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21st Century ESP Design

Physical Properties of Pure Methanol

Growth and Characterization of High Quality Continuous GaN Films on Si-Doped Cracked GaN Templates

Near-field optical characterization of GaN and InxGa1−xN/GaN heterostructures grown on freestanding GaN substrates

Lecture 1 - Intro to Process Simulation

Current and resistivity dependence of electromigration from a statistical analysis of metallization failure data

The effects of current spreading in the semiconductor on the determination of contact resistance

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Lecture 2 - Intro to HYSYS

Krupp Nitric Acid Plant

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