Spectromertrique d'Analyse
[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - Area efficient-high
[IEEE 2008 IEEE/IFIP International Conference on Embedded and Ubiquitous Computing (EUC) - Shanghai, China (2008.12.17-2008.12.20)] 2008 IEEE/IFIP International Conference on Embedded
[IEEE 2011 23rd International Conference on Microelectronics (ICM) - Hammamet, Tunisia (2011.12.19-2011.12.22)] ICM 2011 Proceeding - Transistor level optimization of sub-pipelined
Dessalement Arabian Journal of Science