research 250W1000A 312698 03-03-2006 02-03-2007

4Amplifier

0.8-3.0GHzAmplifier Research 60S1G3 312667 03-03-2006 02-03-2007

5 Power Meter Rohde & Schwarz NRVD 101287 19-07-2005 18-07-2007

6 Power Sensor Rohde & Schwarz URV5-Z2 100247 07-06-2005 06-06-2007

7 Power Sensor Rohde & Schwarz URV5-Z2 100248 08-06-2005 07-06-2007

8Dual Directional

CouplerAmplifier Research DC6180 80M-1GHz 15-02-2006 14-02-2007

9Dual Directional

CouplerAmplifier Research DC7144 0.8-4.2GHz 15-02-2006 14-02-2007

10 Software EMC32 Rohde & Schwarz EMC32-S SEL0082 N/A N/A

11 Log-periodic Antenna Amplifier Research AT1080 311820 N/A N/A

12 Antenna Tripod Amplifier Research TP1000A 312383 N/A N/A

Conducted Immunity


(dd-mm-yy)

Cal.Due date

(dd-mm-yy)

1 RF-Generator SCHAFFNER NSG 2070 1114 03-03-2006 02-03-2007

2Coupling/Decoupling

NetworkSCHAFFNER CDN M016 21243 03-03-2006 02-03-2007

3 EM CLAMP SCHAFFNER KEMZ 801 21029 03-03-2006 02-03-2007

General used equipment


(dd-mm-yy)

Cal.Due date

(dd-mm-yy)

1 Thermo-/Hygrometer N/A TH01SEL0032 to

SEL003422-06-2006 21-06-2007

2 Barometer ChangChun DYM3 0026 22-06-2006 21-06-2008

3 DMM Mastech MAS830L SEL0044 20-09-2006 19-09-2007



7 Appendix B: Photographs of Test Setup

7.1 Radiated Emission

7.2 Conduct Emission



7.3 ESD

7.4 Radiated Immunity



7.5 RF Common Mode

7.6 Harmonics & Flicker Test Setup



7.7 EFT / Surge / Voltage Dips and Interruptions

7.8 EUT Constructional Details

1 Cover Page R&TTE EMC TEST REPORTfaenl.msi.com/ftp/CE Documents/other/RG54SE II... · compliance...

Documents

Transcript of 1 Cover Page R&TTE EMC TEST REPORTfaenl.msi.com/ftp/CE Documents/other/RG54SE II... · compliance...