Behavior of reflected extraordinary mode in the fundamental electron cyclotron heating and current drive in JT-60U
High power operation of 110 GHz gyrotron at 1.2 MW on the JT-60 ECRF system
Angular distribution of rayleigh scattering from randomly branched polycondensates
Summary of ISO/TC 201 Standard: IV ISO 14606:2000—Surface chemical analysis—Sputter depth profiling—Optimization using layered systems as reference materials
Analysis of AlGaAs/GaAs superlattices by means of sputter-assisted AES, SEM and TEM
An AES study of LPCVD Ta2O5 films on Si
Crystalline effects on depth resolution in AES depth profiling
Noninvasive measurement of blood glucose concentrations by analysing fourier transform infra-red absorbance spectra through oral mucosa
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