1ºTeste_ALGA_2014-2015
Diametros brasileiros
Tabela de Perfis Abertos
Enunciados Laboratorio RMII RVR
A simulation model for cathodoluminescence in the scanning electron microscope
Localized oxide degradation in ultrathin gate dielectric and its statistical analysis
Morphology of experimental tumors of the sympathetic nervous system
[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium
[IEEE IEEE International Performance, Computing, and Communications Conference - Phoenix, AZ, USA (9-11 April 2003)] Conference Proceedings of the 2003 IEEE International - Long-term