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AN EDUCATIONNAL APPROACH TO ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS
Etienne SICARDINSA/DGEIUniversity of Toulouse31077 Toulouse - [email protected]
Alexandre BOYERINSA/DGEIUniversity of Toulouse31077 Toulouse - [email protected]
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1. CONTEXT
2. EDUCATIONAL NEEDS
3. STANDARDS
4. WHAT IS IC-EMC
5. EXAMPLE
6. EVALUATION
7. CONCLUSION
SUMMARY
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Emission of EM wavesSusceptibility to EM waves
EMC – ONE ACRONYM, TWO CONCEPTS
Personnal
Safety systems
interferences
Hardware faultSoftware failureFunction Loss
Components
EquipementsCarbon airplane
Boards
Radar
CONTEXT
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2002
Technology
Complexity
Packaging
180nm
50M
Core1 A
Core1 A
2004
130nm
100M
Core+ DSP3 A
Core+ DSP3 A
2008
45nm
500M
Multicore, DSPs, FPGA, RF multiband
MemoriesSensor30 A
Multicore, DSPs, FPGA, RF multiband
MemoriesSensor30 A
Embedded blocks transient current
2006
90nm
250M
Core DSPseMem10 A
Core DSPseMem10 A
TRENDS – INCREASED PARASITIC EMISSION
CONTEXT
2010
32nm
1G
Multicore, Multi DSP Reconf
FPGA, Multi RF
Memories Sensors100 A
Multicore, Multi DSP Reconf
FPGA, Multi RF
Memories Sensors100 A
Increased complexity, IOs number, operating frequencies, transient current
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5.0
3.3
2.5
1.8
0.5µ 0.35µ 0.18µ 90nm 65nm
Technology
0.7
Less voltage margin
Supply (V)
1.2
45nm
I/O supply
Core supply
150 mV margin
CONTEXT
TRENDS - INCREASED SUSCEPTIBILITY
32nm
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EMCIssues
PACKAGES AS ANTENNAS
CONTEXT
Package dimensions are close to lambda/4 at GHz range
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DESIGN
Architectural Design
Design EntryDesign Architect
FABRICATION
EMC compliant
EMC SimulationsCompliance ?
GO
NO GO
Design Guidelines
Tools
TrainingThis work
EMC VALIDATED BEFORE FABRICATION
CONTEXT
What IC designers and EMC experts are dreaming of…
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EDUCATIONNAL NEEDS
A nightmare?
EMC TRAINING AT IC LEVEL – HOW TO START?
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EDUCATIONNAL NEEDS
A nightmare?
EMC TRAINING AT IC LEVEL – HOW TO START?
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EDUCATIONNAL NEEDS
• Illustrate technology scale down
– Complexity
– Current switching
– Impact on EMC
• Illustrate package role and complexity
• Simulate simple models with simple simulator (SPICE-like)
• Post-process in Freq. domain for Spectrum comparison
• “see” E, H fields from currents and voltage
• Investigate “what if” with students
3D real-time view in Microwind
IBIS 3D viewer in Microwind
THINGS WE NEED TO DO
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EDUCATIONNAL NEEDS
• Give key facts about technology impact on EMC
• Introduce standard measurement methods
• Simulate first order effects using standard model approaches
• Give the basics of
– emission prediction– immunity simulation
• Give simple design rules for improved design
• Address both
– Undergraduate, graduate students– Engineers in companies
• Leave plenty of space for exercises and real-case problem solving
• Fit the course in a one or two days format (cost, duration)
OUR PROPOSAL – KEY FACTS
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EDUCATIONNAL NEEDS
• Overview (EMC-IC for managers)
• Basic concepts
• Measurement methods
• Guidelines for improved EMC
• Case study
• EMC models
• Chip-chip coupling
OUR PROPOSAL – COURSE OUTLINES
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STANDARDS
International Standards IEC 61967
EMISSION MEASUREMENT METHODS
IEC 61967-2
(TEM : 1GHz)
IEC 61967-3/6
(Near field scan, 5GHz)
IEC 61967-4
(1/150 ohm, 1 GHz)
IEC 61967-5
(WBFC, 1 GHz)
IEC 61967-7
(Mode Stirred Chamber: 18 GHz)
IEC 61967-2
(GTEM 18 GHz)
Most usual radiated method
Most usual conducted method www.iec.ch
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STANDARDS
IMMUNITY MEASUREMENT METHODS
International Standards IEC 62 132
IEC 62132-3(Bulk Current Injection : 1 GHz)
IEC 62132-4(Direct Power Inj 1GHz)
IEC 62132-2 (TEM/GTEM)
IEC 62132-5 (WBFC 1 GHz)
New proposal: (LIHA : 10 GHz)
Still research:(NFS 10 GHz)
Most usual conducted method
Most usual radiated method www.iec.ch
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STANDARDS
International Standard IEC 62 433
