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Optical characterization of hydrogenated amorphous silicon thin films deposit...S H Lin; Y C Chan; D P Webb; Y W LamJournal of Electronic Materials; Dec 1999; 28, 12; ProQuest Science Journalspg. 1452

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Reproduced with permission of the copyright owner. Further reproduction prohibited without permission.

Reproduced with permission of the copyright owner. Further reproduction prohibited without permission.

Reproduced with permission of the copyright owner. Further reproduction prohibited without permission.