RIFLE

engineering testerfor non-volatile memory cells and arrays

• Fast and reliable results• Reduced engineering effort• Improved cost of ownership

Highest Analog PerformanceFast arbitrary waveform generators

o 100 MHz, up to 36Vo For generation of dynamic pulses and reference

signalso Fully synchronized with the digital engine and

measurement unitHigh-speed PMU

o Current and voltage measuremento 70 MHz sampling rate, hardware filtering engineo Up to 8 channels in parallel, 1k sample buffer per

channelo Up to 5nA accuracy in the low current rangeo Fully synchronized with the signal generation

Easy Test DevelopmentStraightforward development

o Test program implementation, debug and analysis in the same environment

o Device specific functionality implemented in a Windows DLL, using C++ and a powerful library

o Test flow can be implemented in C++ or in VIInstallable on desktop

o Low footprinto No need of lab facilities

Extensive Built-In FunctionalityWide range of applications

o Single cell, test array, producto NAND, NOR, NROM, PCM, FeRAM, MRAM, RRAMo SLC and MLCo Serial/parallel/multiplexed/analog interfaceso Wafer and package level

Built-in functionalityo Digital operations: program/erase/verify/reado Vt and Icell:

IV/distribution/bitmapping/galaxy/edge lookupo Support: continuity/iref/icc/disturbs/…o Customizable user functions

True Interactive TestingInteractive test execution

o On-line selection of test functions and parameterso Immediate execution and availability of results

(including bitmaps) on the screen or in datalogsTest flow execution

o Implemented in VI or C++ languageTest result generation

o Bitmaps and detailed test results can be sent on-line via TCP-IP to BarnieMAT (NplusT data analysis suite) for further analysis

o XML-based datalog

NplusT

would like to thank youfor your time and

consideration

for further information: info@n-plus-t.com