MODEL APPROACHES
1. ICEM-CE - Conducted RF emission
2. ICEM-RE - Radiated RF emission
4. ICIM-CI - Conducted RF immunity
4. ICIM-RI - Radiated RF immunity
www.iec.ch
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A schematic editor to enter macro-models
An interface to WinSpice analog simulator
A post-processor to compare simulated with
measured spectrum
An Electromagnetic solver to simulate radiated field
Freeware, online, 250 pp documentation, 15 case
studies
WHAT IS IC-EMC
IC-EMC - A TOOL FOR EMC PREDICTION
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IC, package and PCB model
Basic symbols
SCHEMATIC EDITOR
WHAT IS IC-EMC
Main analysisSpectrum
analysis Impedance
simulation
Near-field simulatio
n
Immunity simulation
IBIS interface
Key tools
Smith Chart
SPICE compatible
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Core Model
Package Model
Probe Model
Test board Model
Analog Time Domain Simulation
Fourier Transform
Compare dBµV vs. Frequency
Fourier Transform
Time-domain measure
Frequency measurements
Emission prediction approach
SimulationSimulationMeasurementsMeasurements
EXAMPLE
CONDUCTED EMISSION
IEC 62 433
IEC 61 967
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Emission spectrum analysis
EXAMPLE
CONDUCTED EMISSION
Core Model
Probe Model
Analog Time-Domain Simulation
Fourier Transform
Conversion to Win-SPICE
dB vs Freq (log)conversion
Package Model
Test board Model
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EXAMPLE
Emission spectrum analysis
CONDUCTED EMISSION
Compare dBµV vs. Frequency
Frequency measurements
What if?• Effect of decoupling• Effect of package
supply pairs• Effect of current
reduction• …
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Since 2002, more than 20 sessions involving 300 students and engineers have been organized
– ISEN France
– ENSME France
– On-Semiconductors
– NOKIA
– APEMC Beijing
One-day or two-days format.
The majority of students said
– They understood the mechanisms of parasitic emission and susceptibility
– They felt confident in their ability to handle EMC at IC level
EVALUATION
AUDIENCE
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EVALUATION
# Question
1 I appreciated the contents of the training.
2 The level of the training is in accordance with my expectations.
3 The balance between theory and practice was acceptable
4 The contents was adapted to life-long learning.
5 I appreciated the documents given in the training.
6 I appreciated the way the training was taught
7 The contents is clearly related to my work/studies.
8 I may use the contents directly in my activities
9 The lecturer followed the initial planning
10 Overall I was satisfied with the quality of this course.
QUESTIONS
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EVALUATION
Answers to questionnaire
0%
10%
20%
30%
40%
50%
60%
70%
1 2 3 4 5 6 7 8 9 10
Evaluation item #
% r
esp
on
se
Strongly agree Agree Neutral Disagree Strongly disagree
RESULTS
7. The contents is clearly related to my work/studies.
8. I may use the contents directly in my activities
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An environment for EMC prediction at IC level and trainings has been
developed
The tool is free and is based on measurement and model standards
Trainings help students and engineers to understand the
mechanisms of parasitic emission and susceptibility
As little theory as possible
As much practice and examples as possible
Positive feedback from trainees concerning the tool usage for the
illustration of EMC concepts (80 – 90 % satisfaction rate)
CONCLUSION
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• E. Sicard, A. Boyer, “IC-EMC v.2 User's Manual” ISBN 978-2-87649-056-7, July 2009, 320 pages, INSA Editor
• C. Dupoux, S. Akue Boulingui, E. Sicard, S. Baffreau, N. Bouvier, "Measurement and Simulation of Electromagnetic Interference in 3G Mobile Components“, EMC Compo 2009, November 2009, Toulouse, France.
• S. Akue Boulingui, C. Dupoux, S. Baffreau, E. Sicard, N. Bouvier, B. Vrignon, "An Innovative Methodology for Evaluating Multi-Chip EMC in Advanced 3G Mobile Platforms", IEEE Symposium on EMC, 2009, Austin, USA.
• S. Bendhia, M. Ramdani, E. Sicard, Electromagnetic Compatibility of Integrated Circuits, book published by Springer, USA, 2006, 0-387-26600-3
REFERENCES
The tool, manual and course slides are online at
www.ic-emc.org
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THANK YOU FOR YOUR ATTENTION